Joseph K. Maier

Person

Milwaukee, WI, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for prospective correction of high order eddy-cur...
- Patent number 8,942,945
- Issue date Jan 27, 2015
- General Electric Company
- Dan Xu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for interactively setting parameters of an MR...
- Patent number 8,115,485
- Issue date Feb 14, 2012
- General Electric Company
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for vibration-related artifact reduction
- Patent number 7,550,972
- Issue date Jun 23, 2009
- General Electric Company
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of manual pre-scan spatial and spectral data a...
- Patent number 7,298,146
- Issue date Nov 20, 2007
- General Electric Compnay
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for vibration-related artifact reduction
- Patent number 7,239,140
- Issue date Jul 3, 2007
- General Electric Company
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for vibration-related artifact reduction
- Patent number 7,138,800
- Issue date Nov 21, 2006
- General Electric Company
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
System and method for unwrapping phase difference images
- Patent number 6,703,835
- Issue date Mar 9, 2004
- GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY CO. LLC
- Sarah K. Patch
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to reduce the effects of maxwell terms and oth...
- Patent number 6,528,998
- Issue date Mar 4, 2003
- GE Medical Systems Global Technology Co., LLC
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to reduce perturbation field effects in MR ima...
- Patent number 6,469,505
- Issue date Oct 22, 2002
- GE Medical Systems Global Technology Co., LLC
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for producing diffusion weighted MR images
- Patent number 6,323,646
- Issue date Nov 27, 2001
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying errors in magnetic resonance i...
- Patent number 6,239,599
- Issue date May 29, 2001
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method for quantifying ghost artifacts in MR images
- Patent number 6,100,689
- Issue date Aug 8, 2000
- General Electric Company
- Steven J. Huff
- G01 - MEASURING TESTING
Information Patent Grant
Correction of artifacts caused by maxwell terms in slice offset ech...
- Patent number 6,064,205
- Issue date May 16, 2000
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Correction of artifacts caused by Maxwell terms in slice offset ech...
- Patent number 5,923,168
- Issue date Jul 13, 1999
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Correction of axial image signal fall off caused by Maxwell terms
- Patent number 5,917,323
- Issue date Jun 29, 1999
- General Electric Company
- Yping Du
- G01 - MEASURING TESTING
Information Patent Grant
Correction of artifacts caused by Maxwell terms in MR echo-planar i...
- Patent number 5,869,965
- Issue date Feb 9, 1999
- General Electric Company
- Yiping Du
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method to reduce eddy current effects in diffusion-weighted echo pl...
- Patent number 5,864,233
- Issue date Jan 26, 1999
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing an off-center image using an EPI pulse sequence
- Patent number 5,689,186
- Issue date Nov 18, 1997
- General Electric Company
- Joseph Kenneth Maier
- G01 - MEASURING TESTING
Information Patent Grant
Reduction of Nyquist ghost artifacts in oblique echo planar imaging
- Patent number 5,672,969
- Issue date Sep 30, 1997
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
MRI center point artifact elimination using realtime receiver phase...
- Patent number 5,541,513
- Issue date Jul 30, 1996
- General Electric Company
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
MRI system with dynamic receiver gain
- Patent number 5,451,876
- Issue date Sep 19, 1995
- General Electric Company
- Lorraine V. Sandford
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Correction of NMR data acquired by an echo-planar technique
- Patent number 5,151,656
- Issue date Sep 29, 1992
- General Electric Company
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
RF power calibration for an NMR scanner
- Patent number 5,107,215
- Issue date Apr 21, 1992
- General Electric
- Daniel J. Schaefer
- G01 - MEASURING TESTING
Information Patent Grant
Method for mapping the RF transmit and receive field in an NMR system
- Patent number 5,001,428
- Issue date Mar 19, 1991
- General Electric Company
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
Automatic RF frequency adjustment for magnetic resonance scanner
- Patent number 4,806,866
- Issue date Feb 21, 1989
- General Electric Company
- Joseph K. Maier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR RETROSPECTIVE CORRECTION OF HIGH ORDER EDDY-C...
- Publication number 20120271583
- Publication date Oct 25, 2012
- Dan Xu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROSPECTIVE CORRECTION OF HIGH ORDER EDDY-CUR...
- Publication number 20120271584
- Publication date Oct 25, 2012
- Dan Xu
- G01 - MEASURING TESTING
Information Patent Application
System and method for processing digital images
- Publication number 20030193335
- Publication date Oct 16, 2003
- Sarah K. Patch
- G01 - MEASURING TESTING

Joseph K. Maier

Person

Patents Grantslast 30 patents

System and method for prospective correction of high order eddy-cur...

Method and apparatus for interactively setting parameters of an MR...

Method and apparatus for vibration-related artifact reduction

Method and apparatus of manual pre-scan spatial and spectral data a...

Method and apparatus for vibration-related artifact reduction

Method and apparatus for vibration-related artifact reduction

System and method for unwrapping phase difference images

Method and apparatus to reduce the effects of maxwell terms and oth...

Method and apparatus to reduce perturbation field effects in MR ima...

Method and apparatus for producing diffusion weighted MR images

Method and apparatus for identifying errors in magnetic resonance i...

Method for quantifying ghost artifacts in MR images

Correction of artifacts caused by maxwell terms in slice offset ech...

Correction of artifacts caused by Maxwell terms in slice offset ech...

Correction of axial image signal fall off caused by Maxwell terms

Correction of artifacts caused by Maxwell terms in MR echo-planar i...

Method to reduce eddy current effects in diffusion-weighted echo pl...

Method for producing an off-center image using an EPI pulse sequence

Reduction of Nyquist ghost artifacts in oblique echo planar imaging

MRI center point artifact elimination using realtime receiver phase...

MRI system with dynamic receiver gain

Correction of NMR data acquired by an echo-planar technique

RF power calibration for an NMR scanner

Method for mapping the RF transmit and receive field in an NMR system

Automatic RF frequency adjustment for magnetic resonance scanner

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR RETROSPECTIVE CORRECTION OF HIGH ORDER EDDY-C...

SYSTEM AND METHOD FOR PROSPECTIVE CORRECTION OF HIGH ORDER EDDY-CUR...

System and method for processing digital images