John M. Safran

Person

Wappingers Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electromigration monitor
- Patent number 10,794,948
- Issue date Oct 6, 2020
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromigration monitor
- Patent number 10,677,833
- Issue date Jun 9, 2020
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Through-silicon via with improved substrate contact for reduced thr...
- Patent number 10,446,484
- Issue date Oct 15, 2019
- GLOBALFOUNDRIES Inc.
- John M. Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post zero via layer keep out zone over through silicon via reducing...
- Patent number 10,199,315
- Issue date Feb 5, 2019
- GLOBALFOUNDRIES Inc.
- Mukta Ghate Farooq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor structures gated using a conductor-filled via or trench
- Patent number 9,953,900
- Issue date Apr 24, 2018
- GLOBALFOUNDRIES Inc.
- John M. Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromigration monitor
- Patent number 9,891,261
- Issue date Feb 13, 2018
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through-silicon via with improved substrate contact for reduced thr...
- Patent number 9,847,290
- Issue date Dec 19, 2017
- GLOBALFOUNDRIES Inc.
- John M. Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures and methods for monitoring dielectric reliability with t...
- Patent number 9,404,953
- Issue date Aug 2, 2016
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Through-substrate via shielding
- Patent number 9,177,923
- Issue date Nov 3, 2015
- International Business Machines Corporation
- Daeik Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through-substrate via shielding
- Patent number 9,070,698
- Issue date Jun 30, 2015
- International Business Machines Corporation
- Daeik Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Physical design symmetry and integrated circuits enabling three dim...
- Patent number 9,029,234
- Issue date May 12, 2015
- International Business Machines Corporation
- John Matthew Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically programmable fuse using anisometric contacts and fabri...
- Patent number 8,629,049
- Issue date Jan 14, 2014
- International Business Machines Corporation
- Chandrasekharan Kothandaraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secure anti-fuse with low voltage programming through localized dif...
- Patent number 8,569,755
- Issue date Oct 29, 2013
- International Business Machines Corporation
- Yan Zun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically programmable fuse using anisometric contacts and fabri...
- Patent number 8,519,507
- Issue date Aug 27, 2013
- International Business Machines Corporation
- Chandrasekharan Kothandaraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of programming electrical antifuse
- Patent number 8,361,887
- Issue date Jan 29, 2013
- International Business Machines Corporation
- Alberto Cestero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secure anti-fuse with low voltage programming through localized dif...
- Patent number 8,350,264
- Issue date Jan 8, 2013
- International Businesss Machines Corporation
- Yan Zun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal gate integration structure and method including metal fuse, a...
- Patent number 8,159,040
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Douglas D. Coolbaugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical antifuse
- Patent number 8,115,275
- Issue date Feb 14, 2012
- International Business Machines Corporation
- Alberto Cestero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal gate compatible electrical antifuse
- Patent number 8,004,060
- Issue date Aug 23, 2011
- International Business Machines Corporation
- Deok-kee Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Random access electrically programmable e-fuse ROM
- Patent number 7,817,455
- Issue date Oct 19, 2010
- International Business Machines Corporation
- Gregory J. Fredeman
- G11 - INFORMATION STORAGE
Information Patent Grant
Implementing precise resistance measurement for 2D array efuse bit...
- Patent number 7,764,531
- Issue date Jul 27, 2010
- International Business Machines Corporation
- Anthony Gus Aipperspach
- G11 - INFORMATION STORAGE
Information Patent Grant
Transistor based antifuse with integrated heating element
- Patent number 7,723,820
- Issue date May 25, 2010
- International Business Machines Corporation
- Deok-Kee Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Electrical antifuse with integrated sensor
- Patent number 7,714,326
- Issue date May 11, 2010
- International Business Machines Corporation
- Deok-kee Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS EPROM and EEPROM devices and programmable CMOS inverters
- Patent number 7,700,993
- Issue date Apr 20, 2010
- International Business Machines Corporation
- Jin Cai
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing an electrical antifuse
- Patent number 7,674,691
- Issue date Mar 9, 2010
- International Business Machines Corporation
- Alberto Cestero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Design structure for improving sensing margin of electrically progr...
- Patent number 7,609,577
- Issue date Oct 27, 2009
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for improving sensing margin of electrically programmable fuses
- Patent number 7,525,831
- Issue date Apr 28, 2009
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Programming current stabilized electrical fuse programming circuit...
- Patent number 7,432,755
- Issue date Oct 7, 2008
- International Business Machines Corporation
- Byeongju Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for programming an electronically programmable semiconductor...
- Patent number 7,345,904
- Issue date Mar 18, 2008
- International Business Machines Corporation
- Byeongju Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for improving sensing margin of electrically p...
- Patent number 7,307,911
- Issue date Dec 11, 2007
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INPUT/OUTPUT INTERFACES BETWEEN PHOTONICS CHIPS
- Publication number 20240329308
- Publication date Oct 3, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Arpan Dasgupta
- G02 - OPTICS
Information Patent Application
THROUGH-SILICON VIA WITH IMPROVED SUBSTRATE CONTACT FOR REDUCED THR...
- Publication number 20180166381
- Publication date Jun 14, 2018
- GLOBALFOUNDRIES INC.
- John M. SAFRAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMIGRATION MONITOR
- Publication number 20180074110
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMIGRATION MONITOR
- Publication number 20180074111
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
POST ZERO VIA LAYER KEEP OUT ZONE OVER THROUGH SILICON VIA REDUCING...
- Publication number 20180061749
- Publication date Mar 1, 2018
- GLOBALFOUNDRIES INC.
- Mukta Ghate Farooq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR STRUCTURES GATED USING A CONDUCTOR-FILLED VIA OR TRENCH
- Publication number 20170287812
- Publication date Oct 5, 2017
- GLOBALFOUNDRIES INC.
- John M. Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTIGUOUS DUMMY STRUCTURE SURROUNDING THROUGH-SUBSTRATE VIA NE...
- Publication number 20160148863
- Publication date May 26, 2016
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMIGRATION MONITOR
- Publication number 20150380326
- Publication date Dec 31, 2015
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
Structures and Methds for Monitoring Dielectric Reliability With Th...
- Publication number 20150115982
- Publication date Apr 30, 2015
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-SUBSTRATE VIA SHIELDING
- Publication number 20150035589
- Publication date Feb 5, 2015
- International Business Machines Corporation
- Daeik Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH-SUBSTRATE VIA SHIELDING
- Publication number 20140118059
- Publication date May 1, 2014
- International Business Machines Corporation
- Daeik Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSICAL DESIGN SYMMETRY AND INTEGRATED CIRCUITS ENABLING THREE DIM...
- Publication number 20130307159
- Publication date Nov 21, 2013
- International Business Machines Corporation
- John Matthew Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECURE ANTI-FUSE WITH LOW VOLTAGE PROGRAMMING THROUGH LOCALIZED DIF...
- Publication number 20130063202
- Publication date Mar 14, 2013
- International Business Machines Corporation
- Yan Zun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICALLY PROGRAMMABLE FUSE USING ANISOMETRIC CONTACTS AND FABRI...
- Publication number 20120171857
- Publication date Jul 5, 2012
- International Business Machines Corporation
- CHANDRASEKHARAN KOTHANDARAMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrical Antifuse, Method of Manufacture and Method of Programming
- Publication number 20120129319
- Publication date May 24, 2012
- International Business Machines Corporation
- Alberto Cestero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECURE ANTI-FUSE WITH LOW VOLTAGE PROGRAMMING THROUGH LOCALIZED DIF...
- Publication number 20120012977
- Publication date Jan 19, 2012
- International Business Machines Corporation
- Yan Zun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICALLY PROGRAMMABLE FUSE USING ANISOMETRIC CONTACTS AND FABRI...
- Publication number 20100327399
- Publication date Dec 30, 2010
- International Business Machines Corporation
- CHANDRASEKHARAN KOTHANDARAMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Implementing Precise Resistance Measurement for 2D Array Efuse Bit...
- Publication number 20100067319
- Publication date Mar 18, 2010
- International Business Machines Corporation
- Anthony Gus Aipperspach
- G11 - INFORMATION STORAGE
Information Patent Application
Electrical Antifuse and Method of Programming
- Publication number 20090321735
- Publication date Dec 31, 2009
- Alberto Cestero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL GATE INTEGRATION STRUCTURE AND METHOD INCLUDING METAL FUSE, A...
- Publication number 20090283840
- Publication date Nov 19, 2009
- International Business Machines Corporation
- Douglas D. Coolbaugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL GATE COMPATIBLE ELECTRICAL ANTIFUSE
- Publication number 20090141533
- Publication date Jun 4, 2009
- International Business Machines Corporation
- Deok-kee Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS EPROM AND EEPROM DEVICES AND PROGRAMMABLE CMOS INVERTERS
- Publication number 20090114971
- Publication date May 7, 2009
- International Business Machines Corporation
- Jin Cai
- G11 - INFORMATION STORAGE
Information Patent Application
ANTI-FUSE STRUCTURE INCLUDING A SENSE PAD CONTACT REGION AND METHOD...
- Publication number 20090108400
- Publication date Apr 30, 2009
- International Business Machines Corporation
- Alberto Cestero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Random Access Electrically Programmable E-Fuse Rom
- Publication number 20080316789
- Publication date Dec 25, 2008
- Gregory J. Fredeman
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR AUTOMATICALLY ADJUSTING ELECTRICAL FUSE PROGRAMMING VOLTAGE
- Publication number 20080218247
- Publication date Sep 11, 2008
- International Business Machines Corporation
- Byeongju Park
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRICAL ANTIFUSE WITH INTEGRATED SENSOR
- Publication number 20080217658
- Publication date Sep 11, 2008
- International Business Machines Corporation
- Deok-kee Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL ANTIFUSE, METHOD OF MANUFACTURE AND METHOD OF PROGRAMMING
- Publication number 20080217736
- Publication date Sep 11, 2008
- International Business Machines Corporation
- Alberto Cestero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR BASED ANTIFUSE WITH INTEGRATED HEATING ELEMENT
- Publication number 20080157125
- Publication date Jul 3, 2008
- International Business Machines Corporation
- Deok-kee Kim
- G11 - INFORMATION STORAGE
Information Patent Application
DESIGN STRUCTURE FOR IMPROVING SENSING MARGIN OF ELECTRICALLY PROGR...
- Publication number 20080030260
- Publication date Feb 7, 2008
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR IMPROVING SENSING MARGIN OF ELECTRICALLY PROGRAMMABLE FUSES
- Publication number 20080025071
- Publication date Jan 31, 2008
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE

John M. Safran

Person

Patents Grantslast 30 patents

Electromigration monitor

Electromigration monitor

Through-silicon via with improved substrate contact for reduced thr...

Post zero via layer keep out zone over through silicon via reducing...

Transistor structures gated using a conductor-filled via or trench

Electromigration monitor

Through-silicon via with improved substrate contact for reduced thr...

Structures and methods for monitoring dielectric reliability with t...

Through-substrate via shielding

Through-substrate via shielding

Physical design symmetry and integrated circuits enabling three dim...

Electrically programmable fuse using anisometric contacts and fabri...

Secure anti-fuse with low voltage programming through localized dif...

Electrically programmable fuse using anisometric contacts and fabri...

Method of programming electrical antifuse

Secure anti-fuse with low voltage programming through localized dif...

Metal gate integration structure and method including metal fuse, a...

Electrical antifuse

Metal gate compatible electrical antifuse

Random access electrically programmable e-fuse ROM

Implementing precise resistance measurement for 2D array efuse bit...

Transistor based antifuse with integrated heating element

Electrical antifuse with integrated sensor

CMOS EPROM and EEPROM devices and programmable CMOS inverters

Method of manufacturing an electrical antifuse

Design structure for improving sensing margin of electrically progr...

Method for improving sensing margin of electrically programmable fuses

Programming current stabilized electrical fuse programming circuit...

Method for programming an electronically programmable semiconductor...

Apparatus and method for improving sensing margin of electrically p...

Patents Applicationslast 30 patents

OPTICAL INPUT/OUTPUT INTERFACES BETWEEN PHOTONICS CHIPS

THROUGH-SILICON VIA WITH IMPROVED SUBSTRATE CONTACT FOR REDUCED THR...

ELECTROMIGRATION MONITOR

ELECTROMIGRATION MONITOR

POST ZERO VIA LAYER KEEP OUT ZONE OVER THROUGH SILICON VIA REDUCING...

TRANSISTOR STRUCTURES GATED USING A CONDUCTOR-FILLED VIA OR TRENCH

NON-CONTIGUOUS DUMMY STRUCTURE SURROUNDING THROUGH-SUBSTRATE VIA NE...

ELECTROMIGRATION MONITOR

Structures and Methds for Monitoring Dielectric Reliability With Th...

THROUGH-SUBSTRATE VIA SHIELDING

THROUGH-SUBSTRATE VIA SHIELDING

PHYSICAL DESIGN SYMMETRY AND INTEGRATED CIRCUITS ENABLING THREE DIM...

SECURE ANTI-FUSE WITH LOW VOLTAGE PROGRAMMING THROUGH LOCALIZED DIF...

ELECTRICALLY PROGRAMMABLE FUSE USING ANISOMETRIC CONTACTS AND FABRI...

Electrical Antifuse, Method of Manufacture and Method of Programming

SECURE ANTI-FUSE WITH LOW VOLTAGE PROGRAMMING THROUGH LOCALIZED DIF...

ELECTRICALLY PROGRAMMABLE FUSE USING ANISOMETRIC CONTACTS AND FABRI...

Implementing Precise Resistance Measurement for 2D Array Efuse Bit...

Electrical Antifuse and Method of Programming

METAL GATE INTEGRATION STRUCTURE AND METHOD INCLUDING METAL FUSE, A...

METAL GATE COMPATIBLE ELECTRICAL ANTIFUSE

CMOS EPROM AND EEPROM DEVICES AND PROGRAMMABLE CMOS INVERTERS

ANTI-FUSE STRUCTURE INCLUDING A SENSE PAD CONTACT REGION AND METHOD...

Random Access Electrically Programmable E-Fuse Rom

METHOD FOR AUTOMATICALLY ADJUSTING ELECTRICAL FUSE PROGRAMMING VOLTAGE

ELECTRICAL ANTIFUSE WITH INTEGRATED SENSOR

ELECTRICAL ANTIFUSE, METHOD OF MANUFACTURE AND METHOD OF PROGRAMMING

TRANSISTOR BASED ANTIFUSE WITH INTEGRATED HEATING ELEMENT

DESIGN STRUCTURE FOR IMPROVING SENSING MARGIN OF ELECTRICALLY PROGR...

METHOD FOR IMPROVING SENSING MARGIN OF ELECTRICALLY PROGRAMMABLE FUSES