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Joseph Bendahan
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
High-energy x-ray imaging system
Patent number
12,253,648
Issue date
Mar 18, 2025
Smiths Detection Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Pulse frequency adjustment
Patent number
12,203,879
Issue date
Jan 21, 2025
SMITHS DETECTION FRANCE S.A.S.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Distributed analysis X-ray inspection methods and systems
Patent number
12,174,334
Issue date
Dec 24, 2024
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dose-controlled vehicle inspection
Patent number
11,802,988
Issue date
Oct 31, 2023
SMITHS HEIMANN SAS
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Vehicle inspection controlled using image information
Patent number
11,536,871
Issue date
Dec 27, 2022
SMITHS HEIMANN SAS
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for improving penetration of radiographic scanners
Patent number
11,397,276
Issue date
Jul 26, 2022
Rapiscan Systems, Inc.
Joseph Bendahan
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Distributed analysis x-ray inspection methods and systems
Patent number
11,099,294
Issue date
Aug 24, 2021
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Distributed analysis X-ray inspection methods and systems
Patent number
10,830,920
Issue date
Nov 10, 2020
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for improving penetration of radiographic scanners
Patent number
10,754,057
Issue date
Aug 25, 2020
Rapiscan Systems, Inc.
Joseph Bendahan
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
High-power X-ray sources and methods of operation
Patent number
10,600,609
Issue date
Mar 24, 2020
Rapiscan Systems, Inc.
Joseph Bendahan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for a multi-view scanner
Patent number
10,585,206
Issue date
Mar 10, 2020
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Distributed analysis x-ray inspection methods and systems
Patent number
10,509,142
Issue date
Dec 17, 2019
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray inspection system that integrates manifest data with imaging/...
Patent number
10,422,919
Issue date
Sep 24, 2019
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated primary and special nuclear material alarm resolution
Patent number
10,393,915
Issue date
Aug 27, 2019
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Grant
High dynamic range radiographic imaging system
Patent number
10,386,504
Issue date
Aug 20, 2019
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for automated, rapid detection of high-atomic-n...
Patent number
9,772,426
Issue date
Sep 26, 2017
Rapiscan Systems, Inc.
Robert A. Armistead
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray inspection system that integrates manifest data with imaging/...
Patent number
9,632,206
Issue date
Apr 25, 2017
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for high-Z threat alarm resolution
Patent number
9,625,606
Issue date
Apr 18, 2017
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Covert surveillance using multi-modality sensing
Patent number
9,562,866
Issue date
Feb 7, 2017
Rapiscan Systems, Inc.
Edward James Morton
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Thin gap chamber neutron detectors
Patent number
9,557,427
Issue date
Jan 31, 2017
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Method of electron beam transport in an X-ray scanner
Patent number
9,442,213
Issue date
Sep 13, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for scanning objects
Patent number
9,435,752
Issue date
Sep 6, 2016
Rapiscan Systems, Inc.
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Grant
Composite gamma-neutron detection system
Patent number
9,329,285
Issue date
May 3, 2016
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Grant
Mobile aircraft inspection system
Patent number
9,316,760
Issue date
Apr 19, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Systems and methods for high-Z threat alarm resolution
Patent number
9,310,323
Issue date
Apr 12, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
X-ray based system and methods for inspecting a person's shoes for...
Patent number
9,223,051
Issue date
Dec 29, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
System and method for X-ray source weight reduction
Patent number
9,224,573
Issue date
Dec 29, 2015
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Low-dose radiographic imaging system
Patent number
9,218,933
Issue date
Dec 22, 2015
Rapidscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
High-energy X-ray-spectroscopy-based inspection system and methods...
Patent number
9,207,195
Issue date
Dec 8, 2015
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for time-of-flight neutron interrogation for ma...
Patent number
9,123,519
Issue date
Sep 1, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR INSPECTION PORTALS
Publication number
20230251209
Publication date
Aug 10, 2023
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR REAL-TIME CONFIGURABLE BACKSCATTER SCANNERS
Publication number
20230236141
Publication date
Jul 27, 2023
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
PULSE FREQUENCY ADJUSTMENT
Publication number
20230221266
Publication date
Jul 13, 2023
SMITHS DETECTION FRANCE S.A.S.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
BELOW-GROUND COMPUTED TOMOGRAPHY CARGO INSPECTION SYSTEM AND METHOD
Publication number
20220390391
Publication date
Dec 8, 2022
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
HIGH-ENERGY X-RAY IMAGING SYSTEM
Publication number
20220260745
Publication date
Aug 18, 2022
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
Publication number
20210405243
Publication date
Dec 30, 2021
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DOSE-CONTROLLED VEHICLE INSPECTION
Publication number
20210302614
Publication date
Sep 30, 2021
SMITHS DETECTION INC.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
VEHICLE INSPECTION CONTROLLED USING IMAGE INFORMATION
Publication number
20210302615
Publication date
Sep 30, 2021
SMITHS DETECTION INC.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Improving Penetration of Radiographic Scanners
Publication number
20200355842
Publication date
Nov 12, 2020
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
Publication number
20200073009
Publication date
Mar 5, 2020
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
Publication number
20200073008
Publication date
Mar 5, 2020
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Integrated Primary and Special Nuclear Material Alarm Resolution
Publication number
20200025955
Publication date
Jan 23, 2020
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
Publication number
20190162873
Publication date
May 30, 2019
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and System for a Multi-View Scanner
Publication number
20190137651
Publication date
May 9, 2019
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
High-Power X-Ray Sources and Methods of Operation
Publication number
20190043686
Publication date
Feb 7, 2019
Rapiscan Systems, Inc.
Joseph Bendahan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Systems and Methods for Improving Penetration of Radiographic Scanners
Publication number
20180017702
Publication date
Jan 18, 2018
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Covert Surveillance Using Multi-Modality Sensing
Publication number
20170299526
Publication date
Oct 19, 2017
Rapiscan Systems, Inc.
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Inspection System That Integrates Manifest Data With Imaging/...
Publication number
20170299765
Publication date
Oct 19, 2017
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G01 - MEASURING TESTING
Information
Patent Application
High Dynamic Range Radiographic Imaging System
Publication number
20170123077
Publication date
May 4, 2017
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Automated, Rapid Detection of High-Atomic-N...
Publication number
20160349397
Publication date
Dec 1, 2016
Rapiscan Systems, Inc.
Robert A. Armistead
G01 - MEASURING TESTING
Information
Patent Application
Non-Intrusive Inspection Systems and Methods for the Detection of M...
Publication number
20160223706
Publication date
Aug 4, 2016
Rapiscan Systems, Inc.
Edward D. Franco
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for High-Z Threat Alarm Resolution
Publication number
20160216398
Publication date
Jul 28, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Inspection System That Integrates Manifest Data With Imaging/...
Publication number
20160097877
Publication date
Apr 7, 2016
Rapiscan Systems, Inc.
Shehul Sailesh Parikh
G01 - MEASURING TESTING
Information
Patent Application
Composite Gamma-Neutron Detection System
Publication number
20160091618
Publication date
Mar 31, 2016
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Application
Thin Gap Chamber Neutron Detectors
Publication number
20160018538
Publication date
Jan 21, 2016
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Covert Surveillance Using Multi-Modality Sensing
Publication number
20150330917
Publication date
Nov 19, 2015
Rapiscan Systems, Inc.
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Application
LOW-DOSE RADIOGRAPHIC IMAGING SYSTEM
Publication number
20150325401
Publication date
Nov 12, 2015
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
Information
Patent Application
Mobile Aircraft Inspection System
Publication number
20150247947
Publication date
Sep 3, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for High-Z Threat Alarm Resolution
Publication number
20150108349
Publication date
Apr 23, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Application
Method of Electron Beam Transport in an X-Ray Scanner
Publication number
20150014526
Publication date
Jan 15, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING