Karen E. Walrath

Person

Arlington, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated sensor cartridge system and method of use
- Patent number 10,677,756
- Issue date Jun 9, 2020
- Jentek Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method for stress assessment that removes temperature effects and h...
- Patent number 8,415,947
- Issue date Apr 9, 2013
- Jentek Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit with sense elements having associated and unassociated...
- Patent number 8,222,897
- Issue date Jul 17, 2012
- Jentek Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current sensor with concentric segments
- Patent number 7,994,781
- Issue date Aug 9, 2011
- Jentek Sensors, Inc.
- Neil J. Goldfine
- B24 - GRINDING POLISHING
Information Patent Grant
Surface mounted sensor arrays having segmented primary windings
- Patent number 7,589,526
- Issue date Sep 15, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Material condition monitoring with multiple sensing modes
- Patent number 7,451,657
- Issue date Nov 18, 2008
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method for verifying sensor condition
- Patent number 7,348,771
- Issue date Mar 25, 2008
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Damage standard fabrication with attached sensor
- Patent number 7,230,421
- Issue date Jun 12, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method for material property monitoring with perforated, surface mo...
- Patent number 7,161,350
- Issue date Jan 9, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit having parallel drive segments and a plurality of sens...
- Patent number 7,049,811
- Issue date May 23, 2006
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
Fluid supports for sensors
- Patent number 6,798,198
- Issue date Sep 28, 2004
- Jentek Sensors, Inc.
- Vladimir Tsukernik
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current sensor arrays having drive windings with extended port...
- Patent number 6,784,662
- Issue date Aug 31, 2004
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting widespread fatigue and cracks in a metal structure
- Patent number 6,420,867
- Issue date Jul 16, 2002
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing coating and substrates
- Patent number 6,377,039
- Issue date Apr 23, 2002
- Jentek Sensors, Incorporated
- Neil J. Goldfine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED SENSOR CARTRIDGE SYSTEM AND METHOD OF USE
- Publication number 20160349214
- Publication date Dec 1, 2016
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Test Circuit With Sense Elements Having Associated And Unassociated...
- Publication number 20130014589
- Publication date Jan 17, 2013
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
PRIMARY WINDINGS HAVING MULTIPLE PARALLEL EXTENDED PORTIONS
- Publication number 20090315540
- Publication date Dec 24, 2009
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- B24 - GRINDING POLISHING
Information Patent Application
Torque and load monitoring using magnetic sensor arrays
- Publication number 20090001974
- Publication date Jan 1, 2009
- JENTEK Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Primary windings having multiple parallel extended portions
- Publication number 20070236214
- Publication date Oct 11, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Method for material property monitoring with perforated, surface mo...
- Publication number 20070120561
- Publication date May 31, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Test circuit with drive windings and sense elements
- Publication number 20070029997
- Publication date Feb 8, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Automated drawing tool and method for drawing a sensor layout
- Publication number 20060186880
- Publication date Aug 24, 2006
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Application
Surface mounted and scanning spatially periodic eddy-current sensor...
- Publication number 20060082366
- Publication date Apr 20, 2006
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material condition monitoring with multiple sensing modes
- Publication number 20050171703
- Publication date Aug 4, 2005
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Fluid supports for sensors
- Publication number 20050083050
- Publication date Apr 21, 2005
- JENTEK Sensors, Inc.
- Vladimir Tsukernik
- G01 - MEASURING TESTING
Information Patent Application
Eddy current sensor arrays having drive windings with extended port...
- Publication number 20040232911
- Publication date Nov 25, 2004
- JENTEK Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Application
Material condition assessment with spatially periodic field sensors
- Publication number 20040066188
- Publication date Apr 8, 2004
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Fluid supports for sensors
- Publication number 20030155914
- Publication date Aug 21, 2003
- JENTEK Sensors, Inc.
- Vladimir Tsukernik
- G01 - MEASURING TESTING
Information Patent Application
Eddy current sensor arrays
- Publication number 20030071615
- Publication date Apr 17, 2003
- JENTEK Sensors
- Darrell E. Schlicker
- G01 - MEASURING TESTING

Karen E. Walrath

Person

Patents Grantslast 30 patents

Integrated sensor cartridge system and method of use

Method for stress assessment that removes temperature effects and h...

Test circuit with sense elements having associated and unassociated...

Eddy current sensor with concentric segments

Surface mounted sensor arrays having segmented primary windings

Material condition monitoring with multiple sensing modes

Method for verifying sensor condition

Damage standard fabrication with attached sensor

Method for material property monitoring with perforated, surface mo...

Test circuit having parallel drive segments and a plurality of sens...

Fluid supports for sensors

Eddy current sensor arrays having drive windings with extended port...

Method of detecting widespread fatigue and cracks in a metal structure

Method for characterizing coating and substrates

Patents Applicationslast 30 patents

INTEGRATED SENSOR CARTRIDGE SYSTEM AND METHOD OF USE

Test Circuit With Sense Elements Having Associated And Unassociated...

PRIMARY WINDINGS HAVING MULTIPLE PARALLEL EXTENDED PORTIONS

Torque and load monitoring using magnetic sensor arrays

Primary windings having multiple parallel extended portions

Method for material property monitoring with perforated, surface mo...

Test circuit with drive windings and sense elements

Automated drawing tool and method for drawing a sensor layout

Surface mounted and scanning spatially periodic eddy-current sensor...

Material condition monitoring with multiple sensing modes

Fluid supports for sensors

Eddy current sensor arrays having drive windings with extended port...

Material condition assessment with spatially periodic field sensors

Fluid supports for sensors

Eddy current sensor arrays