Jyota Miyakura

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Calibration method for X-ray measuring device
- Patent number 11,573,190
- Issue date Feb 7, 2023
- Mitutoyo Corporation
- Masato Kon
- G01 - MEASURING TESTING
Information Patent Grant
Lens substrate stacking position calculating apparatus and program
- Patent number 11,435,560
- Issue date Sep 6, 2022
- Mitutoyo Corporation
- Kazuhiko Hidaka
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Calibration method of x-ray measuring device
- Patent number 11,346,660
- Issue date May 31, 2022
- Mitutoyo Corporation
- Masato Kon
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method of x-ray measuring device
- Patent number 11,344,276
- Issue date May 31, 2022
- Mitutoyo Corporation
- Masato Kon
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for hardness tester
- Patent number 9,111,332
- Issue date Aug 18, 2015
- Mitutoyo Corporation
- Jyota Miyakura
- G01 - MEASURING TESTING
Information Patent Grant
Light-interference measuring apparatus
- Patent number 8,891,090
- Issue date Nov 18, 2014
- Mitutoyo Corporation
- Tatsuya Nagahama
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring method and shape measuring apparatus
- Patent number 8,681,341
- Issue date Mar 25, 2014
- Mitutoyo Corporation
- Tomonori Goto
- G01 - MEASURING TESTING
Information Patent Grant
Image measuring apparatus, program, and teaching method of image me...
- Patent number 8,538,165
- Issue date Sep 17, 2013
- Mitutoyo Corporation
- Tsukasa Kojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Form measuring device and method of aligning form data
- Patent number 8,521,470
- Issue date Aug 27, 2013
- Mitutoyo Corporation
- Tomonori Goto
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus
- Patent number 8,520,216
- Issue date Aug 27, 2013
- Mitutoyo Corporation
- Tomonori Goto
- G01 - MEASURING TESTING
Information Patent Grant
Correction method, computer-readable recording medium storing compu...
- Patent number 7,383,143
- Issue date Jun 3, 2008
- Mitutoyo Corporation
- Tomonori Goto
- G01 - MEASURING TESTING
Information Patent Grant
Signal-processing method, signal-processing program, recording medi...
- Patent number 6,885,980
- Issue date Apr 26, 2005
- Mitutoyo Corporation
- Soichi Kadowaki
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION METHOD FOR X-RAY MEASURING DEVICE
- Publication number 20210404976
- Publication date Dec 30, 2021
- MITUTOYO CORPORATION
- Masato KON
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD OF X-RAY MEASURING DEVICE
- Publication number 20210072022
- Publication date Mar 11, 2021
- MITUTOYO CORPORATION
- Masato KON
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD OF X-RAY MEASURING DEVICE
- Publication number 20210068777
- Publication date Mar 11, 2021
- MITUTOYO CORPORATION
- Masato KON
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
LENS SUBSTRATE STACKING POSITION CALCULATING APPARATUS AND PROGRAM
- Publication number 20200271901
- Publication date Aug 27, 2020
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR HARDNESS TESTER
- Publication number 20140294282
- Publication date Oct 2, 2014
- MITUTOYO CORPORATION
- Jyota MIYAKURA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS
- Publication number 20120044503
- Publication date Feb 23, 2012
- Mitutoyo Corporation
- Tomonori Goto
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS
- Publication number 20120033229
- Publication date Feb 9, 2012
- Mitutoyo Corporation
- Tomonori Goto
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASURING APPARATUS, PROGRAM, AND TEACHING METHOD OF IMAGE ME...
- Publication number 20110280496
- Publication date Nov 17, 2011
- MITUTOYO CORPORATION
- Tsukasa KOJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT-INTERFERENCE MEASURING APPARATUS
- Publication number 20110222069
- Publication date Sep 15, 2011
- Mitutoyo Corporation
- Tatsuya NAGAHAMA
- G01 - MEASURING TESTING
Information Patent Application
FORM MEASURING DEVICE AND METHOD OF ALIGNING FORM DATA
- Publication number 20110098971
- Publication date Apr 28, 2011
- Mitutoyo Corporation
- Tomonori Goto
- G01 - MEASURING TESTING
Information Patent Application
Correction method, computer-readable recording medium storing compu...
- Publication number 20070192052
- Publication date Aug 16, 2007
- Mitutoyo Corporation
- Tomonori Goto
- G01 - MEASURING TESTING
Information Patent Application
Signal-processing method, signal-processing program, recording medi...
- Publication number 20040162708
- Publication date Aug 19, 2004
- Mitutoyo Corporation
- Soichi Kadowaki
- G06 - COMPUTING CALCULATING COUNTING

Jyota Miyakura

Person

Patents Grantslast 30 patents

Calibration method for X-ray measuring device

Lens substrate stacking position calculating apparatus and program

Calibration method of x-ray measuring device

Calibration method of x-ray measuring device

Method and apparatus for hardness tester

Light-interference measuring apparatus

Shape measuring method and shape measuring apparatus

Image measuring apparatus, program, and teaching method of image me...

Form measuring device and method of aligning form data

Shape measuring apparatus

Correction method, computer-readable recording medium storing compu...

Signal-processing method, signal-processing program, recording medi...

Patents Applicationslast 30 patents

CALIBRATION METHOD FOR X-RAY MEASURING DEVICE

CALIBRATION METHOD OF X-RAY MEASURING DEVICE

CALIBRATION METHOD OF X-RAY MEASURING DEVICE

LENS SUBSTRATE STACKING POSITION CALCULATING APPARATUS AND PROGRAM

METHOD AND APPARATUS FOR HARDNESS TESTER

SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS

SHAPE MEASURING APPARATUS

IMAGE MEASURING APPARATUS, PROGRAM, AND TEACHING METHOD OF IMAGE ME...

LIGHT-INTERFERENCE MEASURING APPARATUS

FORM MEASURING DEVICE AND METHOD OF ALIGNING FORM DATA

Correction method, computer-readable recording medium storing compu...

Signal-processing method, signal-processing program, recording medi...