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Joseph Seeger
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Menlo Park, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Drive and sense balanced, fully-coupled 3-axis gyroscope
Patent number
11,841,228
Issue date
Dec 12, 2023
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Applying a positive feedback voltage to an electromechanical sensor...
Patent number
11,835,538
Issue date
Dec 5, 2023
Invensense, Inc.
Joseph Seeger
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Drive and sense balanced, semi-coupled 3-axis gyroscope
Patent number
11,815,354
Issue date
Nov 14, 2023
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Demodulation phase calibration using external input
Patent number
11,650,078
Issue date
May 16, 2023
Invensense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method and system for sensor configuration
Patent number
11,566,899
Issue date
Jan 31, 2023
Karthik Katingari
G01 - MEASURING TESTING
Information
Patent Grant
Applying a positive feedback voltage to an electromechanical sensor...
Patent number
11,428,702
Issue date
Aug 30, 2022
Invensense, Inc.
Joseph Seeger
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Demodulation phase calibration using external input
Patent number
11,365,983
Issue date
Jun 21, 2022
Invensense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor with integrated heater
Patent number
11,225,409
Issue date
Jan 18, 2022
Invensense, Inc.
Pei-Wen Yen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Drive and sense balanced, fully-coupled 3-axis gyroscope
Patent number
11,118,907
Issue date
Sep 14, 2021
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Applying a positive feedback voltage to an electromechanical sensor...
Patent number
11,085,770
Issue date
Aug 10, 2021
Invensense, Inc.
Joseph Seeger
G01 - MEASURING TESTING
Information
Patent Grant
Configuration to reduce non-linear motion
Patent number
11,047,685
Issue date
Jun 29, 2021
Invensense, Inc.
Ozan Anac
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Device comprising a micro-electro-mechanical system substrate with...
Patent number
11,040,871
Issue date
Jun 22, 2021
Invensense, Inc.
Jongwoo Shin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Deformable membrane and a compensating structure thereof
Patent number
11,027,967
Issue date
Jun 8, 2021
Invensense, Inc.
Chung-Hsien Lin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Drive and sense balanced, semi-coupled 3-axis gyroscope
Patent number
10,914,584
Issue date
Feb 9, 2021
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
On-chip gap measurement
Patent number
10,794,702
Issue date
Oct 6, 2020
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for a threshold sensor
Patent number
10,793,424
Issue date
Oct 6, 2020
Invensense, Inc.
Matthew Julian Thompson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS sensor compensation for off-axis movement
Patent number
10,766,764
Issue date
Sep 8, 2020
Invensense, Inc.
Ilya Gurin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Demodulation phase calibration
Patent number
10,746,565
Issue date
Aug 18, 2020
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Selectively controlling application of a self-assembled monolayer c...
Patent number
10,692,761
Issue date
Jun 23, 2020
Invensense, Inc.
Bongsang Kim
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Self-calibrating microelectromechanical system devices
Patent number
10,649,002
Issue date
May 12, 2020
Invensense, Inc.
Matthew Julian Thompson
G01 - MEASURING TESTING
Information
Patent Grant
MEMS device with improved spring system
Patent number
10,551,193
Issue date
Feb 4, 2020
Invensense, Inc.
Joseph Seeger
G01 - MEASURING TESTING
Information
Patent Grant
Configuration to reduce non-linear motion
Patent number
10,527,421
Issue date
Jan 7, 2020
Invensense, Inc.
Ozan Anac
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Elastic bump stops for MEMS devices
Patent number
10,527,420
Issue date
Jan 7, 2020
Invensense, Inc.
Jin Qiu
G01 - MEASURING TESTING
Information
Patent Grant
Proof mass and polysilicon electrode integrated thereon
Patent number
10,505,006
Issue date
Dec 10, 2019
Invensense, Inc.
Bongsang Kim
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS gyroscope amplitude control via quadrature
Patent number
10,451,418
Issue date
Oct 22, 2019
Invensense, Inc.
Joseph Seeger
G01 - MEASURING TESTING
Information
Patent Grant
MEMS sensor with high voltage switch
Patent number
10,427,930
Issue date
Oct 1, 2019
Invensense, Inc.
Matthew Thompson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS sensor compensation for off-axis movement
Patent number
10,421,659
Issue date
Sep 24, 2019
Invensense, Inc.
Ilya Gurin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Gyroscope self test by applying rotation on Coriolis sense mass
Patent number
10,415,994
Issue date
Sep 17, 2019
Invensense, Inc.
Ozan Anac
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for a threshold sensor
Patent number
10,399,849
Issue date
Sep 3, 2019
Invensense, Inc.
Matthew Julian Thompson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS device to selectively measure excitation in different directions
Patent number
10,393,768
Issue date
Aug 27, 2019
Invensense, Inc.
Matthew Julian Thompson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
SENSING CIRCUIT OF A MICRO-ELECTROMECHANICAL SENSOR
Publication number
20240345125
Publication date
Oct 17, 2024
InvenSense, Inc.
Joseph Seeger
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ELECTRODES FOR MICROELECTROMECHANICAL SYSTEM MICROPHONES
Publication number
20240171917
Publication date
May 23, 2024
InvenSense, Inc.
Joseph Seeger
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
FIXED-FIXED MEMBRANE FOR MICROELECTROMECHANICAL SYSTEM MICROPHONE
Publication number
20240089668
Publication date
Mar 14, 2024
InvenSense, Inc.
Joseph Seeger
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
APPLYING A POSITIVE FEEDBACK VOLTAGE TO AN ELECTROMECHANICAL SENSOR...
Publication number
20240061006
Publication date
Feb 22, 2024
InvenSense, Inc.
Joseph Seeger
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20230324176
Publication date
Oct 12, 2023
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
CONSTANT CHARGE OR CAPACITANCE FOR CAPACITIVE MICRO-ELECTRICAL-MECH...
Publication number
20230192479
Publication date
Jun 22, 2023
InvenSense, Inc.
Joseph Seeger
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
APPLYING A POSITIVE FEEDBACK VOLTAGE TO AN ELECTROMECHANICAL SENSOR...
Publication number
20220413003
Publication date
Dec 29, 2022
InvenSense, Inc.
Joseph Seeger
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT
Publication number
20220326045
Publication date
Oct 13, 2022
InvenSense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR WITH INTEGRATED HEATER
Publication number
20220098030
Publication date
Mar 31, 2022
InvenSense, Inc.
Pei-Wen Yen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVE AND SENSE BALANCED, FULLY-COUPLED 3-AXIS GYROSCOPE
Publication number
20210396519
Publication date
Dec 23, 2021
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20210116244
Publication date
Apr 22, 2021
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR SENSOR CONFIGURATION
Publication number
20200348134
Publication date
Nov 5, 2020
InvenSense, Inc.
Karthik Katingari
G01 - MEASURING TESTING
Information
Patent Application
CONFIGURATION TO REDUCE NON-LINEAR MOTION
Publication number
20200225038
Publication date
Jul 16, 2020
InvenSense, Inc.
Ozan ANAC
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVE AND SENSE BALANCED, FULLY-COUPLED 3-AXIS GYROSCOPE
Publication number
20200096337
Publication date
Mar 26, 2020
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
SENSOR WITH INTEGRATED HEATER
Publication number
20200087142
Publication date
Mar 19, 2020
InvenSense, Inc.
Pei-Wen Yen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
APPLYING A POSITIVE FEEDBACK VOLTAGE TO AN ELECTROMECHANICAL SENSOR...
Publication number
20200056887
Publication date
Feb 20, 2020
InvenSense, Inc.
Joseph Seeger
G01 - MEASURING TESTING
Information
Patent Application
APPLYING A POSITIVE FEEDBACK VOLTAGE TO AN ELECTROMECHANICAL SENSOR...
Publication number
20200057087
Publication date
Feb 20, 2020
InvenSense, Inc.
Joseph Seeger
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR A THRESHOLD SENSOR
Publication number
20190382259
Publication date
Dec 19, 2019
InvenSense, Inc.
MATTHEW JULIAN THOMPSON
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS SENSOR COMPENSATION FOR OFF-AXIS MOVEMENT
Publication number
20190359479
Publication date
Nov 28, 2019
InvenSense, Inc.
Ilya Gurin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DEFORMABLE MEMBRANE AND A COMPENSATING STRUCTURE THEREOF
Publication number
20190345024
Publication date
Nov 14, 2019
InvenSense, Inc.
Chung-Hsien LIN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SELECTIVELY CONTROLLING APPLICATION OF A SELF-ASSEMBLED MONOLAYER C...
Publication number
20190341305
Publication date
Nov 7, 2019
InvenSense, Inc.
Bongsang KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEMODULATION PHASE CALIBRATION
Publication number
20190226871
Publication date
Jul 25, 2019
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
DEVICE COMPRISING A MICRO-ELECTRO-MECHANICAL SYSTEM SUBSTRATE WITH...
Publication number
20190185317
Publication date
Jun 20, 2019
InvenSense, Inc.
Jongwoo Shin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ON-CHIP GAP MEASUREMENT
Publication number
20190178645
Publication date
Jun 13, 2019
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
STRESS ISOLATION FRAME FOR A SENSOR
Publication number
20190169018
Publication date
Jun 6, 2019
InvenSense, Inc.
Doruk SENKAL
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS SENSOR COMPENSATION FOR OFF-AXIS MOVEMENT
Publication number
20190144264
Publication date
May 16, 2019
InvenSense, Inc.
Ilya Gurin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT
Publication number
20190120657
Publication date
Apr 25, 2019
InvenSense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SELF-CALIBRATING MICROELECTROMECHANICAL SYSTEM DEVICES
Publication number
20190033342
Publication date
Jan 31, 2019
InvenSense, Inc.
Matthew Julian Thompson
G01 - MEASURING TESTING
Information
Patent Application
PROOF MASS AND POLYSILICON ELECTRODE INTEGRATED THEREON
Publication number
20190035905
Publication date
Jan 31, 2019
InvenSense, Inc.
Bongsang KIM
G01 - MEASURING TESTING
Information
Patent Application
ELECTROSTATIC OFFSET CORRECTION
Publication number
20190025056
Publication date
Jan 24, 2019
InvenSense, Inc.
Kevin Hughes
B81 - MICRO-STRUCTURAL TECHNOLOGY