John William Andberg

Person

Santa Cruz, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated cooling system for electronics testing apparatus
- Patent number 10,297,339
- Issue date May 21, 2019
- Advantest Corporation
- Brent Thordarson
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for massively parallel multi-wafer test
- Patent number 9,335,347
- Issue date May 10, 2016
- Advantest Corporation
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Grant
Stiffener plate for a probecard and method
- Patent number 9,128,122
- Issue date Sep 8, 2015
- Advantest Corporation
- John Andberg
- G01 - MEASURING TESTING
Information Patent Grant
Test electronics to device under test interfaces, and methods and a...
- Patent number 8,354,853
- Issue date Jan 15, 2013
- Advantest (Singapore) Pte Ltd
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems and methods for processing signals between a tes...
- Patent number 7,859,277
- Issue date Dec 28, 2010
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Forced air cooling of components on a probecard
- Patent number 7,541,824
- Issue date Jun 2, 2009
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer burn-in and text employing detachable cartridge
- Patent number 7,541,822
- Issue date Jun 2, 2009
- AEHR Test Systems
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Liquid cooled DUT card interface for wafer sort probing
- Patent number 7,501,844
- Issue date Mar 10, 2009
- Verigy (Singapore) Pte. Ltd.
- John Andberg
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for a paddle board probe card
- Patent number 7,459,921
- Issue date Dec 2, 2008
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Wiffle tree components, cooling systems, and methods of attaching a...
- Patent number 7,460,371
- Issue date Dec 2, 2008
- Agilent Technologies, Inc.
- John William Andberg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Using a leaf spring to attach clamp plates with a heat sink to both...
- Patent number 7,193,854
- Issue date Mar 20, 2007
- Verigy Pte Ltd
- Paul Bonomo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Zero insertion force printed circuit assembly connector system and...
- Patent number 7,147,499
- Issue date Dec 12, 2006
- Verigy IPco
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Wafer burn-in and test employing detachable cartridge
- Patent number 7,088,117
- Issue date Aug 8, 2006
- Aehr Test System
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Device, method, and system for detecting the presence of liquid in...
- Patent number 6,787,718
- Issue date Sep 7, 2004
- Agilent Technologies, Inc.
- John William Andberg
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level burn-in and test methods
- Patent number 6,580,283
- Issue date Jun 17, 2003
- AEHR Test Systems
- Mark Charles Carbone
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-burn-in and test employing detachable cartridge
- Patent number 6,556,032
- Issue date Apr 29, 2003
- AEHR Test Systems
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Kinematic coupling
- Patent number 6,413,113
- Issue date Jul 2, 2002
- Aehr Test Systems
- Frank Otto Uher
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer-level burn-in and test cartridge
- Patent number 6,340,895
- Issue date Jan 22, 2002
- Aehr Test Systems, Inc.
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Kinematic coupling
- Patent number 6,217,367
- Issue date Apr 17, 2001
- Aehr Test Systems
- Frank Otto Uher
Information Patent Grant
Wafer level burn-in and test thermal chuck and method
- Patent number 6,140,616
- Issue date Oct 31, 2000
- AEHR Test Systems
- John W. Andberg
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED COOLING SYSTEM FOR ELECTRONICS TESTING APPARATUS
- Publication number 20150233967
- Publication date Aug 20, 2015
- Advantest Corporation
- Brent THORDARSON
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST
- Publication number 20140070828
- Publication date Mar 13, 2014
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Application
STIFFENER PLATE FOR A PROBECARD AND METHOD
- Publication number 20130285690
- Publication date Oct 31, 2013
- ADVANTEST (SINGAPORE) PTE LTD
- John Andberg
- G01 - MEASURING TESTING
Information Patent Application
TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND A...
- Publication number 20130135002
- Publication date May 30, 2013
- ADVANTEST (SINGAPORE) PTE LTD
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A...
- Publication number 20110089966
- Publication date Apr 21, 2011
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND A...
- Publication number 20100134134
- Publication date Jun 3, 2010
- Verigy (Singapore) Pte. Ltd.
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Application
CLAMP WITH A NON-LINEAR BIASING MEMBER
- Publication number 20090255098
- Publication date Oct 15, 2009
- John William Andberg
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Liquid cooled dut card interface for wafer sort probing
- Publication number 20080143363
- Publication date Jun 19, 2008
- John Andberg
- G01 - MEASURING TESTING
Information Patent Application
Forced air cooling of components on a probecard
- Publication number 20080143364
- Publication date Jun 19, 2008
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a paddle board probe card
- Publication number 20070296424
- Publication date Dec 27, 2007
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
Wiffle tree components, cooling systems, and methods of attaching a...
- Publication number 20070274052
- Publication date Nov 29, 2007
- John William Andberg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus, systems and methods for processing signals between a tes...
- Publication number 20070247140
- Publication date Oct 25, 2007
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
Waterblock for cooling electrical and electronic circuitry
- Publication number 20070089858
- Publication date Apr 26, 2007
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Application
Using a leaf spring to attach clamp plates with a heat sink to both...
- Publication number 20060245166
- Publication date Nov 2, 2006
- Paul Bonomo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Wafer Burn-In and Test Employing Detachable Cartridge
- Publication number 20060132154
- Publication date Jun 22, 2006
- Frank O. Uher
- G01 - MEASURING TESTING
Information Patent Application
Wafer burn-in and test employing detachable cartridge
- Publication number 20040046578
- Publication date Mar 11, 2004
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Application
Device, method, and system for detecting the presence of liquid in...
- Publication number 20030201158
- Publication date Oct 30, 2003
- John William Andberg
- G01 - MEASURING TESTING
Information Patent Application
Wafer burn-in and test employing detachable cartridge
- Publication number 20020030502
- Publication date Mar 14, 2002
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Application
KINEMATIC COUPLING
- Publication number 20020002008
- Publication date Jan 3, 2002
- FRANK OTTO UHER
- G01 - MEASURING TESTING

John William Andberg

Person

Patents Grantslast 30 patents

Integrated cooling system for electronics testing apparatus

Method and apparatus for massively parallel multi-wafer test

Stiffener plate for a probecard and method

Test electronics to device under test interfaces, and methods and a...

Apparatus, systems and methods for processing signals between a tes...

Forced air cooling of components on a probecard

Wafer burn-in and text employing detachable cartridge

Liquid cooled DUT card interface for wafer sort probing

Method and apparatus for a paddle board probe card

Wiffle tree components, cooling systems, and methods of attaching a...

Using a leaf spring to attach clamp plates with a heat sink to both...

Zero insertion force printed circuit assembly connector system and...

Wafer burn-in and test employing detachable cartridge

Device, method, and system for detecting the presence of liquid in...

Wafer level burn-in and test methods

Wafer-burn-in and test employing detachable cartridge

Kinematic coupling

Wafer-level burn-in and test cartridge

Kinematic coupling

Wafer level burn-in and test thermal chuck and method

Patents Applicationslast 30 patents

INTEGRATED COOLING SYSTEM FOR ELECTRONICS TESTING APPARATUS

METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST

STIFFENER PLATE FOR A PROBECARD AND METHOD

TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND A...

APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A...

TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND A...

CLAMP WITH A NON-LINEAR BIASING MEMBER

Liquid cooled dut card interface for wafer sort probing

Forced air cooling of components on a probecard

Method and apparatus for a paddle board probe card

Wiffle tree components, cooling systems, and methods of attaching a...

Apparatus, systems and methods for processing signals between a tes...

Waterblock for cooling electrical and electronic circuitry

Using a leaf spring to attach clamp plates with a heat sink to both...

Wafer Burn-In and Test Employing Detachable Cartridge

Wafer burn-in and test employing detachable cartridge

Device, method, and system for detecting the presence of liquid in...

Wafer burn-in and test employing detachable cartridge

KINEMATIC COUPLING