Josef Biberger

Person

Wildenberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for raster scanning a surface of an object usin...
- Patent number 11,504,798
- Issue date Nov 22, 2022
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Operating a particle beam device
- Patent number 11,501,948
- Issue date Nov 15, 2022
- Carl Zeiss Microscopy GmbH
- Luyang Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microtome
- Patent number 11,474,004
- Issue date Oct 18, 2022
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for capturing volume information of three-dime...
- Patent number 11,215,536
- Issue date Jan 4, 2022
- Carl Zeiss Microscopy GmbH
- Marlene Thaler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for positioning microscopic specimens with the...
- Patent number 11,152,187
- Issue date Oct 19, 2021
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a particle beam system, particle beam system an...
- Patent number 11,087,957
- Issue date Aug 10, 2021
- Carl Zeiss SMT GmbH
- Daniel Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a TEM sample
- Patent number 10,741,360
- Issue date Aug 11, 2020
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling a particle beam device and particle beam dev...
- Patent number 10,658,152
- Issue date May 19, 2020
- Carl Zeiss Microscopy GmbH
- Christian Hendrich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a plurality of FIB-SEM systems
- Patent number 10,615,002
- Issue date Apr 7, 2020
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- G01 - MEASURING TESTING
Information Patent Grant
Object preparation device and particle beam device having an object...
- Patent number 10,483,084
- Issue date Nov 19, 2019
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Object preparation device and particle beam device with an object p...
- Patent number 10,319,561
- Issue date Jun 11, 2019
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for raster scanning a surface of an object usin...
- Patent number 10,279,419
- Issue date May 7, 2019
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for structuring an object and associated particle beam system
- Patent number 9,960,012
- Issue date May 1, 2018
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing and/or for observing an object, and particle...
- Patent number 9,685,300
- Issue date Jun 20, 2017
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing and/or processing an object as well as a parti...
- Patent number 9,558,911
- Issue date Jan 31, 2017
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing and/or for observing an object, and particle...
- Patent number 9,251,997
- Issue date Feb 2, 2016
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device having a sample holder
- Patent number 9,190,242
- Issue date Nov 17, 2015
- Carl Zeiss NTS GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning a surface of an object using a pa...
- Patent number 9,136,090
- Issue date Sep 15, 2015
- Carl Zeiss Microscopy GmbH
- Ralph Pulwey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for operating the same
- Patent number 8,927,948
- Issue date Jan 6, 2015
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam system and method of operating an ion beam system
- Patent number 8,921,805
- Issue date Dec 30, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing of an object
- Patent number 8,816,303
- Issue date Aug 26, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system
- Patent number 8,759,796
- Issue date Jun 24, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for operating the same
- Patent number 8,723,136
- Issue date May 13, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam system and method of operating ion beam system
- Patent number 8,710,451
- Issue date Apr 29, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a representation of an object by means of a pa...
- Patent number 8,471,202
- Issue date Jun 25, 2013
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING A POSITION OF AN OBJECT IN A BEAM APPARATUS,...
- Publication number 20240258068
- Publication date Aug 1, 2024
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING, PROCESSING, AND/OR ANALYZING AN OBJECT USING A PARTICLE BE...
- Publication number 20240038481
- Publication date Feb 1, 2024
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES
- Publication number 20230343546
- Publication date Oct 26, 2023
- CARL ZEISS MICROSCOPY GMBH
- Michele Nicoletti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR POSITIONING OBJECTS IN A PARTICLE BEAM MICROSCOPE WITH T...
- Publication number 20220375714
- Publication date Nov 24, 2022
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CAPTURING VOLUME INFORMATION OF THREE-DIME...
- Publication number 20210018403
- Publication date Jan 21, 2021
- CARL ZEISS MICROSCOPY GMBH
- Marlene Thaler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROTOME
- Publication number 20210018405
- Publication date Jan 21, 2021
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM DEVICE AND PARTICLE BEAM DEVIC...
- Publication number 20200395190
- Publication date Dec 17, 2020
- CARL ZEISS MICROSCOPY GMBH
- Luyang Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CONTROLLING A UNIT OF A PARTICLE BEAM DEVICE AND PARTICL...
- Publication number 20200333271
- Publication date Oct 22, 2020
- CARL ZEISS MICROSCOPY GMBH
- Christian Hendrich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining an image recording aberration
- Publication number 20200311886
- Publication date Oct 1, 2020
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OPERATING A PARTICLE BEAM SYSTEM, PARTICLE BEAM SYSTEM AN...
- Publication number 20200234913
- Publication date Jul 23, 2020
- Carl Zeiss SMT GMBH
- Daniel Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES
- Publication number 20200035444
- Publication date Jan 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Michele Nicoletti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PLURALITY OF FIB-SEM SYSTEMS
- Publication number 20200027696
- Publication date Jan 23, 2020
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR POSITIONING MICROSCOPIC SPECIMENTS WITH TH...
- Publication number 20190355548
- Publication date Nov 21, 2019
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING A TEM SAMPLE
- Publication number 20190318908
- Publication date Oct 17, 2019
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR RASTER SCANNING A SURFACE OF AN OBJECT USIN...
- Publication number 20190270159
- Publication date Sep 5, 2019
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...
- Publication number 20190103249
- Publication date Apr 4, 2019
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...
- Publication number 20180286632
- Publication date Oct 4, 2018
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR STRUCTURING AN OBJECT AND ASSOCIATED PARTICLE BEAM SYSTEM
- Publication number 20170263416
- Publication date Sep 14, 2017
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROCESSING AND/OR FOR OBSERVING AN OBJECT, AND PARTICLE...
- Publication number 20160181058
- Publication date Jun 23, 2016
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING AND/OR PROCESSING AN OBJECT AS WELL AS A PARTI...
- Publication number 20160035534
- Publication date Feb 4, 2016
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20150144801
- Publication date May 28, 2015
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROCESSING AND/OR FOR OBSERVING AN OBJECT, AND PARTICLE...
- Publication number 20150048248
- Publication date Feb 19, 2015
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20140217303
- Publication date Aug 7, 2014
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam System and Method of Operating an Ion Beam System
- Publication number 20140197328
- Publication date Jul 17, 2014
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Scanning a Surface of an Object Using a Pa...
- Publication number 20130320226
- Publication date Dec 5, 2013
- CARL ZEISS MICROSCOPY GMBH
- Ralph Pulwey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...
- Publication number 20130270437
- Publication date Oct 17, 2013
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Raster Scanning a Surface of an Object Usin...
- Publication number 20130180962
- Publication date Jul 18, 2013
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20130082188
- Publication date Apr 4, 2013
- Carl Zeiss Mocroscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam System and Method of Operating Ion Beam System
- Publication number 20120256098
- Publication date Oct 11, 2012
- CARL ZEISS NTS GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Processing of an Object
- Publication number 20120145895
- Publication date Jun 14, 2012
- CARL ZEISS NTS GMBH
- Josef BIBERGER
- H01 - BASIC ELECTRIC ELEMENTS

Josef Biberger

Person

Patents Grantslast 30 patents

Methods and systems for raster scanning a surface of an object usin...

Operating a particle beam device

Microtome

Method and apparatus for capturing volume information of three-dime...

Method and apparatus for positioning microscopic specimens with the...

Method of operating a particle beam system, particle beam system an...

Method for producing a TEM sample

Method for controlling a particle beam device and particle beam dev...

Method for operating a plurality of FIB-SEM systems

Object preparation device and particle beam device having an object...

Object preparation device and particle beam device with an object p...

Methods and systems for raster scanning a surface of an object usin...

Method for structuring an object and associated particle beam system

Method for processing and/or for observing an object, and particle...

Method for analyzing and/or processing an object as well as a parti...

Method for processing and/or for observing an object, and particle...

Particle beam device having a sample holder

Method and apparatus for scanning a surface of an object using a pa...

Particle beam system and method for operating the same

Ion beam system and method of operating an ion beam system

Method of processing of an object

Particle beam system

Particle beam system and method for operating the same

Ion beam system and method of operating ion beam system

Method for producing a representation of an object by means of a pa...

Patents Applicationslast 30 patents

METHOD FOR DETERMINING A POSITION OF AN OBJECT IN A BEAM APPARATUS,...

IMAGING, PROCESSING, AND/OR ANALYZING AN OBJECT USING A PARTICLE BE...

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES

METHOD FOR POSITIONING OBJECTS IN A PARTICLE BEAM MICROSCOPE WITH T...

METHOD AND APPARATUS FOR CAPTURING VOLUME INFORMATION OF THREE-DIME...

MICROTOME

METHOD FOR OPERATING A PARTICLE BEAM DEVICE AND PARTICLE BEAM DEVIC...

METHOD FOR CONTROLLING A UNIT OF A PARTICLE BEAM DEVICE AND PARTICL...

Method for determining an image recording aberration

METHOD OF OPERATING A PARTICLE BEAM SYSTEM, PARTICLE BEAM SYSTEM AN...

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES

METHOD FOR OPERATING A PLURALITY OF FIB-SEM SYSTEMS

METHOD AND APPARATUS FOR POSITIONING MICROSCOPIC SPECIMENTS WITH TH...

METHOD FOR PRODUCING A TEM SAMPLE

METHODS AND SYSTEMS FOR RASTER SCANNING A SURFACE OF AN OBJECT USIN...

OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...

OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...

METHOD FOR STRUCTURING AN OBJECT AND ASSOCIATED PARTICLE BEAM SYSTEM

METHOD FOR PROCESSING AND/OR FOR OBSERVING AN OBJECT, AND PARTICLE...

METHOD FOR ANALYZING AND/OR PROCESSING AN OBJECT AS WELL AS A PARTI...

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME

METHOD FOR PROCESSING AND/OR FOR OBSERVING AN OBJECT, AND PARTICLE...

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME

Ion Beam System and Method of Operating an Ion Beam System

Method and Apparatus for Scanning a Surface of an Object Using a Pa...

METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...

Methods and Systems for Raster Scanning a Surface of an Object Usin...

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME

Ion Beam System and Method of Operating Ion Beam System

Method of Processing of an Object