Kazuhiko HIDAKA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus, control apparatus, and control method
- Patent number 12,078,478
- Issue date Sep 3, 2024
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lens substrate stacking position calculating apparatus and program
- Patent number 11,435,560
- Issue date Sep 6, 2022
- Mitutoyo Corporation
- Kazuhiko Hidaka
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 11,092,422
- Issue date Aug 17, 2021
- Mitutoyo Corporation
- Takeshi Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position detection configuration for indicating a measure...
- Patent number 10,914,570
- Issue date Feb 9, 2021
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Form measuring apparatus
- Patent number 10,900,765
- Issue date Jan 26, 2021
- Mitutoyo Corporation
- Atsushi Shimaoka
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring unit and method for recognizing measuring probe
- Patent number 10,788,312
- Issue date Sep 29, 2020
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring probe
- Patent number 10,422,628
- Issue date Sep 24, 2019
- Mitutoyo Corporation
- Atsushi Shimaoka
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe and measuring device
- Patent number 10,415,947
- Issue date Sep 17, 2019
- Mitutoyo Corporation
- Hideyuki Arai
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe and measuring probe system
- Patent number 10,161,743
- Issue date Dec 25, 2018
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Probe measuring force adjuster
- Patent number 10,113,931
- Issue date Oct 30, 2018
- Mitutoyo Corporation
- Hideyuki Arai
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe and measuring probe system
- Patent number 10,001,358
- Issue date Jun 19, 2018
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe
- Patent number 9,869,537
- Issue date Jan 16, 2018
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe for measuring a three-dimensional shape of an objec...
- Patent number 9,810,529
- Issue date Nov 7, 2017
- MITOTOYO CORPORATION
- Atsushi Shimaoka
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe
- Patent number 9,618,312
- Issue date Apr 11, 2017
- Mitutoyo Corporation
- Atsushi Shimaoka
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe
- Patent number 9,605,943
- Issue date Mar 28, 2017
- Mitutoyo Corporation
- Atsushi Shimaoka
- G01 - MEASURING TESTING
Information Patent Grant
Tactile probing system
- Patent number 9,528,824
- Issue date Dec 27, 2016
- Mitutoyo Corporation
- Edwin Bos
- G01 - MEASURING TESTING
Information Patent Grant
Form measuring machine
- Patent number 9,518,811
- Issue date Dec 13, 2016
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Lever type measuring machine
- Patent number 9,303,968
- Issue date Apr 5, 2016
- Mitutoyo Corporation
- Yasunori Mori
- G01 - MEASURING TESTING
Information Patent Grant
Form measuring instrument
- Patent number 9,285,201
- Issue date Mar 15, 2016
- Mitutoyo Corporation
- Sadayuki Matsumiya
- G01 - MEASURING TESTING
Information Patent Grant
Lever head
- Patent number 9,163,917
- Issue date Oct 20, 2015
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Image sensor, attitude detector, contact probe, and multi-sensing p...
- Patent number 9,062,958
- Issue date Jun 23, 2015
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength detector and contact probe using it
- Patent number 8,665,435
- Issue date Mar 4, 2014
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Surface profile measuring instrument and surface profile measuring...
- Patent number 7,100,429
- Issue date Sep 5, 2006
- Mitutoyo Corporation
- Kaoru Matsuki
- G01 - MEASURING TESTING
Information Patent Grant
Vibration detecting system of resilient body and vibrating contact...
- Patent number 6,848,315
- Issue date Feb 1, 2005
- Mitutoyo Corporation
- Kaoru Matsuki
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic geometry measuring device
- Patent number 6,604,295
- Issue date Aug 12, 2003
- Mitutoyo Corporation
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Touch signal probe
- Patent number 6,516,529
- Issue date Feb 11, 2003
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Vibration-type contact detection sensor
- Patent number 6,516,669
- Issue date Feb 11, 2003
- Mitutoyo Corporation
- Kaoru Matsuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Surface configuration measuring method
- Patent number 6,484,571
- Issue date Nov 26, 2002
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Movement control mechanism of contact-type vibrating probe
- Patent number 6,457,366
- Issue date Oct 1, 2002
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Touch signal probe
- Patent number 6,327,789
- Issue date Dec 11, 2001
- Mitutoyo Corp.
- Kunitoshi Nishimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC MEASURING SYSTEM AND CONTROL METHOD FOR AUTOMATIC MEASURI...
- Publication number 20240345116
- Publication date Oct 17, 2024
- MITUTOYO CORPORATION
- Seiji SASAKI
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING MACHINE AND IN-LINE MEASUREMENT SYSTEM
- Publication number 20240302159
- Publication date Sep 12, 2024
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AND MEASUREMENT METHOD
- Publication number 20240240926
- Publication date Jul 18, 2024
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
POSITION DETECTION SYSTEM, POSITION DETECTION METHOD, AND THREE-DIM...
- Publication number 20220383642
- Publication date Dec 1, 2022
- MITUTOYO CORPORATION
- Tomohiro KIIRE
- B60 - VEHICLES IN GENERAL
Information Patent Application
COORDINATE MEASURING APPARATUS
- Publication number 20220290971
- Publication date Sep 15, 2022
- MITUTOYO CORPORATION
- Tsutomu ICHIMURA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, CONTROL APPARATUS, AND CONTROL METHOD
- Publication number 20220155065
- Publication date May 19, 2022
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LENS SUBSTRATE STACKING POSITION CALCULATING APPARATUS AND PROGRAM
- Publication number 20200271901
- Publication date Aug 27, 2020
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...
- Publication number 20200141717
- Publication date May 7, 2020
- MITUTOYO CORPORATION
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20190390947
- Publication date Dec 26, 2019
- MITUTOYO CORPORATION
- Takeshi KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
FORM MEASURING APPARATUS
- Publication number 20190170493
- Publication date Jun 6, 2019
- MITUTOYO CORPORATION
- Atsushi SHIMAOKA
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING UNIT AND METHOD FOR RECOGNIZING MEASURING PROBE
- Publication number 20180372480
- Publication date Dec 27, 2018
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT PROBE AND MEASURING DEVICE
- Publication number 20180023936
- Publication date Jan 25, 2018
- MITUTOYO CORPORATION
- Hideyuki ARAI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE AND MEASURING PROBE SYSTEM
- Publication number 20170284794
- Publication date Oct 5, 2017
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20170146336
- Publication date May 25, 2017
- MITUTOYO CORPORATION
- Atsushi SHIMAOKA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE AND MEASURING PROBE SYSTEM
- Publication number 20170097221
- Publication date Apr 6, 2017
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
PROBE MEASURING FORCE ADJUSTER
- Publication number 20160299028
- Publication date Oct 13, 2016
- MITUTOYO CORPORATION
- Hideyuki ARAI
- G01 - MEASURING TESTING
Information Patent Application
TACTILE PROBING SYSTEM
- Publication number 20160290797
- Publication date Oct 6, 2016
- MITUTOYO CORPORATION
- Edwin BOS
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20160258744
- Publication date Sep 8, 2016
- MITUTOYO CORPORATION
- Atsushi SHIMAOKA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20160258733
- Publication date Sep 8, 2016
- MITUTOYO CORPORATION
- Atsushi SHIMAOKA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20160258738
- Publication date Sep 8, 2016
- MITUTOYO CORPORATION
- Atsushi SHIMAOKA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE
- Publication number 20160258732
- Publication date Sep 8, 2016
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
FORM MEASURING MACHINE
- Publication number 20150292851
- Publication date Oct 15, 2015
- MITUTOYO CORPORATION
- Takeshi YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
LEVER TYPE MEASURING MACHINE
- Publication number 20150075020
- Publication date Mar 19, 2015
- MITUTOYO CORPORATION
- Yasunori MORI
- G01 - MEASURING TESTING
Information Patent Application
FORM MEASURING INSTRUMENT
- Publication number 20140237834
- Publication date Aug 28, 2014
- Mitutoyo Corporation
- Sadayuki Matsumiya
- G01 - MEASURING TESTING
Information Patent Application
LEVER HEAD
- Publication number 20140109423
- Publication date Apr 24, 2014
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH DETECTOR AND CONTACT PROBE USING IT
- Publication number 20130176561
- Publication date Jul 11, 2013
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR, ATTITUDE DETECTOR, CONTACT PROBE, AND MULTI-SENSING P...
- Publication number 20130176575
- Publication date Jul 11, 2013
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Application
Surface profile measuring instrument and surface profile measuring...
- Publication number 20050076522
- Publication date Apr 14, 2005
- Mitutoyo Corporation
- Kaoru Matsuki
- G01 - MEASURING TESTING
Information Patent Application
Microscopic geometry measuring device
- Publication number 20020124427
- Publication date Sep 12, 2002
- Mitutoyo Corporation
- Kunitoshi Nishimura
- B82 - NANO-TECHNOLOGY
Information Patent Application
Vibration detecting system of resilient body and vibrating contact...
- Publication number 20020108446
- Publication date Aug 15, 2002
- Mitutoyo Corporation
- Kaoru Matsuki
- G01 - MEASURING TESTING

Kazuhiko HIDAKA

Person

Patents Grantslast 30 patents

Measurement apparatus, control apparatus, and control method

Lens substrate stacking position calculating apparatus and program

Measuring apparatus and measuring method

Inductive position detection configuration for indicating a measure...

Form measuring apparatus

Coordinate measuring unit and method for recognizing measuring probe

Measuring probe

Measurement probe and measuring device

Measuring probe and measuring probe system

Probe measuring force adjuster

Measuring probe and measuring probe system

Contact probe

Measuring probe for measuring a three-dimensional shape of an objec...

Measuring probe

Measuring probe

Tactile probing system

Form measuring machine

Lever type measuring machine

Form measuring instrument

Lever head

Image sensor, attitude detector, contact probe, and multi-sensing p...

Wavelength detector and contact probe using it

Surface profile measuring instrument and surface profile measuring...

Vibration detecting system of resilient body and vibrating contact...

Microscopic geometry measuring device

Touch signal probe

Vibration-type contact detection sensor

Surface configuration measuring method

Movement control mechanism of contact-type vibrating probe

Touch signal probe

Patents Applicationslast 30 patents

AUTOMATIC MEASURING SYSTEM AND CONTROL METHOD FOR AUTOMATIC MEASURI...

COORDINATE MEASURING MACHINE AND IN-LINE MEASUREMENT SYSTEM

MEASURING SYSTEM AND MEASUREMENT METHOD

POSITION DETECTION SYSTEM, POSITION DETECTION METHOD, AND THREE-DIM...

COORDINATE MEASURING APPARATUS

MEASUREMENT APPARATUS, CONTROL APPARATUS, AND CONTROL METHOD

LENS SUBSTRATE STACKING POSITION CALCULATING APPARATUS AND PROGRAM

INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...

MEASURING APPARATUS AND MEASURING METHOD

FORM MEASURING APPARATUS

COORDINATE MEASURING UNIT AND METHOD FOR RECOGNIZING MEASURING PROBE

MEASUREMENT PROBE AND MEASURING DEVICE

MEASURING PROBE AND MEASURING PROBE SYSTEM

MEASURING PROBE

MEASURING PROBE AND MEASURING PROBE SYSTEM

PROBE MEASURING FORCE ADJUSTER

TACTILE PROBING SYSTEM

MEASURING PROBE

MEASURING PROBE

MEASURING PROBE

CONTACT PROBE

FORM MEASURING MACHINE

LEVER TYPE MEASURING MACHINE

FORM MEASURING INSTRUMENT

LEVER HEAD

WAVELENGTH DETECTOR AND CONTACT PROBE USING IT

IMAGE SENSOR, ATTITUDE DETECTOR, CONTACT PROBE, AND MULTI-SENSING P...

Surface profile measuring instrument and surface profile measuring...

Microscopic geometry measuring device

Vibration detecting system of resilient body and vibrating contact...