Jovan Jovanovic

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electronics tester
- Patent number 12,169,217
- Issue date Dec 17, 2024
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 12,007,451
- Issue date Jun 11, 2024
- AEHR Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,977,098
- Issue date May 7, 2024
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronics tester
- Patent number 11,835,575
- Issue date Dec 5, 2023
- AEHR Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 11,821,940
- Issue date Nov 21, 2023
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronics tester
- Patent number 11,635,459
- Issue date Apr 25, 2023
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pressure relief valve
- Patent number 11,592,465
- Issue date Feb 28, 2023
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,448,695
- Issue date Sep 20, 2022
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,255,903
- Issue date Feb 22, 2022
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 11,209,497
- Issue date Dec 28, 2021
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronics tester
- Patent number 11,199,572
- Issue date Dec 14, 2021
- AEHR Test Systems
- Jovan Jovanovic
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pressure relief valve
- Patent number 11,112,429
- Issue date Sep 7, 2021
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 10,852,347
- Issue date Dec 1, 2020
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 10,677,843
- Issue date Jun 9, 2020
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 10,649,022
- Issue date May 12, 2020
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout of contacts
- Patent number D875579
- Issue date Feb 18, 2020
- AEHR Test Systems
- Jovan Jovanovic
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 10,466,292
- Issue date Nov 5, 2019
- AEHR Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Grant
Limiting translation for consistent substrate-to-substrate contact
- Patent number 10,401,385
- Issue date Sep 3, 2019
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Layout of contacts
- Patent number D850309
- Issue date Jun 4, 2019
- AEHR Test Systems
- Jovan Jovanovic
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 10,094,872
- Issue date Oct 9, 2018
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 9,880,197
- Issue date Jan 30, 2018
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 9,625,521
- Issue date Apr 18, 2017
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 9,316,683
- Issue date Apr 19, 2016
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 9,250,291
- Issue date Feb 2, 2016
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 9,151,797
- Issue date Oct 6, 2015
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
Integrated feedthrough module
- Patent number 8,986,048
- Issue date Mar 24, 2015
- AEHR Test Systems
- David S. Hendrickson
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 8,947,116
- Issue date Feb 3, 2015
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 8,747,123
- Issue date Jun 10, 2014
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...
- Publication number 20240410938
- Publication date Dec 12, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240402243
- Publication date Dec 5, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393387
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393388
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20240302451
- Publication date Sep 12, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20240230714
- Publication date Jul 11, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20240219455
- Publication date Jul 4, 2024
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20240044971
- Publication date Feb 8, 2024
- Aehr Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20240036103
- Publication date Feb 1, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONICS TESTER
- Publication number 20230204651
- Publication date Jun 29, 2023
- AEHR TEST SYSTEMS
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...
- Publication number 20230168277
- Publication date Jun 1, 2023
- AEHR TEST SYSTEMS
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20220373595
- Publication date Nov 24, 2022
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20220137121
- Publication date May 5, 2022
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20220107358
- Publication date Apr 7, 2022
- Aehr Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20220082636
- Publication date Mar 17, 2022
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONICS TESTER
- Publication number 20220065921
- Publication date Mar 3, 2022
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRESSURE RELIEF VALVE
- Publication number 20210364549
- Publication date Nov 25, 2021
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20210025935
- Publication date Jan 28, 2021
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20200256917
- Publication date Aug 13, 2020
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20200233026
- Publication date Jul 23, 2020
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20200027799
- Publication date Jan 23, 2020
- Aehr Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE RELIEF VALVE
- Publication number 20190339303
- Publication date Nov 7, 2019
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20180372792
- Publication date Dec 27, 2018
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20180252762
- Publication date Sep 6, 2018
- Aehr Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Application
LIMITING TRANSLATION FOR CONSISTENT SUBSTRATE-TO-SUBSTRATE CONTACT
- Publication number 20180113150
- Publication date Apr 26, 2018
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20170200660
- Publication date Jul 13, 2017
- Aehr Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20170176492
- Publication date Jun 22, 2017
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20160187416
- Publication date Jun 30, 2016
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20160103179
- Publication date Apr 14, 2016
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING

Jovan Jovanovic

Person

Patents Grantslast 30 patents

Electronics tester

Apparatus for testing electronic devices

Method and system for thermal control of devices in an electronics...

System for testing an integrated circuit of a device and its method...

Apparatus for testing electronic devices

Electronics tester

Electronics tester

Electronics tester

Pressure relief valve

System for testing an integrated circuit of a device and its method...

Apparatus for testing electronic devices

Method and system for thermal control of devices in an electronics...

Electronics tester

Pressure relief valve

Apparatus for testing electronic devices

System for testing an integrated circuit of a device and its method...

Electronics tester

Layout of contacts

Method and system for thermal control of devices in an electronics...

Limiting translation for consistent substrate-to-substrate contact

Layout of contacts

Apparatus for testing electronic devices

Controlling alignment during a thermal cycle

Controlling alignment during a thermal cycle

Apparatus for testing electronic devices

System for testing an integrated circuit of a device and its method...

Apparatus for testing electronic devices

Integrated feedthrough module

System for testing an integrated circuit of a device and its method...

Apparatus for testing electronic devices

Patents Applicationslast 30 patents

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

ELECTRONICS TESTER

APPARATUS FOR TESTING ELECTRONIC DEVICES

ELECTRONICS TESTER

ELECTRONICS TESTER

ELECTRONICS TESTER

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

APPARATUS FOR TESTING ELECTRONIC DEVICES

ELECTRONICS TESTER

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

ELECTRONICS TESTER

PRESSURE RELIEF VALVE

APPARATUS FOR TESTING ELECTRONIC DEVICES

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

ELECTRONICS TESTER

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

PRESSURE RELIEF VALVE

APPARATUS FOR TESTING ELECTRONIC DEVICES

ELECTRONICS TESTER

LIMITING TRANSLATION FOR CONSISTENT SUBSTRATE-TO-SUBSTRATE CONTACT

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

APPARATUS FOR TESTING ELECTRONIC DEVICES

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...