Kai-Lin Chuang

Person

Chia-Yi City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device structure including stacked nanostructures
- Patent number 12,336,226
- Issue date Jun 17, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jung-Hung Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ apparatus for detecting abnormality in process tube
- Patent number 12,326,397
- Issue date Jun 10, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Jen Yang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining fluid dynamics of liquid film...
- Patent number 12,272,576
- Issue date Apr 8, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Pin Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nozzle having real time inspection functions
- Patent number 12,191,175
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Kai-Lin Chuang
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Semiconductor processing tool and methods of operation
- Patent number 12,087,611
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Pin Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing tool and methods of operation
- Patent number 11,764,094
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Pin Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nozzle having real time inspection functions
- Patent number 11,355,370
- Issue date Jun 7, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Kai-Lin Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing semiconductor substrate
- Patent number 11,107,671
- Issue date Aug 31, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chih Hsu
- B08 - CLEANING
Information Patent Grant
Method and system for aligning probe card in semiconductor device t...
- Patent number 10,866,276
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kai-Di Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for aligning probe card in semiconductor device t...
- Patent number 10,509,071
- Issue date Dec 17, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kai-Di Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Nozzle having real time inspection functions
- Patent number 10,504,758
- Issue date Dec 10, 2019
- Taiwan Semiconductor Manufacturing Company Ltd.
- Kai-Lin Chuang
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Apparatus of processing semiconductor substrate
- Patent number 10,269,557
- Issue date Apr 23, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Chih Hsu
- B08 - CLEANING

Patents Applicationslast 30 patents

Information Patent Application
NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS
- Publication number 20250096022
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- KAI-LIN CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR DETERMINING FLUID DYNAMICS OF LIQUID FILM...
- Publication number 20240387212
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20240379875
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jung-Hung CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION
- Publication number 20240379401
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transistor Source/Drain Regions and Methods of Forming the Same
- Publication number 20230420520
- Publication date Dec 28, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tsung-Han Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20230411527
- Publication date Dec 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Cheng CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU APPARATUS FOR DETECTING ABNORMALITY IN PROCESS TUBE
- Publication number 20230384211
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Jen YANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION
- Publication number 20230369092
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION
- Publication number 20230268215
- Publication date Aug 24, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device Structure and Method for Forming the Same
- Publication number 20230178600
- Publication date Jun 8, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tsung-Han Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20230113269
- Publication date Apr 13, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jung-Hung CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU APPARATUS FOR DETECTING ABNORMALITY IN PROCESS TUBE
- Publication number 20230060183
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Jen YANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR DETERMINING FLUID DYNAMICS OF LIQUID FILM...
- Publication number 20220406632
- Publication date Dec 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS
- Publication number 20220293443
- Publication date Sep 15, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- KAI-LIN CHUANG
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
WAFER NOTCH POSITIONING DETECTION
- Publication number 20220059381
- Publication date Feb 24, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Kai-An CHUANG
- G01 - MEASURING TESTING
Information Patent Application
NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS
- Publication number 20200118852
- Publication date Apr 16, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- KAI-LIN CHUANG
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METHOD AND SYSTEM FOR ALIGNING PROBE CARD IN SEMICONDUCTOR DEVICE T...
- Publication number 20200110131
- Publication date Apr 9, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kai-Di CHUANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PROCESSING SEMICONDUCTOR SUBSTRATE
- Publication number 20190252181
- Publication date Aug 15, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chih HSU
- B08 - CLEANING
Information Patent Application
METHOD AND SYSTEM FOR ALIGNING PROBE CARD IN SEMICONDUCTOR DEVICE T...
- Publication number 20180143244
- Publication date May 24, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kai-Di CHUANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS OF PROCESSING SEMICONDUCTOR SUBSTRATE
- Publication number 20170110315
- Publication date Apr 20, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Chih HSU
- B08 - CLEANING
Information Patent Application
NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS
- Publication number 20150231657
- Publication date Aug 20, 2015
- Taiwan Semiconductor Manufacturing company Ltd.
- Kai-Lin Chuang
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...

Kai-Lin Chuang

Person

Patents Grantslast 30 patents

Semiconductor device structure including stacked nanostructures

In-situ apparatus for detecting abnormality in process tube

Apparatus and methods for determining fluid dynamics of liquid film...

Nozzle having real time inspection functions

Semiconductor processing tool and methods of operation

Semiconductor processing tool and methods of operation

Nozzle having real time inspection functions

Method of processing semiconductor substrate

Method and system for aligning probe card in semiconductor device t...

Method and system for aligning probe card in semiconductor device t...

Nozzle having real time inspection functions

Apparatus of processing semiconductor substrate

Patents Applicationslast 30 patents

NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS

APPARATUS AND METHODS FOR DETERMINING FLUID DYNAMICS OF LIQUID FILM...

SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME

SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION

Transistor Source/Drain Regions and Methods of Forming the Same

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

IN-SITU APPARATUS FOR DETECTING ABNORMALITY IN PROCESS TUBE

SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION

SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION

Semiconductor Device Structure and Method for Forming the Same

SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME

IN-SITU APPARATUS FOR DETECTING ABNORMALITY IN PROCESS TUBE

APPARATUS AND METHODS FOR DETERMINING FLUID DYNAMICS OF LIQUID FILM...

NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS

WAFER NOTCH POSITIONING DETECTION

NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS

METHOD AND SYSTEM FOR ALIGNING PROBE CARD IN SEMICONDUCTOR DEVICE T...

METHOD OF PROCESSING SEMICONDUCTOR SUBSTRATE

METHOD AND SYSTEM FOR ALIGNING PROBE CARD IN SEMICONDUCTOR DEVICE T...

APPARATUS OF PROCESSING SEMICONDUCTOR SUBSTRATE

NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS