Jun Fukuda

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 8,395,260
- Issue date Mar 12, 2013
- Fujitsu Semiconductor Limited
- Hirohisa Matsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 8,084,277
- Issue date Dec 27, 2011
- Fujitsu Semiconductor Limited
- Hirohisa Matsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,550,844
- Issue date Jun 23, 2009
- Fujitsu Microelectronics Limited
- Hirohisa Matsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device test board and a method of testing a semicondu...
- Patent number 6,281,693
- Issue date Aug 28, 2001
- Fujitsu Limited
- Jun Fukuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20120061847
- Publication date Mar 15, 2012
- FUJITSU SEMICONDUCTOR LIMITED
- Hirohisa Matsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20090230560
- Publication date Sep 17, 2009
- Fujitsu Microelectronics Limited
- Hirohisa Matsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20070228561
- Publication date Oct 4, 2007
- FUJITSU LIMITED
- Hirohisa Matsuki
- H01 - BASIC ELECTRIC ELEMENTS