Jyothi Singh

Person

Houston, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for mapping scratches in an oxide film
- Patent number 6,291,833
- Issue date Sep 18, 2001
- International Business Machines Corporation
- William Francis Landers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for mapping scratches in an oxide film
- Patent number 6,048,745
- Issue date Apr 11, 2000
- International Business Machines Corporation
- William Francis Landers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined emissivity and radiance measurement for determination of t...
- Patent number 5,993,059
- Issue date Nov 30, 1999
- International Business Machines Corporation
- James Anthony O'Neill
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for imaging surface topography of a wafer
- Patent number 5,953,115
- Issue date Sep 14, 1999
- International Business Machines Corporation
- William Francis Landers
- G01 - MEASURING TESTING
Information Patent Grant
Control of etch selectivity
- Patent number 5,770,097
- Issue date Jun 23, 1998
- International Business Machines Corporation
- James Anthony O'Neill
- B24 - GRINDING POLISHING
Information Patent Grant
Combined emissivity and radiance measurement for the determination...
- Patent number 5,738,440
- Issue date Apr 14, 1998
- International Business Machines Corp.
- James Anthony O'Neill
- G01 - MEASURING TESTING
Information Patent Grant
Control of etch selectivity
- Patent number 5,683,538
- Issue date Nov 4, 1997
- International Business Machines Corporation
- James Anthony O'Neill
- B24 - GRINDING POLISHING
Information Patent Grant
Fluid delivery apparatus having an infrared feedline sensor
- Patent number 5,534,066
- Issue date Jul 9, 1996
- International Business Machines Corporation
- James A. O'Neill
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fluid delivery apparatus and method having an infrared feedline sensor
- Patent number 5,492,718
- Issue date Feb 20, 1996
- International Business Machines Corporation
- James A. O'Neill
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods and apparatus for contamination control in plasma processing
- Patent number 5,387,777
- Issue date Feb 7, 1995
- International Business Machines Corporation
- Reid S. Bennett
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Reaction chamber interelectrode gap monitoring by capacitance measu...
- Patent number 5,382,911
- Issue date Jan 17, 1995
- International Business Machines Corporation
- Tina J. Cotler
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods and apparatus for contamination control in plasma processing
- Patent number 5,367,139
- Issue date Nov 22, 1994
- International Business Machines Corporation
- Reid S. Bennett
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for optical emission end point detection in pl...
- Patent number 5,308,414
- Issue date May 3, 1994
- International Business Machines Corporation
- James A. O'Neill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma amplified photoelectron process endpoint detection apparatus
- Patent number 4,846,920
- Issue date Jul 11, 1989
- International Business Machine Corporation
- John H. Keller
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR MAPPING SCRATCHES IN AN OXIDE FILM
- Publication number 20010013606
- Publication date Aug 16, 2001
- WILLIAM FRANCIS LANDERS
- H01 - BASIC ELECTRIC ELEMENTS

Jyothi Singh

Person

Patents Grantslast 30 patents

Apparatus for mapping scratches in an oxide film

Method for mapping scratches in an oxide film

Combined emissivity and radiance measurement for determination of t...

Method and apparatus for imaging surface topography of a wafer

Control of etch selectivity

Combined emissivity and radiance measurement for the determination...

Control of etch selectivity

Fluid delivery apparatus having an infrared feedline sensor

Fluid delivery apparatus and method having an infrared feedline sensor

Methods and apparatus for contamination control in plasma processing

Reaction chamber interelectrode gap monitoring by capacitance measu...

Methods and apparatus for contamination control in plasma processing

Method and apparatus for optical emission end point detection in pl...

Plasma amplified photoelectron process endpoint detection apparatus

Patents Applicationslast 30 patents

APPARATUS FOR MAPPING SCRATCHES IN AN OXIDE FILM