John P. Stewart

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King County, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe card array check plate with transition zones
- Patent number 5,831,443
- Issue date Nov 3, 1998
- Applied Precision, Inc.
- Steven C. Quarre
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal high accuracy microscope stage
- Patent number 5,812,310
- Issue date Sep 22, 1998
- Applied Precision, Inc.
- John P. Stewart
- G02 - OPTICS
Information Patent Grant
Method and apparatus for inspecting integrated circuit probe cards
- Patent number 5,508,629
- Issue date Apr 16, 1996
- Applied Precision, Inc.
- John P. Stewart
- G01 - MEASURING TESTING
Information Patent Grant
Method of making probe cards
- Patent number 5,060,371
- Issue date Oct 29, 1991
- Applied Precision, Inc.
- John P. Stewart
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit probe cards
- Patent number 4,918,374
- Issue date Apr 17, 1990
- Applied Precision, Inc.
- John P. Stewart
- G01 - MEASURING TESTING