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Joseph Bendahan
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Dose-controlled vehicle inspection
Patent number
11,802,988
Issue date
Oct 31, 2023
SMITHS HEIMANN SAS
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Vehicle inspection controlled using image information
Patent number
11,536,871
Issue date
Dec 27, 2022
SMITHS HEIMANN SAS
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for improving penetration of radiographic scanners
Patent number
11,397,276
Issue date
Jul 26, 2022
Rapiscan Systems, Inc.
Joseph Bendahan
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Distributed analysis x-ray inspection methods and systems
Patent number
11,099,294
Issue date
Aug 24, 2021
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Distributed analysis X-ray inspection methods and systems
Patent number
10,830,920
Issue date
Nov 10, 2020
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for improving penetration of radiographic scanners
Patent number
10,754,057
Issue date
Aug 25, 2020
Rapiscan Systems, Inc.
Joseph Bendahan
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
High-power X-ray sources and methods of operation
Patent number
10,600,609
Issue date
Mar 24, 2020
Rapiscan Systems, Inc.
Joseph Bendahan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for a multi-view scanner
Patent number
10,585,206
Issue date
Mar 10, 2020
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Distributed analysis x-ray inspection methods and systems
Patent number
10,509,142
Issue date
Dec 17, 2019
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray inspection system that integrates manifest data with imaging/...
Patent number
10,422,919
Issue date
Sep 24, 2019
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated primary and special nuclear material alarm resolution
Patent number
10,393,915
Issue date
Aug 27, 2019
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Grant
High dynamic range radiographic imaging system
Patent number
10,386,504
Issue date
Aug 20, 2019
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for automated, rapid detection of high-atomic-n...
Patent number
9,772,426
Issue date
Sep 26, 2017
Rapiscan Systems, Inc.
Robert A. Armistead
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray inspection system that integrates manifest data with imaging/...
Patent number
9,632,206
Issue date
Apr 25, 2017
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for high-Z threat alarm resolution
Patent number
9,625,606
Issue date
Apr 18, 2017
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Covert surveillance using multi-modality sensing
Patent number
9,562,866
Issue date
Feb 7, 2017
Rapiscan Systems, Inc.
Edward James Morton
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Thin gap chamber neutron detectors
Patent number
9,557,427
Issue date
Jan 31, 2017
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Method of electron beam transport in an X-ray scanner
Patent number
9,442,213
Issue date
Sep 13, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for scanning objects
Patent number
9,435,752
Issue date
Sep 6, 2016
Rapiscan Systems, Inc.
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Grant
Composite gamma-neutron detection system
Patent number
9,329,285
Issue date
May 3, 2016
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Grant
Mobile aircraft inspection system
Patent number
9,316,760
Issue date
Apr 19, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Systems and methods for high-Z threat alarm resolution
Patent number
9,310,323
Issue date
Apr 12, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
X-ray based system and methods for inspecting a person's shoes for...
Patent number
9,223,051
Issue date
Dec 29, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
System and method for X-ray source weight reduction
Patent number
9,224,573
Issue date
Dec 29, 2015
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Low-dose radiographic imaging system
Patent number
9,218,933
Issue date
Dec 22, 2015
Rapidscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
High-energy X-ray-spectroscopy-based inspection system and methods...
Patent number
9,207,195
Issue date
Dec 8, 2015
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for time-of-flight neutron interrogation for ma...
Patent number
9,123,519
Issue date
Sep 1, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Multi-view cargo scanner
Patent number
9,086,497
Issue date
Jul 21, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Scanning systems
Patent number
9,052,264
Issue date
Jun 9, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Composite gamma-neutron detection system
Patent number
8,963,094
Issue date
Feb 24, 2015
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR INSPECTION PORTALS
Publication number
20230251209
Publication date
Aug 10, 2023
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR REAL-TIME CONFIGURABLE BACKSCATTER SCANNERS
Publication number
20230236141
Publication date
Jul 27, 2023
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
PULSE FREQUENCY ADJUSTMENT
Publication number
20230221266
Publication date
Jul 13, 2023
SMITHS DETECTION FRANCE S.A.S.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
BELOW-GROUND COMPUTED TOMOGRAPHY CARGO INSPECTION SYSTEM AND METHOD
Publication number
20220390391
Publication date
Dec 8, 2022
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
HIGH-ENERGY X-RAY IMAGING SYSTEM
Publication number
20220260745
Publication date
Aug 18, 2022
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
Publication number
20210405243
Publication date
Dec 30, 2021
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DOSE-CONTROLLED VEHICLE INSPECTION
Publication number
20210302614
Publication date
Sep 30, 2021
SMITHS DETECTION INC.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
VEHICLE INSPECTION CONTROLLED USING IMAGE INFORMATION
Publication number
20210302615
Publication date
Sep 30, 2021
SMITHS DETECTION INC.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Improving Penetration of Radiographic Scanners
Publication number
20200355842
Publication date
Nov 12, 2020
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
Publication number
20200073009
Publication date
Mar 5, 2020
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
Publication number
20200073008
Publication date
Mar 5, 2020
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Integrated Primary and Special Nuclear Material Alarm Resolution
Publication number
20200025955
Publication date
Jan 23, 2020
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
Publication number
20190162873
Publication date
May 30, 2019
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and System for a Multi-View Scanner
Publication number
20190137651
Publication date
May 9, 2019
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
High-Power X-Ray Sources and Methods of Operation
Publication number
20190043686
Publication date
Feb 7, 2019
Rapiscan Systems, Inc.
Joseph Bendahan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Systems and Methods for Improving Penetration of Radiographic Scanners
Publication number
20180017702
Publication date
Jan 18, 2018
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Covert Surveillance Using Multi-Modality Sensing
Publication number
20170299526
Publication date
Oct 19, 2017
Rapiscan Systems, Inc.
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Inspection System That Integrates Manifest Data With Imaging/...
Publication number
20170299765
Publication date
Oct 19, 2017
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G01 - MEASURING TESTING
Information
Patent Application
High Dynamic Range Radiographic Imaging System
Publication number
20170123077
Publication date
May 4, 2017
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Automated, Rapid Detection of High-Atomic-N...
Publication number
20160349397
Publication date
Dec 1, 2016
Rapiscan Systems, Inc.
Robert A. Armistead
G01 - MEASURING TESTING
Information
Patent Application
Non-Intrusive Inspection Systems and Methods for the Detection of M...
Publication number
20160223706
Publication date
Aug 4, 2016
Rapiscan Systems, Inc.
Edward D. Franco
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for High-Z Threat Alarm Resolution
Publication number
20160216398
Publication date
Jul 28, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Inspection System That Integrates Manifest Data With Imaging/...
Publication number
20160097877
Publication date
Apr 7, 2016
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G01 - MEASURING TESTING
Information
Patent Application
Composite Gamma-Neutron Detection System
Publication number
20160091618
Publication date
Mar 31, 2016
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Application
Thin Gap Chamber Neutron Detectors
Publication number
20160018538
Publication date
Jan 21, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Covert Surveillance Using Multi-Modality Sensing
Publication number
20150330917
Publication date
Nov 19, 2015
Rapiscan Systems, Inc.
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Application
LOW-DOSE RADIOGRAPHIC IMAGING SYSTEM
Publication number
20150325401
Publication date
Nov 12, 2015
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
Information
Patent Application
Mobile Aircraft Inspection System
Publication number
20150247947
Publication date
Sep 3, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for High-Z Threat Alarm Resolution
Publication number
20150108349
Publication date
Apr 23, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Method of Electron Beam Transport in an X-Ray Scanner
Publication number
20150014526
Publication date
Jan 15, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING