Katsuhiro Kuroda

Person

Hachiouji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,952,074
- Issue date May 31, 2011
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,417,444
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Hydraulic pressure actuator and continuous manual athletic device u...
- Patent number 7,299,741
- Issue date Nov 27, 2007
- Hitachi Medical Corporation
- Kazuaki Hiramatsu
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Grant
Patterned wafer inspection method and apparatus therefor
- Patent number 7,242,015
- Issue date Jul 10, 2007
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,026,830
- Issue date Apr 11, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Patterned wafer inspection method and apparatus therefor
- Patent number 6,979,823
- Issue date Dec 27, 2005
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Patterned wafer inspection method and apparatus therefor
- Patent number 6,797,954
- Issue date Sep 28, 2004
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,559,663
- Issue date May 6, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Substrate temperature control system and method for controlling tem...
- Patent number 6,518,548
- Issue date Feb 11, 2003
- Hitachi, Ltd.
- Masakazu Sugaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrasonic medical treating device
- Patent number 6,511,428
- Issue date Jan 28, 2003
- Hitachi, Ltd.
- Takashi Azuma
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern usin...
- Patent number 6,476,390
- Issue date Nov 5, 2002
- Hitachi, Ltd.
- Hisaya Murakoshi
- G01 - MEASURING TESTING
Information Patent Grant
Substrate temperature control system and method for controlling tem...
- Patent number 6,394,797
- Issue date May 28, 2002
- Hitachi, Ltd.
- Masakazu Sugaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,329,826
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,172,363
- Issue date Jan 9, 2001
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for dimension measuring by...
- Patent number 6,114,695
- Issue date Sep 5, 2000
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 6,051,834
- Issue date Apr 18, 2000
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and method for dimension measuring by...
- Patent number 5,969,357
- Issue date Oct 19, 1999
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and electron microscopy method
- Patent number 5,936,244
- Issue date Aug 10, 1999
- Hitachi, Ltd.
- Yusuke Yajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for X-ray analyses
- Patent number 5,877,498
- Issue date Mar 2, 1999
- Hitachi, Ltd.
- Aritoshi Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 5,866,905
- Issue date Feb 2, 1999
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for dimension measuring by...
- Patent number 5,866,904
- Issue date Feb 2, 1999
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Cathode having a reservoir and method of manufacturing the same
- Patent number 5,838,096
- Issue date Nov 17, 1998
- Hitachi, Ltd.
- Hiroyuki Shinada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source and its manufacturing method and electron beam...
- Patent number 5,811,819
- Issue date Sep 22, 1998
- Hitachi, Ltd.
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cathode, electron beam emission apparatus using the same, and metho...
- Patent number 5,763,880
- Issue date Jun 9, 1998
- Hitachi, Ltd.
- Hidetoshi Nisiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image enhancement
- Patent number 5,681,112
- Issue date Oct 28, 1997
- Hitachi, Ltd.
- Katsuhiro Kuroda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus for measuring magnetic field
- Patent number 5,666,053
- Issue date Sep 9, 1997
- Hitachi, Ltd.
- Hiroshi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Schottky emission cathode and a method of stabilizing the same
- Patent number 5,616,926
- Issue date Apr 1, 1997
- Hitachi, Ltd.
- Hiroyuki Shinada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for x-ray analyses
- Patent number 5,594,246
- Issue date Jan 14, 1997
- Hitachi, Ltd.
- Yoshimi Sudo
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for dimension measuring by...
- Patent number 5,594,245
- Issue date Jan 14, 1997
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Microtron electron accelerator
- Patent number 5,561,697
- Issue date Oct 1, 1996
- Hitachi Medical
- Atsuko Takafuji
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN
- Publication number 20080302964
- Publication date Dec 11, 2008
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Hydraulic pressure actuator and continuous manual athletic device u...
- Publication number 20060249017
- Publication date Nov 9, 2006
- Kazuaki Hiramatsu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20060043982
- Publication date Mar 2, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Patterned wafer inspection method and apparatus therefor
- Publication number 20060017014
- Publication date Jan 26, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Patterned wafer inspection method and apparatus therefor
- Publication number 20040222377
- Publication date Nov 11, 2004
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20030169060
- Publication date Sep 11, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Patterned wafer inspection method and apparatus therefor
- Publication number 20030164460
- Publication date Sep 4, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED WAFER INSPECTION METHOD AND APPARATUS THEREFOR
- Publication number 20020117635
- Publication date Aug 29, 2002
- HIROYUKI SHINADA
- G01 - MEASURING TESTING
Information Patent Application
Substrate temperature control system and method for controlling tem...
- Publication number 20020113056
- Publication date Aug 22, 2002
- Hitachi, Ltd.
- Masakazu Sugaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20020027440
- Publication date Mar 7, 2002
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING

Katsuhiro Kuroda

Person

Patents Grantslast 30 patents

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Hydraulic pressure actuator and continuous manual athletic device u...

Patterned wafer inspection method and apparatus therefor

Method and apparatus for inspecting integrated circuit pattern

Patterned wafer inspection method and apparatus therefor

Patterned wafer inspection method and apparatus therefor

Method and apparatus for inspecting integrated circuit pattern

Substrate temperature control system and method for controlling tem...

Ultrasonic medical treating device

Method and apparatus for inspecting integrated circuit pattern usin...

Substrate temperature control system and method for controlling tem...

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Scanning electron microscope and method for dimension measuring by...

Electron microscope

Scanning electron microscope and method for dimension measuring by...

Electron microscope and electron microscopy method

Method and apparatus for X-ray analyses

Electron microscope

Scanning electron microscope and method for dimension measuring by...

Cathode having a reservoir and method of manufacturing the same

Electron beam source and its manufacturing method and electron beam...

Cathode, electron beam emission apparatus using the same, and metho...

Image enhancement

Charged particle beam apparatus for measuring magnetic field

Schottky emission cathode and a method of stabilizing the same

Method and apparatus for x-ray analyses

Scanning electron microscope and method for dimension measuring by...

Microtron electron accelerator

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN

Hydraulic pressure actuator and continuous manual athletic device u...

Method and apparatus for inspecting integrated circuit pattern

Patterned wafer inspection method and apparatus therefor

Patterned wafer inspection method and apparatus therefor

Method and apparatus for inspecting integrated circuit pattern

Patterned wafer inspection method and apparatus therefor

PATTERNED WAFER INSPECTION METHOD AND APPARATUS THEREFOR

Substrate temperature control system and method for controlling tem...

Method and apparatus for inspecting integrated circuit pattern