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Junji Endo
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Kokubunji, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Interference measuring device
Patent number
6,950,195
Issue date
Sep 27, 2005
Hitachi, Ltd.
Junji Endo
G01 - MEASURING TESTING
Information
Patent Grant
Specimen observation system for applying external magnetic field
Patent number
6,838,675
Issue date
Jan 4, 2005
Hitachi, Ltd.
Ken Harada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle guide apparatus and image viewing apparatus for ch...
Patent number
5,811,805
Issue date
Sep 22, 1998
Research Development Corporation of Japan
Nobuyuki Osakabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Interference device and method for observing phase informalities
Patent number
5,446,589
Issue date
Aug 29, 1995
Research Development Corporation of Japan
Qing X. Ru
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Electron optical measurement apparatus
Patent number
5,192,867
Issue date
Mar 9, 1993
Hitachi, Ltd.
Nobuyuki Osakabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam generating apparatus of multi-stage accelerat...
Patent number
5,059,859
Issue date
Oct 22, 1991
Hitachi, Ltd.
Junji Endo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Field emission electron gun system
Patent number
4,945,247
Issue date
Jul 31, 1990
Hitachi, Ltd.
Takeshi Kawasaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron holography apparatus
Patent number
4,935,625
Issue date
Jun 19, 1990
Hitachi, Ltd.
Shuji Hasegawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Field emission type electron microscope using a multi-stage acceler...
Patent number
4,642,461
Issue date
Feb 10, 1987
Hitachi, Ltd.
Junji Endo
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Coherent beam device for observing and measuring sample
Publication number
20050146730
Publication date
Jul 7, 2005
Junji Endo
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field applying sample observing system
Publication number
20040061066
Publication date
Apr 1, 2004
Ken Harada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Interference measuring device
Publication number
20030160969
Publication date
Aug 28, 2003
Junji Endo
G01 - MEASURING TESTING