Jun Mochizuki

Person

Yamanashi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Intermediate connecting member and inspection apparatus
- Patent number 11,561,240
- Issue date Jan 24, 2023
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Pogo block within the intermediate connection member of an inspecti...
- Patent number 11,563,297
- Issue date Jan 24, 2023
- Tokyo Electron Limited
- Jun Mochizuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical connecting device, inspection apparatus, and method for...
- Patent number 11,408,926
- Issue date Aug 9, 2022
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and temperature measuring method for inspection s...
- Patent number 11,378,610
- Issue date Jul 5, 2022
- Tokyo Electron Limited
- Jun Mochizuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Contact accuracy assurance method, contact accuracy assurance mecha...
- Patent number 11,346,861
- Issue date May 31, 2022
- Tokyo Electron Limited
- Yoshihito Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and method of controlling temperature of probe card
- Patent number 11,307,223
- Issue date Apr 19, 2022
- Tokyo Electron Limited
- Jun Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Intermediate connection member and inspection apparatus
- Patent number 11,035,883
- Issue date Jun 15, 2021
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Method of contacting substrate with probe card
- Patent number 9,863,977
- Issue date Jan 9, 2018
- Tokyo Electron Limited
- Kunihiro Furuya
- G01 - MEASURING TESTING
Information Patent Grant
Support body for contact terminals and probe card
- Patent number 9,140,726
- Issue date Sep 22, 2015
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Contact structure for inspection
- Patent number 8,866,506
- Issue date Oct 21, 2014
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of probe card and the probe card
- Patent number 8,362,792
- Issue date Jan 29, 2013
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Contact structure for inspection
- Patent number 8,310,257
- Issue date Nov 13, 2012
- Tokyo Electron Limited
- Shinichiro Takase
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number RE42637
- Issue date Aug 23, 2011
- Tokyo Electron Limited
- Jun Mochizuki
- 324 - Electricity: measuring and testing
Information Patent Grant
Multilayer substrate and probe card
- Patent number 7,750,655
- Issue date Jul 6, 2010
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and probe device for inspection of a semiconductor device
- Patent number 7,692,435
- Issue date Apr 6, 2010
- Tokyo Electron Limited
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,498,827
- Issue date Mar 3, 2009
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,474,110
- Issue date Jan 6, 2009
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having separated upper and lower probe needle groups
- Patent number 5,926,028
- Issue date Jul 20, 1999
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MOUNTING TABLE, TEST APPARATUS, AND TEMPERATURE CALIBRATION METHOD
- Publication number 20220316953
- Publication date Oct 6, 2022
- TOKYO ELECTRON LIMITED
- Yoshihito YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
INTERMEDIATE CONNECTING MEMBER AND INSPECTION APPARATUS
- Publication number 20210341515
- Publication date Nov 4, 2021
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
POGO BLOCK
- Publication number 20210305761
- Publication date Sep 30, 2021
- TOKYO ELECTRON LIMITED
- Jun MOCHIZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STAGE CLEANING METHOD, STAGE CLEANING MEMBER, METHOD FOR PRODUCING...
- Publication number 20210111041
- Publication date Apr 15, 2021
- TOKYO ELECTRON LIMITED
- Jun MOCHIZUKI
- B08 - CLEANING
Information Patent Application
ELECTRICAL CONNECTING DEVICE, INSPECTION APPARATUS, AND METHOD FOR...
- Publication number 20210063465
- Publication date Mar 4, 2021
- TOKYO ELECTRON LIMITED
- Jun MOCHIZUKI
- G01 - MEASURING TESTING
Information Patent Application
INTERMEDIATE CONNECTING MEMBER AND INSPECTION APPARATUS
- Publication number 20200379007
- Publication date Dec 3, 2020
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
CONTACT ACCURACY ASSURANCE METHOD, CONTACT ACCURACY ASSURANCE MECHA...
- Publication number 20200379012
- Publication date Dec 3, 2020
- TOKYO ELECTRON LIMITED
- Yoshihito YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND METHOD OF CONTROLLING TEMPERATURE OF PROBE CARD
- Publication number 20200341031
- Publication date Oct 29, 2020
- TOKYO ELECTRON LIMITED
- Jun FUJIHARA
- G01 - MEASURING TESTING
Information Patent Application
Temperature Measurement Member, Inspection Apparatus, and Temperatu...
- Publication number 20200209072
- Publication date Jul 2, 2020
- TOKYO ELECTRON LIMITED
- Yoshihito YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND TEMPERATURE MEASURING METHOD FOR INSPECTION S...
- Publication number 20200174060
- Publication date Jun 4, 2020
- Jun MOCHIZUKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERMEDIATE CONNECTION MEMBER AND INSPECTION APPARATUS
- Publication number 20200116756
- Publication date Apr 16, 2020
- TOKYO ELECTRON LIMITED
- Jun MOCHIZUKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONTACTING SUBSTRATE WITH PROBE CARD
- Publication number 20150219687
- Publication date Aug 6, 2015
- TOKYO ELECTRON LIMITED
- Kunihiro Furuya
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD FOR SEMICONDUCTOR DEVICE INSPECTION APPARATUS AND MAN...
- Publication number 20130206460
- Publication date Aug 15, 2013
- TOKYO ELECTRON LIMTED
- Jun Mochizuki
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SUPPORT BODY FOR CONTACT TERMINALS AND PROBE CARD
- Publication number 20130093446
- Publication date Apr 18, 2013
- TOKYO ELECTRON LIMITED
- Jun MOCHIZUKI
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method of probe card
- Publication number 20120132615
- Publication date May 31, 2012
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Probe Card
- Publication number 20110316576
- Publication date Dec 29, 2011
- Kenichi Kataoka
- G01 - MEASURING TESTING
Information Patent Application
CONTACT STRUCTURE FOR INSPECTION
- Publication number 20110121846
- Publication date May 26, 2011
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
CONTACT STRUCTURE FOR INSPECTION
- Publication number 20110043232
- Publication date Feb 24, 2011
- TOKYO ELECTRON LIMITED
- Shinichiro TAKASE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING PROBE SUPPORTING PLATE, COMPUTER STORAGE M...
- Publication number 20110006799
- Publication date Jan 13, 2011
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method of probe card and the probe card
- Publication number 20090146673
- Publication date Jun 11, 2009
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Multilayer Substrate and Probe Card
- Publication number 20080191720
- Publication date Aug 14, 2008
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20070290699
- Publication date Dec 20, 2007
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20070290698
- Publication date Dec 20, 2007
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Probe and probe card
- Publication number 20070257685
- Publication date Nov 8, 2007
- TOKYO ELECTRON LTD.
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Probe card and probe device
- Publication number 20070182431
- Publication date Aug 9, 2007
- TOKYO ELECTRON LIMITED
- Shigekazu Komatsu
- G01 - MEASURING TESTING

Jun Mochizuki

Person

Patents Grantslast 30 patents

Intermediate connecting member and inspection apparatus

Pogo block within the intermediate connection member of an inspecti...

Electrical connecting device, inspection apparatus, and method for...

Inspection system and temperature measuring method for inspection s...

Contact accuracy assurance method, contact accuracy assurance mecha...

Inspection device and method of controlling temperature of probe card

Intermediate connection member and inspection apparatus

Method of contacting substrate with probe card

Support body for contact terminals and probe card

Contact structure for inspection

Manufacturing method of probe card and the probe card

Contact structure for inspection

Probe card

Multilayer substrate and probe card

Probe card and probe device for inspection of a semiconductor device

Probe card

Probe card

Probe card having separated upper and lower probe needle groups

Patents Applicationslast 30 patents

MOUNTING TABLE, TEST APPARATUS, AND TEMPERATURE CALIBRATION METHOD

INTERMEDIATE CONNECTING MEMBER AND INSPECTION APPARATUS

POGO BLOCK

STAGE CLEANING METHOD, STAGE CLEANING MEMBER, METHOD FOR PRODUCING...

ELECTRICAL CONNECTING DEVICE, INSPECTION APPARATUS, AND METHOD FOR...

INTERMEDIATE CONNECTING MEMBER AND INSPECTION APPARATUS

CONTACT ACCURACY ASSURANCE METHOD, CONTACT ACCURACY ASSURANCE MECHA...

INSPECTION DEVICE AND METHOD OF CONTROLLING TEMPERATURE OF PROBE CARD

Temperature Measurement Member, Inspection Apparatus, and Temperatu...

INSPECTION SYSTEM AND TEMPERATURE MEASURING METHOD FOR INSPECTION S...

INTERMEDIATE CONNECTION MEMBER AND INSPECTION APPARATUS

METHOD OF CONTACTING SUBSTRATE WITH PROBE CARD

CIRCUIT BOARD FOR SEMICONDUCTOR DEVICE INSPECTION APPARATUS AND MAN...

SUPPORT BODY FOR CONTACT TERMINALS AND PROBE CARD

Manufacturing method of probe card

Probe Card

CONTACT STRUCTURE FOR INSPECTION

CONTACT STRUCTURE FOR INSPECTION

METHOD FOR MANUFACTURING PROBE SUPPORTING PLATE, COMPUTER STORAGE M...

Manufacturing method of probe card and the probe card

Multilayer Substrate and Probe Card

Probe card

Probe card

Probe and probe card

Probe card and probe device