Justin Seng

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for extending analog front end sense range of...
- Patent number 9,835,647
- Issue date Dec 5, 2017
- Fairchild Semiconductor Corporation
- Ion Opris
- G01 - MEASURING TESTING
Information Patent Grant
Temperature and power supply calibration
- Patent number 9,759,564
- Issue date Sep 12, 2017
- Fairchild Semiconductor Corporation
- Shungneng Lee
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Self test of MEMS accelerometer with ASICS integrated capacitors
- Patent number 9,488,693
- Issue date Nov 8, 2016
- Fairchild Semiconductor Corporation
- Jonathan Adam Kleks
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Uniform distribution dithering in sigma-delta A/D converters
- Patent number 9,356,617
- Issue date May 31, 2016
- Fairchild Semiconductor Corporation
- Ion Opris
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Self test of MEMS gyroscope with ASICs integrated capacitors
- Patent number 9,069,006
- Issue date Jun 30, 2015
- Fairchild Semiconductor Corporation
- Ion Opris
- G01 - MEASURING TESTING
Information Patent Grant
Noise reduction method with chopping for a merged MEMS acceleromete...
- Patent number 8,742,964
- Issue date Jun 3, 2014
- Fairchild Semiconductor Corporation
- Jonathan Adam Kleks
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
UNIFORM DISTRIBUTION DITHERING IN SIGMA-DELTA A/D CONVERTERS
- Publication number 20150270847
- Publication date Sep 24, 2015
- Fairchild Semiconductor Corporation
- Ion Opris
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR EXTENDING ANALOG FRONT END SENSE RANGE OF...
- Publication number 20150268284
- Publication date Sep 24, 2015
- Fairchild Semiconductor Corporation
- Ion Opris
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE AND POWER SUPPLY CALIBRATION
- Publication number 20140269813
- Publication date Sep 18, 2014
- Shungneng Lee
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SELF TEST OF MEMS ACCELEROMETER WITH ASICS INTEGRATED CAPACITORS
- Publication number 20130265070
- Publication date Oct 10, 2013
- Fairchild Semiconductor Corporation
- Jonathan Adam Kleks
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
NOISE REDUCTION METHOD WITH CHOPPING FOR A MERGED MEMS ACCELEROMETE...
- Publication number 20130265183
- Publication date Oct 10, 2013
- Fairchild Semiconductor Corporation
- Jonathan Adam Kleks
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SELF TEST OF MEMS GYROSCOPE WITH ASICS INTEGRATED CAPACITORS
- Publication number 20130263641
- Publication date Oct 10, 2013
- Fairchild Semiconductor Corporation
- Ion Opris
- G01 - MEASURING TESTING