Jorg Kiesewetter

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for testing electronic components of a repetitive pattern un...
- Patent number 8,368,413
- Issue date Feb 5, 2013
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with triaxial construction
- Patent number 8,240,650
- Issue date Aug 14, 2012
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Method for increasing the accuracy of the positioning of a first ob...
- Patent number 8,094,925
- Issue date Jan 10, 2012
- Cascade Microtech, Inc.
- Stefan Schneidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and arrangement for positioning a probe card
- Patent number 7,733,108
- Issue date Jun 8, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling the temperature of electronic...
- Patent number 7,671,615
- Issue date Mar 2, 2010
- SUSS MicroTec Tech Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing electronic components within horiz...
- Patent number 7,659,743
- Issue date Feb 9, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder for a probe for testing semiconductor components
- Patent number 7,579,849
- Issue date Aug 25, 2009
- SUSS MicroTec Test Systems GmbH
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station and method for measurements of semiconductor devices...
- Patent number 7,579,854
- Issue date Aug 25, 2009
- SUSS MicroTec Test Systems GmbH
- Jörg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of a device under test
- Patent number 7,573,283
- Issue date Aug 11, 2009
- SUSS Micro Tec Test Systems GmbH
- Axel Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Method and prober for contacting a contact area with a contact tip
- Patent number 7,057,408
- Issue date Jun 6, 2006
- SUSS MicroTec Test Systems (GmbH)
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for testing substrates at low temperatures
- Patent number 7,046,025
- Issue date May 16, 2006
- SUSS MicroTec Testsystems GmbH
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus with loading device
- Patent number 7,038,441
- Issue date May 2, 2006
- SUSS MicroTec Testsystems GmbH
- Karsten Stoll
- G01 - MEASURING TESTING
Information Patent Grant
Substrate-holding device for testing circuit arrangements on substr...
- Patent number 6,864,676
- Issue date Mar 8, 2005
- SUSS MicroTec Testsystems (GmbH)
- Jorg Kiesewetter
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROL
- Publication number 20170248973
- Publication date Aug 31, 2017
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TEST
- Publication number 20140184003
- Publication date Jul 3, 2014
- Cascade Microtech, Inc.
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...
- Publication number 20110221461
- Publication date Sep 15, 2011
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INCREASING THE ACCURACY OF THE POSITIONING OF A FIRST OB...
- Publication number 20100111403
- Publication date May 6, 2010
- Stefan Schineidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
- Publication number 20100045264
- Publication date Feb 25, 2010
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A...
- Publication number 20100045265
- Publication date Feb 25, 2010
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090085595
- Publication date Apr 2, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
MICROMANIPULATOR FOR MOVING A PROBE
- Publication number 20090049944
- Publication date Feb 26, 2009
- SUSS MicroTec Test Systems GmbH
- Jorg Kiesewetter
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090021275
- Publication date Jan 22, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST
- Publication number 20080315903
- Publication date Dec 25, 2008
- SUSS MicroTec Test Systems GmbH
- Axel SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
CHUCK WITH TRIAXIAL CONSTRUCTION
- Publication number 20080224426
- Publication date Sep 18, 2008
- SUSS MicroTec Test Systems GmbH
- Michael TEICH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING ELECTRONIC COMPONENTS AND TEST APPARATUS FOR CAR...
- Publication number 20080180119
- Publication date Jul 31, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan KANEV
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES...
- Publication number 20080143365
- Publication date Jun 19, 2008
- SUSS Micro Tec Test Systems GmbH
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS
- Publication number 20080122468
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...
- Publication number 20080042679
- Publication date Feb 21, 2008
- SUSS MicroTec Test Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING
Information Patent Application
PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES
- Publication number 20070064992
- Publication date Mar 22, 2007
- SUSS MicroTec Test Systems GmbH
- Michael Teich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and prober for contacting a contact area with a contact tip
- Publication number 20050007135
- Publication date Jan 13, 2005
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Application
Method for increasing the accuracy of the positioning of a first ob...
- Publication number 20040208355
- Publication date Oct 21, 2004
- Stefan Schneidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for testing movement-sensitive substrates
- Publication number 20040119492
- Publication date Jun 24, 2004
- Stefan Schneidewind
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Test apparatus with loading device
- Publication number 20040108847
- Publication date Jun 10, 2004
- Karsten Stoll
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus for testing substrates at low temperatures
- Publication number 20040070415
- Publication date Apr 15, 2004
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Application
Substrate-holding device for testing circuit arrangements on substr...
- Publication number 20020163350
- Publication date Nov 7, 2002
- Jorg Kiesewetter
- G01 - MEASURING TESTING

Jorg Kiesewetter

Person

Patents Grantslast 30 patents

Method for testing electronic components of a repetitive pattern un...

Chuck with triaxial construction

Method for increasing the accuracy of the positioning of a first ob...

Method and arrangement for positioning a probe card

Method and apparatus for controlling the temperature of electronic...

Method and apparatus for testing electronic components within horiz...

Probe holder for a probe for testing semiconductor components

Probe station and method for measurements of semiconductor devices...

Method for measurement of a device under test

Method and prober for contacting a contact area with a contact tip

Test apparatus for testing substrates at low temperatures

Test apparatus with loading device

Substrate-holding device for testing circuit arrangements on substr...

Patents Applicationslast 30 patents

PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROL

SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TEST

METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...

METHOD FOR INCREASING THE ACCURACY OF THE POSITIONING OF A FIRST OB...

PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL

METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A...

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

MICROMANIPULATOR FOR MOVING A PROBE

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST

CHUCK WITH TRIAXIAL CONSTRUCTION

METHOD FOR TESTING ELECTRONIC COMPONENTS AND TEST APPARATUS FOR CAR...

PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES...

PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS

METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...

PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES

Method and prober for contacting a contact area with a contact tip

Method for increasing the accuracy of the positioning of a first ob...

Method and apparatus for testing movement-sensitive substrates

Test apparatus with loading device

Test apparatus for testing substrates at low temperatures

Substrate-holding device for testing circuit arrangements on substr...