Juergen Heidmann

Person

Salinas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated optical nanoscale probe
- Patent number 9,978,407
- Issue date May 22, 2018
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated optical nanoscale probe
- Patent number 9,779,769
- Issue date Oct 3, 2017
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated optical nanoscale probe measurement of electric fields f...
- Patent number 9,778,329
- Issue date Oct 3, 2017
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Photon emitter characterization using photoluminescence quenching i...
- Patent number 9,482,612
- Issue date Nov 1, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic write head characterization with nano-meter resolution usi...
- Patent number 9,472,217
- Issue date Oct 18, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Metrology for contactless measurement of electrical resistance chan...
- Patent number 9,194,908
- Issue date Nov 24, 2015
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic write head characterization with nano-meter resolution usi...
- Patent number 8,885,301
- Issue date Nov 11, 2014
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Magneto-optical detection of a field produced by a sub-resolution m...
- Patent number 8,659,291
- Issue date Feb 25, 2014
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Sub-optical-resolution kerr signal detection for perpendicular writ...
- Patent number 8,427,929
- Issue date Apr 23, 2013
- Infinitum Solutions, Inc.
- Henry Patland
- G11 - INFORMATION STORAGE
Information Patent Grant
Magneto-optic write-head characterization using the recording mediu...
- Patent number 8,289,818
- Issue date Oct 16, 2012
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED OPTICAL NANOSCALE PROBE
- Publication number 20170316795
- Publication date Nov 2, 2017
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED OPTICAL NANOSCALE PROBE MEASUREMENT OF ELECTRIC FIELDS F...
- Publication number 20160282427
- Publication date Sep 29, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
PHOTON EMITTER CHARACTERIZATION USING PHOTOLUMINESCENCE QUENCHING I...
- Publication number 20160139048
- Publication date May 19, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED OPTICAL NANOSCALE PROBE
- Publication number 20160077167
- Publication date Mar 17, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC WRITE HEAD CHARACTERIZATION WITH NANO-METER RESOLUTION USI...
- Publication number 20160071532
- Publication date Mar 10, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC WRITE HEAD CHARACTERIZATION WITH NANO-METER RESOLUTION USI...
- Publication number 20150235661
- Publication date Aug 20, 2015
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
MAGNETO-OPTICAL DETECTION OF A FIELD PRODUCED BY A SUB-RESOLUTION M...
- Publication number 20140133284
- Publication date May 15, 2014
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G02 - OPTICS
Information Patent Application
METROLOGY FOR CONTACTLESS MEASUREMENT OF ELECTRICAL RESISTANCE CHAN...
- Publication number 20130257461
- Publication date Oct 3, 2013
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
MAGNETO-OPTIC WRITE-HEAD CHARACTERIZATION USING THE RECORDING MEDIU...
- Publication number 20120092972
- Publication date Apr 19, 2012
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G02 - OPTICS
Information Patent Application
SUB-OPTICAL-RESOLUTION KERR SIGNAL DETECTION FOR PERPENDICULAR WRIT...
- Publication number 20120057446
- Publication date Mar 8, 2012
- Infinitum Solutions, Inc.
- Henry Patland
- G01 - MEASURING TESTING
Information Patent Application
Magneto-Optical Detection of a Field Produced by a Sub-Resolution M...
- Publication number 20100170017
- Publication date Jul 1, 2010
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G02 - OPTICS
Information Patent Application
Determining A Magnetic Sample Characteristic Using A Magnetic Field...
- Publication number 20100079908
- Publication date Apr 1, 2010
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING

Juergen Heidmann

Person

Patents Grantslast 30 patents

Integrated optical nanoscale probe

Integrated optical nanoscale probe

Integrated optical nanoscale probe measurement of electric fields f...

Photon emitter characterization using photoluminescence quenching i...

Magnetic write head characterization with nano-meter resolution usi...

Metrology for contactless measurement of electrical resistance chan...

Magnetic write head characterization with nano-meter resolution usi...

Magneto-optical detection of a field produced by a sub-resolution m...

Sub-optical-resolution kerr signal detection for perpendicular writ...

Magneto-optic write-head characterization using the recording mediu...

Patents Applicationslast 30 patents

INTEGRATED OPTICAL NANOSCALE PROBE

INTEGRATED OPTICAL NANOSCALE PROBE MEASUREMENT OF ELECTRIC FIELDS F...

PHOTON EMITTER CHARACTERIZATION USING PHOTOLUMINESCENCE QUENCHING I...

INTEGRATED OPTICAL NANOSCALE PROBE

MAGNETIC WRITE HEAD CHARACTERIZATION WITH NANO-METER RESOLUTION USI...

MAGNETIC WRITE HEAD CHARACTERIZATION WITH NANO-METER RESOLUTION USI...

MAGNETO-OPTICAL DETECTION OF A FIELD PRODUCED BY A SUB-RESOLUTION M...

METROLOGY FOR CONTACTLESS MEASUREMENT OF ELECTRICAL RESISTANCE CHAN...

MAGNETO-OPTIC WRITE-HEAD CHARACTERIZATION USING THE RECORDING MEDIU...

SUB-OPTICAL-RESOLUTION KERR SIGNAL DETECTION FOR PERPENDICULAR WRIT...

Magneto-Optical Detection of a Field Produced by a Sub-Resolution M...

Determining A Magnetic Sample Characteristic Using A Magnetic Field...