John M. Neil

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Los Altos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope using a surface drive actuator to positio...
- Patent number 7,372,025
- Issue date May 13, 2008
- Agilent Technologies, Inc.
- Storrs T. Hoen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for standoff microwave imaging
- Publication number 20070139248
- Publication date Jun 21, 2007
- Izhak Baharav
- G01 - MEASURING TESTING
Information Patent Application
Handheld microwave imaging device
- Publication number 20070139249
- Publication date Jun 21, 2007
- Izhak Baharav
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope using a surface drive actuator to positio...
- Publication number 20060097163
- Publication date May 11, 2006
- Storrs T. Hoen
- G01 - MEASURING TESTING