Jonathan D. Halderman

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for jet printing a flux pattern selectively on...
- Patent number 6,709,963
- Issue date Mar 23, 2004
- Advanced Micro Devices, Inc.
- Jonathan D. Halderman
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Determination of flux coverage
- Patent number 6,597,444
- Issue date Jul 22, 2003
- Advanced Micro Devices, Inc.
- Jonathan D. Halderman
- G01 - MEASURING TESTING
Information Patent Grant
Method of preventing residue contamination of semiconductor devices...
- Patent number 6,536,649
- Issue date Mar 25, 2003
- Advanced Micro Devices, Inc.
- Raj N. Master
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Removing flux residue from reflow furnace using active gaseous solvent
- Patent number 6,527,164
- Issue date Mar 4, 2003
- Advanced Micro Devices, Inc.
- Terri J. Brownfield
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Spring frame for protecting packaged electronic devices
- Patent number 6,417,563
- Issue date Jul 9, 2002
- Advanced Micro Devices, Inc.
- Jonathan Halderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inline flux measurement system
- Patent number 6,399,902
- Issue date Jun 4, 2002
- Advanced Micro Devices, Inc.
- Terri J. Brownfield
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for measurement of duration of molten state for solder durin...
- Patent number 6,379,036
- Issue date Apr 30, 2002
- Advanced Micro Devices, Inc.
- Jonathan D. Halderman
- G01 - MEASURING TESTING
Information Patent Grant
Method to reduce occurrences of fillet cracking in flip-chip underfill
- Patent number 6,372,544
- Issue date Apr 16, 2002
- Advanced Micro Devices, Inc.
- Jonathan D. Halderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection of flux residue
- Patent number 6,367,679
- Issue date Apr 9, 2002
- Advanced Micro Devices, Inc.
- Raj N. Master
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Determination of flux prior to package assembly
- Patent number 6,258,612
- Issue date Jul 10, 2001
- Advanced Micro Devices, Inc.
- Raj N. Master
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument and method to measure the duration of exposure to temper...
- Patent number 6,231,229
- Issue date May 15, 2001
- Advanced Micro Devices, Inc.
- Jonathan D. Halderman
- G01 - MEASURING TESTING

Jonathan D. Halderman

Person

Patents Grantslast 30 patents

Method and apparatus for jet printing a flux pattern selectively on...

Determination of flux coverage

Method of preventing residue contamination of semiconductor devices...

Removing flux residue from reflow furnace using active gaseous solvent

Spring frame for protecting packaged electronic devices

Inline flux measurement system

Method for measurement of duration of molten state for solder durin...

Method to reduce occurrences of fillet cracking in flip-chip underfill

Detection of flux residue

Determination of flux prior to package assembly

Instrument and method to measure the duration of exposure to temper...