John T. Melchior

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Determination of measurement error in an etalon
- Patent number 11,860,036
- Issue date Jan 2, 2024
- Cymer, LLC
- Russell Allen Burdt
- G01 - MEASURING TESTING
Information Patent Grant
Optical element for a deep ultraviolet light source
- Patent number 11,784,452
- Issue date Oct 10, 2023
- Cymer, LLC
- Saptaparna Das
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intracavity loss element for power amplifier
- Patent number 8,563,956
- Issue date Oct 22, 2013
- Cymer, LLC
- John Melchior
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wavemeter for gas discharge laser
- Patent number RE41457
- Issue date Jul 27, 2010
- Cymer, Inc.
- Peter C. Newman
- 372 - Coherent light generators
Information Patent Grant
Gas discharge MOPA laser spectral analysis module
- Patent number 7,292,343
- Issue date Nov 6, 2007
- Cymer, Inc.
- Rajasekhar M Rao
- G01 - MEASURING TESTING
Information Patent Grant
Gas discharge MOPA laser spectral analysis module
- Patent number 6,912,052
- Issue date Jun 28, 2005
- Cymer, Inc.
- Rajasekhar M Rao
- G01 - MEASURING TESTING
Information Patent Grant
High power deep ultraviolet laser with long life optics
- Patent number 6,904,073
- Issue date Jun 7, 2005
- Cymer, Inc.
- Thomas A. Yager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas discharge MOPA laser spectral analysis module
- Patent number 6,894,785
- Issue date May 17, 2005
- Cymer, Inc.
- Rajasekhar M. Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas discharge ultraviolet laser with enclosed beam path with added...
- Patent number 6,839,372
- Issue date Jan 4, 2005
- Cymer, Inc.
- Xiaojiang Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas discharge laser with improved beam path
- Patent number 6,795,474
- Issue date Sep 21, 2004
- Cymer, Inc.
- William N. Partlo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas discharge ultraviolet wavemeter with enhanced illumination
- Patent number 6,750,972
- Issue date Jun 15, 2004
- Cymer, Inc.
- Richard L. Sandstrom
- G01 - MEASURING TESTING
Information Patent Grant
Reliable, modular, production quality narrow-band high rep rate F2...
- Patent number RE38054
- Issue date Apr 1, 2003
- Cymer, Inc.
- Thomas Hofmann
- 372 - Coherent light generators
Information Patent Grant
Wavemeter for gas discharge laser
- Patent number 6,539,046
- Issue date Mar 25, 2003
- Cymer, Inc.
- Peter C. Newman
- G01 - MEASURING TESTING
Information Patent Grant
Reliable, modular, production quality narrow-band high rep rate ArF...
- Patent number 6,330,261
- Issue date Dec 11, 2001
- Cymer, Inc.
- Toshihiko Ishihara
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Reliable, modular, production quality narrow-band high rep rate F.s...
- Patent number 6,018,537
- Issue date Jan 25, 2000
- Cymer, Inc.
- Thomas Hofmann
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL COMPONENT FOR DEEP ULTRAVIOLET LIGHT SOURCE
- Publication number 20230375934
- Publication date Nov 23, 2023
- CYMER, LLC
- John Theodore Melchior
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETERMINATION OF MEASUREMENT ERROR IN AN ETALON
- Publication number 20230142333
- Publication date May 11, 2023
- CYMER, LLC
- Russell Allen Burdt
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR AND METHODS OF COMBINING MULTIPLE LASER BEAMS
- Publication number 20230004091
- Publication date Jan 5, 2023
- CYMER, LLC
- Rabin Paudel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIRECTED GAS PURGE TO REDUCE DUSTING OF EXCIMER DISCHARGE CHAMBER W...
- Publication number 20230006409
- Publication date Jan 5, 2023
- CYMER, LLC
- John Theodore Melchior
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL ELEMENT FOR A DEEP ULTRAVIOLET LIGHT SOURCE
- Publication number 20220102929
- Publication date Mar 31, 2022
- CYMER, LLC
- Saptaparna Das
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Window assembly for a gas discharge laser chamber
- Publication number 20080013589
- Publication date Jan 17, 2008
- Cymer, Inc.
- John T. Melchior
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Blister resistant optical coatings
- Publication number 20070099001
- Publication date May 3, 2007
- Cymer, Inc.
- John T. Melchior
- G02 - OPTICS
Information Patent Application
Gas discharge MOPA laser spectral analysis module
- Publication number 20050174576
- Publication date Aug 11, 2005
- Cymer, Inc.
- Rajasekhar M. Rao
- G01 - MEASURING TESTING
Information Patent Application
GAS DISCHARGE MOPA LASER SPECTRAL ANALYSIS MODULE
- Publication number 20050068538
- Publication date Mar 31, 2005
- Rajasekhar M. Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS DISCHARGE MOPA LASER SPECTRAL ANALYSIS MODULE
- Publication number 20050046856
- Publication date Mar 3, 2005
- Rajasekhar M. Rao
- G01 - MEASURING TESTING
Information Patent Application
High power deep ultraviolet laser with long life optics
- Publication number 20030219056
- Publication date Nov 27, 2003
- Thomas A. Yager
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Gas discharge ultraviolet wavemeter with enhanced illumination
- Publication number 20030016363
- Publication date Jan 23, 2003
- Richard L. Sandstrom
- G01 - MEASURING TESTING
Information Patent Application
Gas discharge laser with improved beam path
- Publication number 20020105994
- Publication date Aug 8, 2002
- William N. Partlo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEMETER FOR GAS DISCHARGE LASER
- Publication number 20020048294
- Publication date Apr 25, 2002
- PETER C. NEWMAN
- G01 - MEASURING TESTING

John T. Melchior

Person

Patents Grantslast 30 patents

Determination of measurement error in an etalon

Optical element for a deep ultraviolet light source

Intracavity loss element for power amplifier

Wavemeter for gas discharge laser

Gas discharge MOPA laser spectral analysis module

Gas discharge MOPA laser spectral analysis module

High power deep ultraviolet laser with long life optics

Gas discharge MOPA laser spectral analysis module

Gas discharge ultraviolet laser with enclosed beam path with added...

Gas discharge laser with improved beam path

Gas discharge ultraviolet wavemeter with enhanced illumination

Reliable, modular, production quality narrow-band high rep rate F2...

Wavemeter for gas discharge laser

Reliable, modular, production quality narrow-band high rep rate ArF...

Reliable, modular, production quality narrow-band high rep rate F.s...

Patents Applicationslast 30 patents

OPTICAL COMPONENT FOR DEEP ULTRAVIOLET LIGHT SOURCE

DETERMINATION OF MEASUREMENT ERROR IN AN ETALON

APPARATUS FOR AND METHODS OF COMBINING MULTIPLE LASER BEAMS

DIRECTED GAS PURGE TO REDUCE DUSTING OF EXCIMER DISCHARGE CHAMBER W...

OPTICAL ELEMENT FOR A DEEP ULTRAVIOLET LIGHT SOURCE

Window assembly for a gas discharge laser chamber

Blister resistant optical coatings

Gas discharge MOPA laser spectral analysis module

GAS DISCHARGE MOPA LASER SPECTRAL ANALYSIS MODULE

GAS DISCHARGE MOPA LASER SPECTRAL ANALYSIS MODULE

High power deep ultraviolet laser with long life optics

Gas discharge ultraviolet wavemeter with enhanced illumination

Gas discharge laser with improved beam path

WAVEMETER FOR GAS DISCHARGE LASER