Jun-Xiu LIU

Person

Taichung City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for determining fluid dynamics of liquid film...
- Patent number 12,272,576
- Issue date Apr 8, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Pin Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for semiconductor wafer defect review
- Patent number 12,190,036
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nozzle having real time inspection functions
- Patent number 12,191,175
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Kai-Lin Chuang
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
System and method for high speed inspection of semiconductor substr...
- Patent number 12,119,273
- Issue date Oct 15, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sheng He Huang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor processing tool and methods of operation
- Patent number 12,087,611
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Pin Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for diagnosing a semiconductor wafer
- Patent number 12,062,166
- Issue date Aug 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yen-Liang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning on wafer defect review
- Patent number 11,935,722
- Issue date Mar 19, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for semiconductor wafer defect review
- Patent number 11,816,411
- Issue date Nov 14, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor processing tool and methods of operation
- Patent number 11,764,094
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Pin Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for high speed inspection of semiconductor substr...
- Patent number 11,749,571
- Issue date Sep 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sheng He Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for diagnosing a semiconductor wafer
- Patent number 11,449,984
- Issue date Sep 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yen-Liang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning on wafer defect review
- Patent number 11,424,101
- Issue date Aug 23, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nozzle having real time inspection functions
- Patent number 11,355,370
- Issue date Jun 7, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Kai-Lin Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of enhancing surface topography on a substrate for inspection
- Patent number 11,222,788
- Issue date Jan 11, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Han-Wen Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing semiconductor substrate
- Patent number 11,107,671
- Issue date Aug 31, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chih Hsu
- B08 - CLEANING
Information Patent Grant
Wafer handling equipment and method thereof
- Patent number 11,031,266
- Issue date Jun 8, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih-Hung Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection and cleaning system and method for the same
- Patent number 11,017,522
- Issue date May 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning on wafer defect review
- Patent number 10,825,650
- Issue date Nov 3, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of enhancing surface topography on a substrate for inspection
- Patent number 10,784,114
- Issue date Sep 22, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Han-Wen Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for diagnosing a semiconductor wafer
- Patent number 10,755,405
- Issue date Aug 25, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yen-Liang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of enhancing surface topography on a substrate for inspection
- Patent number 10,504,737
- Issue date Dec 10, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Han-Wen Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nozzle having real time inspection functions
- Patent number 10,504,758
- Issue date Dec 10, 2019
- Taiwan Semiconductor Manufacturing Company Ltd.
- Kai-Lin Chuang
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Apparatus of processing semiconductor substrate
- Patent number 10,269,557
- Issue date Apr 23, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chih Hsu
- B08 - CLEANING
Information Patent Grant
Method of manufacturing thin film solar cells
- Patent number 8,772,071
- Issue date Jul 8, 2014
- Industrial Technology Research Institute
- Jun-Chin Liu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method for manufacturing P-I-N microcrystalline silicon structure f...
- Patent number 8,557,041
- Issue date Oct 15, 2013
- Industrial Technology Research Institute
- Yu-Hung Chen
- C30 - CRYSTAL GROWTH
Information Patent Grant
Handoff method in a wireless local area network and apparatus using...
- Patent number 7,903,611
- Issue date Mar 8, 2011
- Industrial Technology Research Institute
- I-Wei Wu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor structure for isolating integrated circuits of variou...
- Patent number 7,498,653
- Issue date Mar 3, 2009
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Wei Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
N-well and N+ buried layer isolation by auto doping to reduce chip...
- Patent number 7,436,043
- Issue date Oct 14, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tzu-Chiang Sung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage transistor device having an interlayer dielectric etch...
- Patent number 7,301,185
- Issue date Nov 27, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-I Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned method for defining a semiconductor gate oxide in high...
- Patent number 7,253,114
- Issue date Aug 7, 2007
- Taiwan Semiconductor Manufacturing Company
- Chien-Mao Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR ELECTRICAL ISOLATION OF TRANSISTORS
- Publication number 20250107170
- Publication date Mar 27, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- Yun-Chen WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS
- Publication number 20250096022
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- KAI-LIN CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR DETERMINING FLUID DYNAMICS OF LIQUID FILM...
- Publication number 20240387212
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR INSPECTION OF SEMICONDUCTOR SUBSTRATES
- Publication number 20240379463
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sheng He HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATING SOLAR CELL DEVICES TO REDUCE ACTIVE LAYER DAMAGE
- Publication number 20240381753
- Publication date Nov 14, 2024
- Applied Materials, Inc.
- Yongkee Chae
Information Patent Application
SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION
- Publication number 20240379401
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF
- Publication number 20240105795
- Publication date Mar 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jun-Ye Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR SEMICONDUCTOR WAFER DEFECT REVIEW
- Publication number 20230385502
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Pin CHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-SITU APPARATUS FOR DETECTING ABNORMALITY IN PROCESS TUBE
- Publication number 20230384211
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Jen YANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION
- Publication number 20230369092
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR HIGH SPEED INSPECTION OF SEMICONDUCTOR SUBSTR...
- Publication number 20230360975
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sheng He HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION
- Publication number 20230268215
- Publication date Aug 24, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR HIGH SPEED INSPECTION OF SEMICONDUCTOR SUBSTR...
- Publication number 20230068133
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sheng He HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU APPARATUS FOR DETECTING ABNORMALITY IN PROCESS TUBE
- Publication number 20230060183
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Jen YANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR DETERMINING FLUID DYNAMICS OF LIQUID FILM...
- Publication number 20220406632
- Publication date Dec 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DIAGNOSING A SEMICONDUCTOR WAFER
- Publication number 20220383473
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yen-Liang CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING ON WAFER DEFECT REVIEW
- Publication number 20220359154
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Pin CHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS
- Publication number 20220293443
- Publication date Sep 15, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- KAI-LIN CHUANG
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METHOD AND SYSTEM FOR SEMICONDUCTOR WAFER DEFECT REVIEW
- Publication number 20210232745
- Publication date Jul 29, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Pin CHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING ON WAFER DEFECT REVIEW
- Publication number 20210027984
- Publication date Jan 28, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Pin CHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF ENHANCING SURFACE TOPOGRAPHY ON A SUBSTRATE FOR INSPECTION
- Publication number 20200395220
- Publication date Dec 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Han-Wen LIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DIAGNOSING A SEMICONDUCTOR WAFER
- Publication number 20200388020
- Publication date Dec 10, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yen-Liang CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20200334800
- Publication date Oct 22, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Pin CHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHEMICAL MECHANICAL POLISHING APPARATUS AND METHOD
- Publication number 20200130134
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Liang CHEN
- B24 - GRINDING POLISHING
Information Patent Application
NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS
- Publication number 20200118852
- Publication date Apr 16, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- KAI-LIN CHUANG
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METHODS OF ENHANCING SURFACE TOPOGRAPHY ON A SUBSTRATE FOR INSPECTION
- Publication number 20200066538
- Publication date Feb 27, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Han-Wen Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER HANDLING EQUIPMENT AND METHOD THEREOF
- Publication number 20200020558
- Publication date Jan 16, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Hung LIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING SEMICONDUCTOR SUBSTRATE
- Publication number 20190252181
- Publication date Aug 15, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chih HSU
- B08 - CLEANING
Information Patent Application
METHOD AND SYSTEM FOR DIAGNOSING A SEMICONDUCTOR WAFER
- Publication number 20190164264
- Publication date May 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Liang CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF ENHANCING SURFACE TOPOGRAPHY ON A SUBSTRATE FOR INSPECTION
- Publication number 20180350614
- Publication date Dec 6, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Han-Wen Liao
- H01 - BASIC ELECTRIC ELEMENTS

Jun-Xiu LIU

Person

Patents Grantslast 30 patents

Apparatus and methods for determining fluid dynamics of liquid film...

Method and system for semiconductor wafer defect review

Nozzle having real time inspection functions

System and method for high speed inspection of semiconductor substr...

Semiconductor processing tool and methods of operation

Method and system for diagnosing a semiconductor wafer

Machine learning on wafer defect review

Method and system for semiconductor wafer defect review

Semiconductor processing tool and methods of operation

System and method for high speed inspection of semiconductor substr...

Method and system for diagnosing a semiconductor wafer

Machine learning on wafer defect review

Nozzle having real time inspection functions

Methods of enhancing surface topography on a substrate for inspection

Method of processing semiconductor substrate

Wafer handling equipment and method thereof

Inspection and cleaning system and method for the same

Machine learning on wafer defect review

Methods of enhancing surface topography on a substrate for inspection

Method and system for diagnosing a semiconductor wafer

Methods of enhancing surface topography on a substrate for inspection

Nozzle having real time inspection functions

Apparatus of processing semiconductor substrate

Method of manufacturing thin film solar cells

Method for manufacturing P-I-N microcrystalline silicon structure f...

Handoff method in a wireless local area network and apparatus using...

Semiconductor structure for isolating integrated circuits of variou...

N-well and N+ buried layer isolation by auto doping to reduce chip...

High-voltage transistor device having an interlayer dielectric etch...

Self-aligned method for defining a semiconductor gate oxide in high...

Patents Applicationslast 30 patents

METHODS FOR ELECTRICAL ISOLATION OF TRANSISTORS

NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS

APPARATUS AND METHODS FOR DETERMINING FLUID DYNAMICS OF LIQUID FILM...

SYSTEMS FOR INSPECTION OF SEMICONDUCTOR SUBSTRATES

FABRICATING SOLAR CELL DEVICES TO REDUCE ACTIVE LAYER DAMAGE

SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF

METHOD AND SYSTEM FOR SEMICONDUCTOR WAFER DEFECT REVIEW

IN-SITU APPARATUS FOR DETECTING ABNORMALITY IN PROCESS TUBE

SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION

SYSTEM AND METHOD FOR HIGH SPEED INSPECTION OF SEMICONDUCTOR SUBSTR...

SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION

SYSTEM AND METHOD FOR HIGH SPEED INSPECTION OF SEMICONDUCTOR SUBSTR...

IN-SITU APPARATUS FOR DETECTING ABNORMALITY IN PROCESS TUBE

APPARATUS AND METHODS FOR DETERMINING FLUID DYNAMICS OF LIQUID FILM...

METHOD AND SYSTEM FOR DIAGNOSING A SEMICONDUCTOR WAFER

MACHINE LEARNING ON WAFER DEFECT REVIEW

NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS

METHOD AND SYSTEM FOR SEMICONDUCTOR WAFER DEFECT REVIEW

MACHINE LEARNING ON WAFER DEFECT REVIEW

METHODS OF ENHANCING SURFACE TOPOGRAPHY ON A SUBSTRATE FOR INSPECTION

METHOD AND SYSTEM FOR DIAGNOSING A SEMICONDUCTOR WAFER

INSPECTION SYSTEM AND METHOD

CHEMICAL MECHANICAL POLISHING APPARATUS AND METHOD

NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS

METHODS OF ENHANCING SURFACE TOPOGRAPHY ON A SUBSTRATE FOR INSPECTION

WAFER HANDLING EQUIPMENT AND METHOD THEREOF

METHOD OF PROCESSING SEMICONDUCTOR SUBSTRATE

METHOD AND SYSTEM FOR DIAGNOSING A SEMICONDUCTOR WAFER

METHODS OF ENHANCING SURFACE TOPOGRAPHY ON A SUBSTRATE FOR INSPECTION