Jong-Ru Guo

Person

Fishkill, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Clock phase shift detector
- Patent number 9,077,319
- Issue date Jul 7, 2015
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock phase shift detector
- Patent number 8,669,786
- Issue date Mar 11, 2014
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for preventing circuit failure
- Patent number 8,493,075
- Issue date Jul 23, 2013
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of forming an integrated circuit interconnect structure
- Patent number 8,455,351
- Issue date Jun 4, 2013
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit interconnect structure
- Patent number 8,446,014
- Issue date May 21, 2013
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit interconnect structure
- Patent number 8,237,286
- Issue date Aug 7, 2012
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active inductor for ASIC application
- Patent number 8,115,575
- Issue date Feb 14, 2012
- International Business Machines Corporation
- Louis Lu-Chen Hsu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Leakage current mitigation in a semiconductor device
- Patent number 7,911,263
- Issue date Mar 22, 2011
- International Business Machines Corporation
- Jong-Ru Guo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Three-dimensional chip-stack synchronization
- Patent number 7,863,960
- Issue date Jan 4, 2011
- International Business Machines Corporation
- Ping-Chuan Wang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for extending the lifetime of a semiconductor...
- Patent number 7,821,330
- Issue date Oct 26, 2010
- International Business Machines Corporation
- Ping-Chuan Wang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus to measure threshold shifting of a MOSFET devi...
- Patent number 7,545,161
- Issue date Jun 9, 2009
- International Business Machines Corporation
- Louis Hsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CLOCK PHASE SHIFT DETECTOR
- Publication number 20140159775
- Publication date Jun 12, 2014
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT INTERCONNECT STRUCTURE
- Publication number 20120273966
- Publication date Nov 1, 2012
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT INTERCONNECT STRUCTURE
- Publication number 20120264289
- Publication date Oct 18, 2012
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PREVENTING CIRCUIT FAILURE
- Publication number 20120056667
- Publication date Mar 8, 2012
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT INTERCONNECT STRUCTURE
- Publication number 20110254168
- Publication date Oct 20, 2011
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW POWER GRADED BASE SiGe HBT LIGHT MODULATOR
- Publication number 20110215344
- Publication date Sep 8, 2011
- Henry D. Dardy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Leakage Current Mitigation in a Semiconductor Device
- Publication number 20100327958
- Publication date Dec 30, 2010
- Jong-Ru Guo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
THREE-DIMENSIONAL CHIP-STACK SYNCHRONIZATION
- Publication number 20100277210
- Publication date Nov 4, 2010
- International Business Machines Corporation
- Ping-Chuan Wang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ACTIVE INDUCTOR FOR ASIC APPLICATION
- Publication number 20100039191
- Publication date Feb 18, 2010
- International Business Machines Corporation
- Louis Lu-Chen Hsu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and Apparatus for Extending the Lifetime of a Semiconductor...
- Publication number 20090231025
- Publication date Sep 17, 2009
- International Business Machines Corporation
- Ping-Chuan Wang
- G05 - CONTROLLING REGULATING
Information Patent Application
Method And Apparatus To Measure Threshold Shifting Of A MOSFET Devi...
- Publication number 20090033355
- Publication date Feb 5, 2009
- International Business Machines Corporation
- Louis Hsu
- G01 - MEASURING TESTING

Jong-Ru Guo

Person

Patents Grantslast 30 patents

Clock phase shift detector

Clock phase shift detector

Method and apparatus for preventing circuit failure

Method of forming an integrated circuit interconnect structure

Integrated circuit interconnect structure

Integrated circuit interconnect structure

Active inductor for ASIC application

Leakage current mitigation in a semiconductor device

Three-dimensional chip-stack synchronization

Method and apparatus for extending the lifetime of a semiconductor...

Method and apparatus to measure threshold shifting of a MOSFET devi...

Patents Applicationslast 30 patents

CLOCK PHASE SHIFT DETECTOR

INTEGRATED CIRCUIT INTERCONNECT STRUCTURE

INTEGRATED CIRCUIT INTERCONNECT STRUCTURE

METHOD AND APPARATUS FOR PREVENTING CIRCUIT FAILURE

INTEGRATED CIRCUIT INTERCONNECT STRUCTURE

LOW POWER GRADED BASE SiGe HBT LIGHT MODULATOR

Leakage Current Mitigation in a Semiconductor Device

THREE-DIMENSIONAL CHIP-STACK SYNCHRONIZATION

ACTIVE INDUCTOR FOR ASIC APPLICATION

Method and Apparatus for Extending the Lifetime of a Semiconductor...

Method And Apparatus To Measure Threshold Shifting Of A MOSFET Devi...