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Joseph P Dzengeleski
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Newton, NH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Negative ribbon ion beams from pulsed plasmas
Patent number
10,290,470
Issue date
May 14, 2019
Varian Semiconductor Equipment Associates, Inc.
Daniel Distaso
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Negative ribbon ion beams from pulsed plasmas
Patent number
9,734,991
Issue date
Aug 15, 2017
Varian Semiconductor Equipment Associates, Inc.
Daniel Distaso
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Processing apparatus and method of treating a substrate
Patent number
9,287,085
Issue date
Mar 15, 2016
Varian Semiconductor Equipment Associates, Inc.
Ernest E. Allen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Ion beam measurement system and method
Patent number
8,698,108
Issue date
Apr 15, 2014
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Techniques for ion beam current measurement using a scanning beam c...
Patent number
7,652,270
Issue date
Jan 26, 2010
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated faraday sensor test system
Patent number
7,564,048
Issue date
Jul 21, 2009
Varian Semiconductor E1quipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic monitoring of a Faraday cup for an ion implanter
Patent number
7,521,691
Issue date
Apr 21, 2009
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
G01 - MEASURING TESTING
Information
Patent Grant
Scan pattern for an ion implanter
Patent number
7,498,590
Issue date
Mar 3, 2009
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion beam implant current, spot width and position tuning
Patent number
7,442,944
Issue date
Oct 28, 2008
Varian Semiconductor Equipment Associates, Inc.
Shengwu Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Faraday system integrity determination
Patent number
7,383,141
Issue date
Jun 3, 2008
Varian Semiconductor Equipment Associates, Inc.
Vinay Aggarwal
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Negative Ribbon Ion Beams from Pulsed Plasmas
Publication number
20170309454
Publication date
Oct 26, 2017
Varian Semiconductor Equipment Associates, Inc.
Daniel Distaso
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Negative Ribbon Ion Beams from Pulsed Plasmas
Publication number
20170032937
Publication date
Feb 2, 2017
Varian Semiconductor Equipment Associates, Inc.
Daniel Distaso
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROCESSING APPARATUS AND METHOD OF TREATING A SUBSTRATE
Publication number
20150325405
Publication date
Nov 12, 2015
Ernest E. Allen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
SYSTEM AND METHOD FOR CONTROLLING PLASMA DEPOSITION UNIFORMITY
Publication number
20120021136
Publication date
Jan 26, 2012
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PLASMA ION PROCESS UNIFORMITY MONITOR
Publication number
20100159120
Publication date
Jun 24, 2010
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR PLASMA DOSE MEASUREMENT
Publication number
20100155600
Publication date
Jun 24, 2010
Varian Semiconductor Equipment Associates, Inc.
Joseph P Dzengeleski
G01 - MEASURING TESTING
Information
Patent Application
TECHNIQUES FOR ION BEAM CURRENT MEASUREMENT USING A SCANNING BEAM C...
Publication number
20080302955
Publication date
Dec 11, 2008
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC MONITORING OF A FARADAY CUP FOR AN ION IMPLANTER
Publication number
20080135776
Publication date
Jun 12, 2008
Joseph P. Dzengeleski
G01 - MEASURING TESTING
Information
Patent Application
Automated faraday sensor test system
Publication number
20080073551
Publication date
Mar 27, 2008
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scan pattern for an ion implanter
Publication number
20080073575
Publication date
Mar 27, 2008
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Faraday system integrity determination
Publication number
20070100567
Publication date
May 3, 2007
Vinay Aggarwal
G01 - MEASURING TESTING
Information
Patent Application
Ion beam implant current, spot width and position tuning
Publication number
20060076510
Publication date
Apr 13, 2006
Shengwu Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for in-situ calibration of a dose controller for...
Publication number
20050133728
Publication date
Jun 23, 2005
Varian Semiconductor Equipment Associates, Inc.
Tamer B. Onat
H01 - BASIC ELECTRIC ELEMENTS