Katsunori Hirano

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and image processing method in charged...
- Patent number 10,522,325
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Masato Kamio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing device, semiconductor external view inspection devi...
- Patent number 9,489,324
- Issue date Nov 8, 2016
- Hitachi High-Technologies Corporation
- Yuichi Sakurai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus
- Patent number 8,304,726
- Issue date Nov 6, 2012
- Hitachi High-Technologies Corporation
- Katsunori Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 7,952,072
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Katsunori Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Method of diagnosing circuit board, circuit board, and CPU unit
- Patent number 7,870,428
- Issue date Jan 11, 2011
- Hitachi, Ltd.
- Katsunori Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
DRAM stacked package, DIMM, and semiconductor manufacturing method
- Patent number 7,546,506
- Issue date Jun 9, 2009
- Hitachi, Ltd.
- Yuji Sonoda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor testing equipment, testing method for semiconductor,...
- Patent number 7,137,055
- Issue date Nov 14, 2006
- Hitachi, Ltd.
- Katsunori Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device, and the method of testing or making of the se...
- Patent number 7,114,110
- Issue date Sep 26, 2006
- Renesas Technology Corp.
- Shuji Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical modules and methods of making the optical modules
- Patent number 6,979,810
- Issue date Dec 27, 2005
- OpNext Japan, Inc.
- Norio Chujo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20200066484
- Publication date Feb 27, 2020
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20180301316
- Publication date Oct 18, 2018
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING DEVICE, SEMICONDUCTOR EXTERNAL VIEW INSPECTION DEVI...
- Publication number 20140372656
- Publication date Dec 18, 2014
- Yuichi Sakurai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER TESTING APPARATUS
- Publication number 20110279143
- Publication date Nov 17, 2011
- Tadanobu Toba
- G01 - MEASURING TESTING
Information Patent Application
Test Apparatus
- Publication number 20110180708
- Publication date Jul 28, 2011
- Katsunori HIRANO
- G01 - MEASURING TESTING
Information Patent Application
Test Apparatus
- Publication number 20090072138
- Publication date Mar 19, 2009
- Katsunori HIRANO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS DIAGNOSING METHOD, APPARATUS DIAGNOSIS MODULE, AND APPARA...
- Publication number 20080244329
- Publication date Oct 2, 2008
- Kenichi SHINBO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DIAGNOSING CIRCUIT BOARD, CIRCUIT BOARD, AND CPU UNIT
- Publication number 20080010533
- Publication date Jan 10, 2008
- KATSUNORI HIRANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DRAM stacked package, DIMM, and semiconductor manufacturing method
- Publication number 20060239055
- Publication date Oct 26, 2006
- Yuji Sonoda
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor testing equipment, testing method for semiconductor,...
- Publication number 20050149803
- Publication date Jul 7, 2005
- Katsunori Hirano
- G01 - MEASURING TESTING
Information Patent Application
Optical modules and methods of making the optical modules
- Publication number 20040067068
- Publication date Apr 8, 2004
- Norio Chujo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Semiconductor device, and the method of testing or making of the se...
- Publication number 20030210069
- Publication date Nov 13, 2003
- Shuji Kikuchi
- G01 - MEASURING TESTING

Katsunori Hirano

Person

Patents Grantslast 30 patents

Charged particle beam device and image processing method in charged...

Data processing device, semiconductor external view inspection devi...

Test apparatus

Test apparatus

Method of diagnosing circuit board, circuit board, and CPU unit

DRAM stacked package, DIMM, and semiconductor manufacturing method

Semiconductor testing equipment, testing method for semiconductor,...

Semiconductor device, and the method of testing or making of the se...

Optical modules and methods of making the optical modules

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...

CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...

DATA PROCESSING DEVICE, SEMICONDUCTOR EXTERNAL VIEW INSPECTION DEVI...

SEMICONDUCTOR WAFER TESTING APPARATUS

Test Apparatus

Test Apparatus

APPARATUS DIAGNOSING METHOD, APPARATUS DIAGNOSIS MODULE, AND APPARA...

METHOD OF DIAGNOSING CIRCUIT BOARD, CIRCUIT BOARD, AND CPU UNIT

DRAM stacked package, DIMM, and semiconductor manufacturing method

Semiconductor testing equipment, testing method for semiconductor,...

Optical modules and methods of making the optical modules

Semiconductor device, and the method of testing or making of the se...