KAI-CHIEH HSIEH

Person

TAOYUAN COUNTY 328, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Board-like connector, single-arm bridge of board-like connector, an...
- Patent number 11,747,395
- Issue date Sep 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Board-like connector, dual-arm bridge of board-like connector, and...
- Patent number 11,699,871
- Issue date Jul 11, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device and self-aligned probe
- Patent number 11,592,466
- Issue date Feb 28, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Board-like connector, dual-ring bridge of board-like connector, and...
- Patent number 11,561,244
- Issue date Jan 24, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and dual-arm probe
- Patent number 11,536,744
- Issue date Dec 27, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and spring-like probe
- Patent number 11,460,486
- Issue date Oct 4, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Split thin-film probe card
- Patent number 11,287,446
- Issue date Mar 29, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and fence-like probe thereof
- Patent number 11,226,354
- Issue date Jan 18, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and neck-like probe thereof
- Patent number 11,209,461
- Issue date Dec 28, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 11,204,371
- Issue date Dec 21, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Staggered probe card
- Patent number 11,175,312
- Issue date Nov 16, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Thin-film probe card and test module thereof
- Patent number 11,175,313
- Issue date Nov 16, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 11,073,537
- Issue date Jul 27, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
High speed probe card device and rectangular probe
- Patent number 11,009,524
- Issue date May 18, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and three-dimensional signal transfer structure t...
- Patent number 11,009,526
- Issue date May 18, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and probe head thereof
- Patent number 10,845,388
- Issue date Nov 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and matching probe thereof
- Patent number 10,845,387
- Issue date Nov 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 10,845,385
- Issue date Nov 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card testing device and testing device
- Patent number 10,775,412
- Issue date Sep 15, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and probe structure thereof
- Patent number 10,718,791
- Issue date Jul 21, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and probe structure thereof
- Patent number 10,705,117
- Issue date Jul 7, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure
- Patent number 10,514,390
- Issue date Dec 24, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen Tsung Li
- G01 - MEASURING TESTING
Information Patent Grant
Probe device of vertical probe card
- Patent number 10,060,949
- Issue date Aug 28, 2018
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen Tsung Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD DEVICE AND SPRING-LIKE PROBE
- Publication number 20220334145
- Publication date Oct 20, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DUAL-ARM PROBE
- Publication number 20220170960
- Publication date Jun 2, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND SELF-ALIGNED PROBE
- Publication number 20220163565
- Publication date May 26, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
BOARD-LIKE CONNECTOR, SINGLE-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AN...
- Publication number 20220137124
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BOARD-LIKE CONNECTOR, DUAL-RING BRIDGE OF BOARD-LIKE CONNECTOR, AND...
- Publication number 20220137095
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
BOARD-LIKE CONNECTOR, DUAL-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AND...
- Publication number 20220140515
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF
- Publication number 20220018876
- Publication date Jan 20, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF
- Publication number 20220011346
- Publication date Jan 13, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM PROBE CARD AND TEST MODULE THEREOF
- Publication number 20210349129
- Publication date Nov 11, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
SPLIT THIN-FILM PROBE CARD AND ELASTIC MODULE THEREOF
- Publication number 20210325430
- Publication date Oct 21, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DIRECTIVITY PROBE THEREOF
- Publication number 20210223291
- Publication date Jul 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND NECK-LIKE PROBE THEREOF
- Publication number 20210223289
- Publication date Jul 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
STAGGERED PROBE CARD AND CONDUCTIVE PROBE
- Publication number 20210109129
- Publication date Apr 15, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND CONDUCTIVE PROBE THEREOF
- Publication number 20200300893
- Publication date Sep 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED PROBE CARD DEVICE AND RECTANGULAR PROBE
- Publication number 20200233014
- Publication date Jul 23, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND PROBE HEAD THEREOF
- Publication number 20200166543
- Publication date May 28, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND MATCHING PROBE THEREOF
- Publication number 20200158756
- Publication date May 21, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD TESTING DEVICE AND TESTING DEVICE
- Publication number 20200088764
- Publication date Mar 19, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FLAT SIGNAL TRANSFER STRUCTURE THEREOF
- Publication number 20190377003
- Publication date Dec 12, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND THREE-DIMENSIONAL SIGNAL TRANSFER STRUCTURE T...
- Publication number 20190377004
- Publication date Dec 12, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY AND PROBE STRUCTURE THEREOF
- Publication number 20190265275
- Publication date Aug 29, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY AND PROBE STRUCTURE THEREOF
- Publication number 20190265274
- Publication date Aug 29, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE OF VERTICAL PROBE CARD
- Publication number 20180059140
- Publication date Mar 1, 2018
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen Tsung LI
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE
- Publication number 20180017593
- Publication date Jan 18, 2018
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen Tsung LI
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD WITH VIA CAPACITOR STRUCTURE AND MANUFACTURING METHOD...
- Publication number 20170367183
- Publication date Dec 21, 2017
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen Tsung LI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
STACK TYPE TEST INTERFACE BOARD ASSEMBLY AND METHOD FOR MANUFACTURI...
- Publication number 20170315152
- Publication date Nov 2, 2017
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Cheng-Juei LIN
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER INTERPOSER WITH HIGH BONDING STRENGTH
- Publication number 20160349315
- Publication date Dec 1, 2016
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
FINE PITCH INTERPOSER STRUCTURE
- Publication number 20140084955
- Publication date Mar 27, 2014
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YUAN-CHIANG TENG
- G01 - MEASURING TESTING

KAI-CHIEH HSIEH

Person

Patents Grantslast 30 patents

Board-like connector, single-arm bridge of board-like connector, an...

Board-like connector, dual-arm bridge of board-like connector, and...

Probe card device and self-aligned probe

Board-like connector, dual-ring bridge of board-like connector, and...

Probe card device and dual-arm probe

Probe card device and spring-like probe

Split thin-film probe card

Probe card device and fence-like probe thereof

Probe card device and neck-like probe thereof

Probe card device

Staggered probe card

Thin-film probe card and test module thereof

Probe card device

High speed probe card device and rectangular probe

Probe card device and three-dimensional signal transfer structure t...

Probe card device and probe head thereof

Probe card device and matching probe thereof

Probe card device

Probe card testing device and testing device

Probe assembly and probe structure thereof

Probe assembly and probe structure thereof

Probe structure

Probe device of vertical probe card

Patents Applicationslast 30 patents

PROBE CARD DEVICE AND SPRING-LIKE PROBE

PROBE CARD DEVICE AND DUAL-ARM PROBE

PROBE CARD DEVICE AND SELF-ALIGNED PROBE

BOARD-LIKE CONNECTOR, SINGLE-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AN...

BOARD-LIKE CONNECTOR, DUAL-RING BRIDGE OF BOARD-LIKE CONNECTOR, AND...

BOARD-LIKE CONNECTOR, DUAL-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AND...

PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF

PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF

THIN-FILM PROBE CARD AND TEST MODULE THEREOF

SPLIT THIN-FILM PROBE CARD AND ELASTIC MODULE THEREOF

PROBE CARD DEVICE AND DIRECTIVITY PROBE THEREOF

PROBE CARD DEVICE AND NECK-LIKE PROBE THEREOF

STAGGERED PROBE CARD AND CONDUCTIVE PROBE

PROBE CARD DEVICE AND CONDUCTIVE PROBE THEREOF

HIGH SPEED PROBE CARD DEVICE AND RECTANGULAR PROBE

PROBE CARD DEVICE AND PROBE HEAD THEREOF

PROBE CARD DEVICE AND MATCHING PROBE THEREOF

PROBE CARD TESTING DEVICE AND TESTING DEVICE

PROBE CARD DEVICE AND FLAT SIGNAL TRANSFER STRUCTURE THEREOF

PROBE CARD DEVICE AND THREE-DIMENSIONAL SIGNAL TRANSFER STRUCTURE T...

PROBE ASSEMBLY AND PROBE STRUCTURE THEREOF

PROBE ASSEMBLY AND PROBE STRUCTURE THEREOF

PROBE DEVICE OF VERTICAL PROBE CARD

PROBE STRUCTURE

CIRCUIT BOARD WITH VIA CAPACITOR STRUCTURE AND MANUFACTURING METHOD...

STACK TYPE TEST INTERFACE BOARD ASSEMBLY AND METHOD FOR MANUFACTURI...

MULTILAYER INTERPOSER WITH HIGH BONDING STRENGTH

FINE PITCH INTERPOSER STRUCTURE