Joseph M Amato

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Briarcliff Manor, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Proportional variable resistor structures to electrically measure m...
- Patent number 7,868,629
- Issue date Jan 11, 2011
- NXP B.V.
- Joseph M Amato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Resistor structures to electrically measure unidirectional misalign...
- Patent number 7,825,651
- Issue date Nov 2, 2010
- NXP B.V.
- Joseph M Amato
- G01 - MEASURING TESTING
Information Patent Grant
Offset dependent resistor for measuring misalignment of stitched masks
- Patent number 7,538,443
- Issue date May 26, 2009
- NXP B.V.
- Joseph M. Amato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistor structures to electrically measure unidirectional misalign...
- Patent number 7,427,857
- Issue date Sep 23, 2008
- NXP B.V.
- Joseph M Amato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RESISTOR STRUCTURES TO ELECTRICALLY MEASURE UNIDIRECTIONAL MISALIGN...
- Publication number 20090212963
- Publication date Aug 27, 2009
- NXP B.V.
- JOSEPH M. AMATO
- G01 - MEASURING TESTING
Information Patent Application
Proportional Variable Resistor Structures to Electrically Measure M...
- Publication number 20080197862
- Publication date Aug 21, 2008
- Koninklijke Philips Electronics N.V.
- Joseph M. Amato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Offset dependent resistor for measuring misalignment of stitched masks
- Publication number 20070030335
- Publication date Feb 8, 2007
- Koninklijke Philips Electronics N.V.
- Joseph M. Amato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resistor structures to electrically measure unidirectional misalign...
- Publication number 20060060843
- Publication date Mar 23, 2006
- Koninklijke Philips Electronics N.V.
- Joseph M Amato
- G01 - MEASURING TESTING