Kais Almarzouk

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Tustin, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for monitoring WDM channels and for analyzing...
- Patent number 6,967,718
- Issue date Nov 22, 2005
- Silicon Light Machines Corportion
- Clinton B. Carlisle
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring wavelength jitter of light signal
- Patent number 6,785,001
- Issue date Aug 31, 2004
- Silicon Light Machines, Inc.
- Kais Almarzouk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for measuring wavelength jitter of light signal
- Publication number 20030038943
- Publication date Feb 27, 2003
- Kais Almarzouk
- G01 - MEASURING TESTING