Kazufumi Watanabe

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-layer metal stack for active pixel region and black pixel reg...
- Patent number 12,080,740
- Issue date Sep 3, 2024
- OmniVision Technologies, Inc.
- Kazufumi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor with multi-pixel detector and partial isolation structure
- Patent number 11,967,602
- Issue date Apr 23, 2024
- OmniVision Technologies, Inc.
- Chun-Yung Ai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Negatively biased isolation structures for pixel devices
- Patent number 11,502,120
- Issue date Nov 15, 2022
- OmniVision Technologies, Inc.
- Kazufumi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensors with phase detection auto focus pixels
- Patent number 10,848,697
- Issue date Nov 24, 2020
- OmniVision Technologies, Inc.
- Kazufumi Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Source follower device for enhanced image sensor performance
- Patent number 10,304,882
- Issue date May 28, 2019
- OmniVision Technologies, Inc.
- Kazufumi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low noise CMOS image sensor by stack architecture
- Patent number 10,218,924
- Issue date Feb 26, 2019
- OmniVision Technologies, Inc.
- Sohei Manabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross talk reduction for high dynamic range image sensors
- Patent number 10,204,951
- Issue date Feb 12, 2019
- OmniVision Technologies, Inc.
- Kazufumi Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Cross talk reduction for high dynamic range image sensors
- Patent number 10,181,490
- Issue date Jan 15, 2019
- OmniVision Technologies, Inc.
- Kazufumi Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dual photodiode for phase detection autofocus
- Patent number 10,073,239
- Issue date Sep 11, 2018
- OmniVision Technologies, Inc.
- Young Woo Jung
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE SENSOR WITH SHARED GATE ARCHITECTURE FOR METAL LAYER REDUCTION
- Publication number 20240405039
- Publication date Dec 5, 2024
- OMNIVISION TECHNOLOGIES, INC.
- Yaxin Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACKSIDE DEEP TRENCH ISOLATION STRUCTURE FOR LEAKAGE SUPPRESSION
- Publication number 20240387567
- Publication date Nov 21, 2024
- OMNIVISION TECHNOLOGIES, INC.
- Chun-Yung Ai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STACKED SEMICONDUCTOR DEVICE WITH CONNECTION PAD DISPOSED BETWEEN C...
- Publication number 20240355858
- Publication date Oct 24, 2024
- OMNIVISION TECHNOLOGIES, INC.
- Takayuki Goto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STACKED SEMICONDUCTOR DEVICE WITH CONNECTION PAD SHIELD
- Publication number 20240355765
- Publication date Oct 24, 2024
- OMNIVISION TECHNOLOGIES, INC.
- Takayuki Goto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR WITH VARYING THICKNESS DIELECTRIC LAYER
- Publication number 20240332329
- Publication date Oct 3, 2024
- OMNIVISION TECHNOLOGIES, INC.
- Kazufumi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-LAYER METAL STACK FOR ACTIVE PIXEL REGION AND BLACK PIXEL REG...
- Publication number 20230207592
- Publication date Jun 29, 2023
- OMNIVISION TECHNOLOGIES, INC.
- Kazufumi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR WITH MULTI-PIXEL DETECTOR AND PARTIAL ISOLATION STRUCTURE
- Publication number 20210391363
- Publication date Dec 16, 2021
- OMNIVISION TECHNOLOGIES, INC.
- Chun-Yung Ai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NEGATIVELY BIASED ISOLATION STRUCTURES FOR PIXEL DEVICES
- Publication number 20210193703
- Publication date Jun 24, 2021
- OMNIVISION TECHNOLOGIES, INC.
- Kazufumi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSORS WITH PHASE DETECTION AUTO FOCUS PIXELS
- Publication number 20200059618
- Publication date Feb 20, 2020
- OMNIVISION TECHNOLOGIES, INC.
- Kazufumi Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SOURCE FOLLOWER DEVICE FOR ENHANCED IMAGE SENSOR PERFORMANCE
- Publication number 20190165016
- Publication date May 30, 2019
- OMNIVISION TECHNOLOGIES, INC.
- Kazufumi Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LOW NOISE CMOS IMAGE SENSOR BY STACK ARCHITECTURE
- Publication number 20180302579
- Publication date Oct 18, 2018
- OMNIVISION TECHNOLOGIES, INC.
- Sohei Manabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CROSS TALK REDUCTION FOR HIGH DYNAMIC RANGE IMAGE SENSORS
- Publication number 20180286897
- Publication date Oct 4, 2018
- OMNIVISION TECHNOLOGIES, INC.
- Kazufumi Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CROSS TALK REDUCTION FOR HIGH DYNAMIC RANGE IMAGE SENSORS
- Publication number 20180286895
- Publication date Oct 4, 2018
- OMNIVISION TECHNOLOGIES, INC.
- Kazufumi Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Kazufumi Watanabe

Person

Patents Grantslast 30 patents

Multi-layer metal stack for active pixel region and black pixel reg...

Image sensor with multi-pixel detector and partial isolation structure

Negatively biased isolation structures for pixel devices

Image sensors with phase detection auto focus pixels

Source follower device for enhanced image sensor performance

Low noise CMOS image sensor by stack architecture

Cross talk reduction for high dynamic range image sensors

Cross talk reduction for high dynamic range image sensors

Dual photodiode for phase detection autofocus

Patents Applicationslast 30 patents

IMAGE SENSOR WITH SHARED GATE ARCHITECTURE FOR METAL LAYER REDUCTION

BACKSIDE DEEP TRENCH ISOLATION STRUCTURE FOR LEAKAGE SUPPRESSION

STACKED SEMICONDUCTOR DEVICE WITH CONNECTION PAD DISPOSED BETWEEN C...

STACKED SEMICONDUCTOR DEVICE WITH CONNECTION PAD SHIELD

IMAGE SENSOR WITH VARYING THICKNESS DIELECTRIC LAYER

MULTI-LAYER METAL STACK FOR ACTIVE PIXEL REGION AND BLACK PIXEL REG...

IMAGE SENSOR WITH MULTI-PIXEL DETECTOR AND PARTIAL ISOLATION STRUCTURE

NEGATIVELY BIASED ISOLATION STRUCTURES FOR PIXEL DEVICES

IMAGE SENSORS WITH PHASE DETECTION AUTO FOCUS PIXELS

SOURCE FOLLOWER DEVICE FOR ENHANCED IMAGE SENSOR PERFORMANCE

LOW NOISE CMOS IMAGE SENSOR BY STACK ARCHITECTURE

CROSS TALK REDUCTION FOR HIGH DYNAMIC RANGE IMAGE SENSORS

CROSS TALK REDUCTION FOR HIGH DYNAMIC RANGE IMAGE SENSORS