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Juhong Zhu
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Austin, TX, US
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last 30 patents
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Patent Grant
Method for generating transition delay fault test patterns
Patent number
6,651,227
Issue date
Nov 18, 2003
Motorola, Inc.
Magdy S. Abadir
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method for generating transition delay fault test patterns
Publication number
20030079189
Publication date
Apr 24, 2003
Magdy S. Abadir
G01 - MEASURING TESTING