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Karl A. Hanold
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Huntington Beach, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Chemical vaporization and detection of compounds having low volatility
Patent number
10,317,387
Issue date
Jun 11, 2019
Rapiscan Systems, Inc.
Andrey N. Vilkov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Chemical vaporization and detection of compounds having low volatility
Patent number
9,683,981
Issue date
Jun 20, 2017
Morpho Detection, LLC
Andrey N. Vilkov
G01 - MEASURING TESTING
Information
Patent Grant
Hand-held trace particle sampling system and method of operating th...
Patent number
9,354,153
Issue date
May 31, 2016
Morpho Detection, LLC
Jack A. Syage
G01 - MEASURING TESTING
Information
Patent Grant
Method of simultaneously screening a plurality of people
Patent number
8,614,582
Issue date
Dec 24, 2013
Morpho Detection, Inc.
Jack A. Syage
G01 - MEASURING TESTING
Information
Patent Grant
High speed, multiple mass spectrometry for ion sequencing
Patent number
7,476,854
Issue date
Jan 13, 2009
Syagen Technology
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple trace portal detection systems
Patent number
7,401,498
Issue date
Jul 22, 2008
Syagen Technology
Jack A. Syage
G01 - MEASURING TESTING
Information
Patent Grant
Ion sampling for APPI mass spectrometry
Patent number
7,309,859
Issue date
Dec 18, 2007
Agilent Technologies, Inc.
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Grant
Interfaces for a photoionization mass spectrometer
Patent number
7,161,144
Issue date
Jan 9, 2007
Syagen Technology
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Interfaces for a photoionization mass spectrometer
Patent number
7,119,342
Issue date
Oct 10, 2006
Syagen Technology
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple ion sources involving atmospheric pressure photoionization
Patent number
7,109,476
Issue date
Sep 19, 2006
Syagen Technology
Karl A. Hanold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion sampling for APPI mass spectrometry
Patent number
7,002,146
Issue date
Feb 21, 2006
Agilent Technologies, Inc.
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Grant
Atmospheric pressure photoionizer for mass spectrometry
Patent number
6,630,664
Issue date
Oct 7, 2003
Syagen Technology
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photoionization mass spectrometer
Patent number
6,329,653
Issue date
Dec 11, 2001
Syagen Technology
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Rapid response mass spectrometer system
Patent number
6,326,615
Issue date
Dec 4, 2001
Syagen Technology
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photoionization mass spectrometer
Patent number
6,211,516
Issue date
Apr 3, 2001
Syagen Technology
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Chemical Vaporization and Detection of Compounds Having Low Volatility
Publication number
20190271679
Publication date
Sep 5, 2019
Rapiscan Systems, Inc.
Andrey N. Vilkov
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL VAPORIZATION AND DETECTION OF COMPOUNDS HAVING LOW VOLATILITY
Publication number
20170261484
Publication date
Sep 14, 2017
Morpho Detection, LLC
Andrey N. Vilkov
G01 - MEASURING TESTING
Information
Patent Application
HAND-HELD TRACE PARTICLE SAMPLING SYSTEM AND METHOD OF OPERATING TH...
Publication number
20150268147
Publication date
Sep 24, 2015
MORPHO DETECTION, INC.
Jack A. Syage
G01 - MEASURING TESTING
Information
Patent Application
Trace explosives personnel screening system
Publication number
20110181288
Publication date
Jul 28, 2011
Jack A. Syage
G01 - MEASURING TESTING
Information
Patent Application
Interfaces for a photoionization mass spectrometer
Publication number
20070138387
Publication date
Jun 21, 2007
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multiple trace portal detection systems
Publication number
20060196249
Publication date
Sep 7, 2006
Jack A. Syage
G01 - MEASURING TESTING
Information
Patent Application
Ion sampling for APPI mass spectrometry
Publication number
20060076505
Publication date
Apr 13, 2006
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Application
High speed, multiple mass spectrometry for ion sequencing
Publication number
20050242278
Publication date
Nov 3, 2005
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Interfaces for a photoionization mass spectrometer
Publication number
20050139764
Publication date
Jun 30, 2005
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion sampling for APPI mass spectrometry
Publication number
20050045833
Publication date
Mar 3, 2005
Steven M. Fischer
G01 - MEASURING TESTING
Information
Patent Application
Multiple ion sources involving atmospheric pressure photoionization
Publication number
20040119009
Publication date
Jun 24, 2004
Karl A. Hanold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Interfaces for a photoionization mass spectrometer
Publication number
20030155500
Publication date
Aug 21, 2003
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Photoionization mass spectrometer
Publication number
20030075679
Publication date
Apr 24, 2003
Jack A. Syage
H01 - BASIC ELECTRIC ELEMENTS