Jose De Jesus Pineda De Gyvez

Person

5656 AA Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
IC testing methods and apparatus
- Patent number 8,310,265
- Issue date Nov 13, 2012
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Grant
Power switch design method and program
- Patent number 8,302,059
- Issue date Oct 30, 2012
- NXP B.V.
- Jose de Jesus Pineda de Gyvez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive control of power supply for integrated circuits
- Patent number 8,120,410
- Issue date Feb 21, 2012
- ST-Ericsson SA
- Rinze Ida Mechtildis Peter Meijer
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Analog circuit testing and test pattern generation
- Patent number 8,122,423
- Issue date Feb 21, 2012
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Grant
Static memory devices
- Patent number 8,107,288
- Issue date Jan 31, 2012
- NXP B.V.
- Luis Elvira Villagra
- G11 - INFORMATION STORAGE
Information Patent Grant
Closed-loop control for performance tuning
- Patent number 7,930,577
- Issue date Apr 19, 2011
- ST-Ericsson SA
- Rinze Ida Mechtildis Peter Meijer
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and circuit arrangement for determining power supply noise
- Patent number 7,886,259
- Issue date Feb 8, 2011
- NXP B.V.
- Josep Rius Vazquez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analog IC having test arrangement and test method for such an IC
- Patent number 7,671,618
- Issue date Mar 2, 2010
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Grant
High sensitivity magnetic built-in current sensor
- Patent number 7,619,431
- Issue date Nov 17, 2009
- NXP B.V.
- Johannes De Wilde
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for reducing power consumption in a state retaining circuit,...
- Patent number 7,577,858
- Issue date Aug 18, 2009
- NXP B.V.
- Manish Garg
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing radio frequency and analogue circuits
- Patent number 7,539,589
- Issue date May 26, 2009
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G01 - MEASURING TESTING
Information Patent Grant
Real-time adaptive control for best IC performance
- Patent number 7,500,204
- Issue date Mar 3, 2009
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for testing a phase locked loop
- Patent number 7,477,110
- Issue date Jan 13, 2009
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G01 - MEASURING TESTING
Information Patent Grant
SRAM test method and SRAM test arrangement to detect weak cells
- Patent number 7,463,508
- Issue date Dec 9, 2008
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G11 - INFORMATION STORAGE
Information Patent Grant
Monitoring and controlling power consumption in a sequential logic...
- Patent number 7,457,971
- Issue date Nov 25, 2008
- NXP B.V.
- Jose de Jesus Pineda De Gyvez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for determining IDDQ
- Patent number 7,336,088
- Issue date Feb 26, 2008
- Josep Rius Vazquez
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for controlling the threshold voltage of transis...
- Patent number 7,332,953
- Issue date Feb 19, 2008
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Suppression of noise in an integrated circuit
- Patent number 7,256,645
- Issue date Aug 14, 2007
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test for weak SRAM cells
- Patent number 7,200,057
- Issue date Apr 3, 2007
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CONTROL SYSTEM FOR CONTROLLING THE POWER CONSUMPTION OF AN ELECTRON...
- Publication number 20120303983
- Publication date Nov 29, 2012
- NXP B.V.
- Ajay KAPOOR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive control of power supply for integrated circuits
- Publication number 20110095803
- Publication date Apr 28, 2011
- KONINKLIJKE PHILIPS ELECTRONICS N.V.
- Rinze Ida Mechtildls Peter Meijer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER SWITCH DESIGN METHOD AND PROGRAM
- Publication number 20110083116
- Publication date Apr 7, 2011
- NXP B.V.
- Jose de Jesus Pineda de Gyvez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR TUNING A DIGITAL SYSTEM
- Publication number 20100281245
- Publication date Nov 4, 2010
- NXP B.V.
- Francesco Pessolano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD
- Publication number 20100231252
- Publication date Sep 16, 2010
- NXP B.V.
- Sandeepkumar Goel
- G01 - MEASURING TESTING
Information Patent Application
STATIC MEMORY DEVICES
- Publication number 20100202192
- Publication date Aug 12, 2010
- NXP B.V.
- Luis Elvira Villagra
- G11 - INFORMATION STORAGE
Information Patent Application
ANALOG CIRCUIT TESTING AND TEST PATTERN GENERATION
- Publication number 20100109676
- Publication date May 6, 2010
- NXP, B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Application
TESTABLE ELECTRONIC DEVICE FOR WIRELESS COMMUNICATION
- Publication number 20100049465
- Publication date Feb 25, 2010
- NXP, B.V.
- Jose De Jesus Pineda De Gyvez
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST PREPARED INTEGRATED CIRCUIT WITH AN INTERNAL POWER SUPPLY DOMAIN
- Publication number 20100013493
- Publication date Jan 21, 2010
- NXP B.V.
- Rinze I. M. P. Meijer
- G01 - MEASURING TESTING
Information Patent Application
ANALOG IC HAVING TEST ARRANGEMENT AND TEST METHOD FOR SUCH AN IC
- Publication number 20090134904
- Publication date May 28, 2009
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Application
Control Scheme for Binary Control of a Performance Parameter
- Publication number 20080195878
- Publication date Aug 14, 2008
- Koninklijke Philips Electronics N.V.
- Rinze Ida Mechtildis Peter Meijer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Closed-Loop Control for Performance Tuning
- Publication number 20080106327
- Publication date May 8, 2008
- Koninklijke Philips Electronics N.V.
- Rinze Ida Mechtildis Peter Meijer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sram Test Method and Sram Test Arrangement to Detect Weak Cells
- Publication number 20080106956
- Publication date May 8, 2008
- Koninklijke Philips Electronics N.V.
- Jose De Jesus Pineda De Gyvez
- G11 - INFORMATION STORAGE
Information Patent Application
Method and Apparatus for Encoding of Low Voltage Swing Signals
- Publication number 20080043855
- Publication date Feb 21, 2008
- KONINKLIJKE PHILIPS ELECTRONICS N.V.
- Rohini Krishnan
- H03 - BASIC ELECTRONIC CIRCUITRY

Jose De Jesus Pineda De Gyvez

Person

Patents Grantslast 30 patents

IC testing methods and apparatus

Power switch design method and program

Adaptive control of power supply for integrated circuits

Analog circuit testing and test pattern generation

Static memory devices

Closed-loop control for performance tuning

Method and circuit arrangement for determining power supply noise

Analog IC having test arrangement and test method for such an IC

High sensitivity magnetic built-in current sensor

Method for reducing power consumption in a state retaining circuit,...

Testing radio frequency and analogue circuits

Real-time adaptive control for best IC performance

Method and device for testing a phase locked loop

SRAM test method and SRAM test arrangement to detect weak cells

Monitoring and controlling power consumption in a sequential logic...

Method and apparatus for determining IDDQ

Circuit and method for controlling the threshold voltage of transis...

Suppression of noise in an integrated circuit

Test for weak SRAM cells

Patents Applicationslast 30 patents

CONTROL SYSTEM FOR CONTROLLING THE POWER CONSUMPTION OF AN ELECTRON...

Adaptive control of power supply for integrated circuits

POWER SWITCH DESIGN METHOD AND PROGRAM

METHOD AND APPARATUS FOR TUNING A DIGITAL SYSTEM

TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD

STATIC MEMORY DEVICES

ANALOG CIRCUIT TESTING AND TEST PATTERN GENERATION

TESTABLE ELECTRONIC DEVICE FOR WIRELESS COMMUNICATION

TEST PREPARED INTEGRATED CIRCUIT WITH AN INTERNAL POWER SUPPLY DOMAIN

ANALOG IC HAVING TEST ARRANGEMENT AND TEST METHOD FOR SUCH AN IC

Control Scheme for Binary Control of a Performance Parameter

Closed-Loop Control for Performance Tuning

Sram Test Method and Sram Test Arrangement to Detect Weak Cells

Method and Apparatus for Encoding of Low Voltage Swing Signals