Karen Maex

Person

Leuven, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Formation of metal-containing nano-particles for use as catalysts f...
- Patent number 8,470,709
- Issue date Jun 25, 2013
- IMEC
- Santiago Cruz Esconjauregui
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Synthesis of zeolite crystals and formation of carbon nanostructure...
- Patent number 7,790,600
- Issue date Sep 7, 2010
- IMEC
- Pierre Jacobs
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods for selective integration of airgaps and devices made by su...
- Patent number 7,319,274
- Issue date Jan 15, 2008
- Interuniversitair Microelektronica Centrum (IMEC v2w)
- Gerald Beyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Design method for essentially digital systems and components thereo...
- Patent number 7,124,377
- Issue date Oct 17, 2006
- Interniversitair Microelektronica Centrum (IMEC)
- Francky Catthoor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for selective integration of airgaps and devices made by su...
- Patent number 7,078,352
- Issue date Jul 18, 2006
- Interuniversitair Microelektronica Centrum (IMEC VZW)
- Gerald Beyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorinated hard mask for micropatterning of polymers
- Patent number 7,042,091
- Issue date May 9, 2006
- Imec VZW
- Mikhail Rodionovich Baklanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for selective integration of airgaps and devices made by su...
- Patent number 7,037,851
- Issue date May 2, 2006
- Interuniversitair Microelektronica Centrum (IMEC VZW)
- Jean Paul Gueneau de Mussy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for defect detection
- Patent number 7,016,028
- Issue date Mar 21, 2006
- Interuniversitair Microelektronica Centrum (IMEC)
- Frank Holsteyns
- G01 - MEASURING TESTING
Information Patent Grant
Method for bottomless deposition of barrier layers in integrated ci...
- Patent number 6,852,635
- Issue date Feb 8, 2005
- Interuniversitair Nizroelecmica
- Alessandra Satta
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Anisotropic etching of organic-containing insulating layers
- Patent number 6,844,266
- Issue date Jan 18, 2005
- Interuniversitair Microelektronica Centrum
- Karen Maex
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a semiconductor device
- Patent number 6,821,884
- Issue date Nov 23, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Serge Vanhaelemeersch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabrication and device for electromagnetic-shielding stru...
- Patent number 6,720,245
- Issue date Apr 13, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Michele Stucchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for characterization of porous films
- Patent number 6,662,631
- Issue date Dec 16, 2003
- Interuniversitair Microelektronica Centrum
- Mikhail Rodionovich Baklanov
- G01 - MEASURING TESTING
Information Patent Grant
Method for bottomless deposition of barrier layers in integrated ci...
- Patent number 6,664,192
- Issue date Dec 16, 2003
- Interuniversitair Microelektronica Centrum (IMEC)
- Alessandra Satta
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Metallization structure on a fluorine-containing dielectric and a m...
- Patent number 6,635,964
- Issue date Oct 21, 2003
- Interuniversitair Micro-Elektronica Centrum (IMEC vzw)
- Karen Maex
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to produce a porous oxygen-silicon layer
- Patent number 6,593,251
- Issue date Jul 15, 2003
- Interuniversitair Microelektronica Centrum (IMEC)
- Mikhail Baklanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving the quality of a metal layer deposited from a...
- Patent number 6,495,453
- Issue date Dec 17, 2002
- Interuniversitair Microelectronica Centrum
- Sywert H. Brongersma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for determining porosity
- Patent number 6,435,008
- Issue date Aug 20, 2002
- Interuniversitair Microelecktronica Centrum
- Mikhail Rodionovich Baklanov
- G01 - MEASURING TESTING
Information Patent Grant
Method for bottomless deposition of barrier layers in integrated ci...
- Patent number 6,391,785
- Issue date May 21, 2002
- Interuniversitair Microelektronica Centrum (IMEC)
- Alessandra Satta
- C30 - CRYSTAL GROWTH
Information Patent Grant
Metallization structure on a fluorine-containing dielectric and a m...
- Patent number 6,323,555
- Issue date Nov 27, 2001
- Interuniversitiar Microelektronica Centrum (IMEC VZW)
- Karen Maex
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for determining porosity
- Patent number 6,319,736
- Issue date Nov 20, 2001
- Interuniversitair Microelektronica Centrum (IMEC)
- Mikhail Rodionovich Baklanov
- G01 - MEASURING TESTING
Information Patent Grant
Etching process of CoSi2 layers
- Patent number 6,255,227
- Issue date Jul 3, 2001
- Interuniversitair Microelektronica Centrum
- Ricardo Alves Donaton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of filling an opening in an insulating layer
- Patent number 6,245,653
- Issue date Jun 12, 2001
- Applied Materials, Inc.
- Gerald Beyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorinated hard mask for micropatterning of polymers
- Patent number 6,245,489
- Issue date Jun 12, 2001
- Imec VZW
- Mikhail Rodionovich Baklanov
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Etching process of CoSi.sub.2 layers
- Patent number 6,153,484
- Issue date Nov 28, 2000
- IMEC vzw
- Ricardo Alves Donaton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CoSi.sub.2 salicide method
- Patent number 5,780,362
- Issue date Jul 14, 1998
- Qingfeng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for measuring temperature radiation using a pyrom...
- Patent number 5,271,084
- Issue date Dec 14, 1993
- Interuniversitair Micro Elektronica Centrum vzw
- Peter M. N. Vandenabeele
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FORMATION OF METAL-CONTAINING NANO-PARTICLES FOR USE AS CATALYSTS F...
- Publication number 20100285656
- Publication date Nov 11, 2010
- Interuniversitair Microelektronica Centrum (IMEC)
- Santiago Cruz Esconjauregui
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SYNTHESIS OF ZEOLITE CRYSTALS AND FORMATION OF CARBON NANOSTRUCTURE...
- Publication number 20090243103
- Publication date Oct 1, 2009
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Pierre Jacobs
- B82 - NANO-TECHNOLOGY
Information Patent Application
Methods for selective integration of airgaps and devices made by su...
- Publication number 20060177990
- Publication date Aug 10, 2006
- Interuniversitair Microelektronica Centrum (IMEC vzw)
- Gerald Beyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for selective integration of airgaps and devices made by su...
- Publication number 20060160353
- Publication date Jul 20, 2006
- Interuniversitair Microelektronica Centrum (IMEC vzw)
- Jean Paul Gueneau de Mussy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for selective integration of airgaps and devices made by su...
- Publication number 20050074960
- Publication date Apr 7, 2005
- Interuniversitair Microelektronica Centrum (IMEC vzw)
- Jean Paul Gueneau de Mussy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for selective integration of airgaps and devices made by su...
- Publication number 20050074961
- Publication date Apr 7, 2005
- Interuniversitair Microelektronica Centrum (IMEC vzw)
- Gerald Beyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabricating a semiconductor device
- Publication number 20050056941
- Publication date Mar 17, 2005
- Serge Vanhaelemeersch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabricating a semiconductor device
- Publication number 20050048782
- Publication date Mar 3, 2005
- Serge Vanhaelemeersch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Design method for essentially digital systems and components thereo...
- Publication number 20050039156
- Publication date Feb 17, 2005
- Francky Catthoor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for defect detection
- Publication number 20040246472
- Publication date Dec 9, 2004
- Interuniversitair Microelektronica Centrum (IMEC vzw)
- Frank Holsteyns
- G01 - MEASURING TESTING
Information Patent Application
Method for bottomless deposition of barrier layers in integrated ci...
- Publication number 20040121616
- Publication date Jun 24, 2004
- Alessandra Satta
- C30 - CRYSTAL GROWTH
Information Patent Application
Method to produce a porous oxygen-silicon layer
- Publication number 20030181066
- Publication date Sep 25, 2003
- Mikhail Baklanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Anisotropic etching of organic-containing insulating layers
- Publication number 20030162407
- Publication date Aug 28, 2003
- Karen Maex
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for characterization of porous films
- Publication number 20030094032
- Publication date May 22, 2003
- Mikhail Rodionovich Baklanov
- G01 - MEASURING TESTING
Information Patent Application
Method of fabricating a semiconductor device
- Publication number 20020173142
- Publication date Nov 21, 2002
- Serge Vanhaelemeersch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for bottomless deposition of barrier layers in integrated ci...
- Publication number 20020155722
- Publication date Oct 24, 2002
- Alessandra Satta
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method of forming polycrystalline CoSi2 salicide and products obtai...
- Publication number 20020151170
- Publication date Oct 17, 2002
- Karen Maex
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabrication and device for electromagnetic-shielding stru...
- Publication number 20020102835
- Publication date Aug 1, 2002
- Michele Stucchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Anisotropic etching of organic-containing insulating layers
- Publication number 20020076935
- Publication date Jun 20, 2002
- Karen Maex
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metallization structure on a fluorine-containing dielectric and a m...
- Publication number 20020066957
- Publication date Jun 6, 2002
- Karen Maex
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING POLYCRYSTALLINE COSI2 SALICIDE AND PRODUCTS OBTAI...
- Publication number 20020045344
- Publication date Apr 18, 2002
- QUINGFENG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to produce a porous oxygen-silicon layer
- Publication number 20020022378
- Publication date Feb 21, 2002
- Mikhail Baklanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for determining porosity
- Publication number 20010054306
- Publication date Dec 27, 2001
- Mikhail Rodionovich Baklanov
- G01 - MEASURING TESTING
Information Patent Application
Fluorinated hard mask for micropattering of polymers
- Publication number 20010026956
- Publication date Oct 4, 2001
- Mikhail Rodionovich Baklanov
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Formation of metal-containing nano-particles for use as catalysts f...

Synthesis of zeolite crystals and formation of carbon nanostructure...

Methods for selective integration of airgaps and devices made by su...

Design method for essentially digital systems and components thereo...

Methods for selective integration of airgaps and devices made by su...

Fluorinated hard mask for micropatterning of polymers

Methods for selective integration of airgaps and devices made by su...

Method and apparatus for defect detection

Method for bottomless deposition of barrier layers in integrated ci...

Anisotropic etching of organic-containing insulating layers

Method of fabricating a semiconductor device

Method of fabrication and device for electromagnetic-shielding stru...

Method and apparatus for characterization of porous films

Method for bottomless deposition of barrier layers in integrated ci...

Metallization structure on a fluorine-containing dielectric and a m...

Method to produce a porous oxygen-silicon layer

Method for improving the quality of a metal layer deposited from a...

Apparatus and method for determining porosity

Method for bottomless deposition of barrier layers in integrated ci...

Metallization structure on a fluorine-containing dielectric and a m...

Apparatus and method for determining porosity

Etching process of CoSi2 layers

Method of filling an opening in an insulating layer

Fluorinated hard mask for micropatterning of polymers

Etching process of CoSi.sub.2 layers

CoSi.sub.2 salicide method

Method and device for measuring temperature radiation using a pyrom...

Patents Applicationslast 30 patents

FORMATION OF METAL-CONTAINING NANO-PARTICLES FOR USE AS CATALYSTS F...

SYNTHESIS OF ZEOLITE CRYSTALS AND FORMATION OF CARBON NANOSTRUCTURE...

Methods for selective integration of airgaps and devices made by su...

Methods for selective integration of airgaps and devices made by su...

Methods for selective integration of airgaps and devices made by su...

Methods for selective integration of airgaps and devices made by su...

Method of fabricating a semiconductor device

Method of fabricating a semiconductor device

Design method for essentially digital systems and components thereo...

Method and apparatus for defect detection

Method for bottomless deposition of barrier layers in integrated ci...

Method to produce a porous oxygen-silicon layer

Anisotropic etching of organic-containing insulating layers

Method and apparatus for characterization of porous films

Method of fabricating a semiconductor device

Method for bottomless deposition of barrier layers in integrated ci...

Method of forming polycrystalline CoSi2 salicide and products obtai...

Method of fabrication and device for electromagnetic-shielding stru...

Anisotropic etching of organic-containing insulating layers

Metallization structure on a fluorine-containing dielectric and a m...

METHOD OF FORMING POLYCRYSTALLINE COSI2 SALICIDE AND PRODUCTS OBTAI...

Method to produce a porous oxygen-silicon layer

Apparatus and method for determining porosity

Fluorinated hard mask for micropattering of polymers