Kai Wu

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Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING THE FILM ELEMENT USING OPTICAL MULTI-WAVELENGT...
- Publication number 20120140235
- Publication date Jun 7, 2012
- Cheng-Chung LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING THIN FILM DEPOSITION USING DYNAMIC INTERFEROM...
- Publication number 20120140239
- Publication date Jun 7, 2012
- Cheng-Chung LEE
- G01 - MEASURING TESTING