Joseph C. Werner

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Advanced temperature monitoring system and methods for semiconducto...
- Patent number 12,068,180
- Issue date Aug 20, 2024
- Applied Materials, Inc.
- Xuesong Lu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Advanced temperature monitoring system with expandable modular layo...
- Patent number 12,013,291
- Issue date Jun 18, 2024
- Applied Materials, Inc.
- Shuran Sheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate support cover for high-temperature corrosive environment
- Patent number 11,866,821
- Issue date Jan 9, 2024
- Applied Materials, Inc.
- Shuran Sheng
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Lid stack for high frequency processing
- Patent number 11,846,011
- Issue date Dec 19, 2023
- Applied Materials, Inc.
- Shuran Sheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
High-temperature chamber and chamber component cleaning and mainten...
- Patent number 11,837,448
- Issue date Dec 5, 2023
- Applied Materials, Inc.
- Shuran Sheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lid stack for high frequency processing
- Patent number 11,499,231
- Issue date Nov 15, 2022
- Applied Materials, Inc.
- Shuran Sheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
In-situ light detection methods and apparatus for ultraviolet semic...
- Patent number 11,215,934
- Issue date Jan 4, 2022
- Applied Materials, Inc.
- Ralph Peter Antonio
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus to eliminate wafer bow for CVD and patterning...
- Patent number 11,094,647
- Issue date Aug 17, 2021
- Applied Materials, Inc.
- Shuran Sheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for plasma enhanced chemical vapor deposition and bevel edg...
- Patent number 8,197,636
- Issue date Jun 12, 2012
- Applied Materials, Inc.
- Ashish Shah
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LID STACK FOR HIGH FREQUENCY PROCESSING
- Publication number 20230049431
- Publication date Feb 16, 2023
- Applied Materials, Inc.
- Shuran SHENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
HIGH-TEMPERATURE CHAMBER AND CHAMBER COMPONENT CLEANING AND MAINTEN...
- Publication number 20220344135
- Publication date Oct 27, 2022
- Applied Materials, Inc.
- Shuran SHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADVANCED TEMPERATURE MONITORING SYSTEM WITH EXPANDABLE MODULAR LAYO...
- Publication number 20220113198
- Publication date Apr 14, 2022
- Applied Materials, Inc.
- Shuran SHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LID STACK FOR HIGH FREQUENCY PROCESSING
- Publication number 20210317578
- Publication date Oct 14, 2021
- Applied Materials, Inc.
- Shuran SHENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
IN-SITU LIGHT DETECTION METHODS AND APPARATUS FOR ULTRAVIOLET SEMIC...
- Publication number 20210223707
- Publication date Jul 22, 2021
- Applied Materials, Inc.
- RALPH PETER ANTONIO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SUBSTRATE SUPPORT COVER FOR HIGH-TEMPERATURE CORROSIVE ENVIRONMENT
- Publication number 20200370174
- Publication date Nov 26, 2020
- Applied Materials, Inc.
- Shuran SHENG
- C01 - INORGANIC CHEMISTRY
Information Patent Application
METHODS AND APPARATUS TO ELIMINATE WAFER BOW FOR CVD AND PATTERNING...
- Publication number 20200098702
- Publication date Mar 26, 2020
- Applied Materials, Inc.
- Shuran SHENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ADVANCED TEMPERATURE MONITORING SYSTEM AND METHODS FOR SEMICONDUCTO...
- Publication number 20190221458
- Publication date Jul 18, 2019
- Applied Materials, Inc.
- Xuesong LU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEMS FOR PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION AND BEVEL EDG...
- Publication number 20120211164
- Publication date Aug 23, 2012
- Applied Materials, Inc.
- Ashish Shah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PROCESSING A SUBSTRATE EDGE REGION
- Publication number 20090017635
- Publication date Jan 15, 2009
- APPLIED MATERIALS, INC.
- Ashish Shah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION AND BEVEL EDG...
- Publication number 20090014127
- Publication date Jan 15, 2009
- APPLIED MATERIALS, INC.
- Ashish Shah
- H01 - BASIC ELECTRIC ELEMENTS

Joseph C. Werner

Person

Patents Grantslast 30 patents

Advanced temperature monitoring system and methods for semiconducto...

Advanced temperature monitoring system with expandable modular layo...

Substrate support cover for high-temperature corrosive environment

Lid stack for high frequency processing

High-temperature chamber and chamber component cleaning and mainten...

Lid stack for high frequency processing

In-situ light detection methods and apparatus for ultraviolet semic...

Methods and apparatus to eliminate wafer bow for CVD and patterning...

Systems for plasma enhanced chemical vapor deposition and bevel edg...

Patents Applicationslast 30 patents

LID STACK FOR HIGH FREQUENCY PROCESSING

HIGH-TEMPERATURE CHAMBER AND CHAMBER COMPONENT CLEANING AND MAINTEN...

ADVANCED TEMPERATURE MONITORING SYSTEM WITH EXPANDABLE MODULAR LAYO...

LID STACK FOR HIGH FREQUENCY PROCESSING

IN-SITU LIGHT DETECTION METHODS AND APPARATUS FOR ULTRAVIOLET SEMIC...

SUBSTRATE SUPPORT COVER FOR HIGH-TEMPERATURE CORROSIVE ENVIRONMENT

METHODS AND APPARATUS TO ELIMINATE WAFER BOW FOR CVD AND PATTERNING...

ADVANCED TEMPERATURE MONITORING SYSTEM AND METHODS FOR SEMICONDUCTO...

SYSTEMS FOR PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION AND BEVEL EDG...

APPARATUS AND METHOD FOR PROCESSING A SUBSTRATE EDGE REGION

SYSTEMS FOR PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION AND BEVEL EDG...