Joseph James Oler Jr.

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Jericho, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Determining intra-die variation of an integrated circuit
- Patent number 9,255,962
- Issue date Feb 9, 2016
- GLOBALFOUNDRIES, INC.
- Jeanne P. S. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor timing improvement
- Patent number 8,966,431
- Issue date Feb 24, 2015
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for verifying design rule checking software
- Patent number 6,063,132
- Issue date May 16, 2000
- International Business Machines Corporation
- William Frantz DeCamp
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING INTRA-DIE VARIATION OF AN INTEGRATED CIRCUIT
- Publication number 20150048860
- Publication date Feb 19, 2015
- International Business Machines Corporation
- Jeanne P.S. Bickford
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TIMING IMPROVEMENT
- Publication number 20140143748
- Publication date May 22, 2014
- International Business Machines Corporation
- Jeanne P. BICKFORD
- G06 - COMPUTING CALCULATING COUNTING