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Kazuhiko Matsuoka
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Gunma-ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for analyzing the state of generation of forei...
Patent number
7,177,020
Issue date
Feb 13, 2007
Renesas Technology Corp.
Hiroshi Morioka
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for analyzing the state of generation of forei...
Patent number
6,894,773
Issue date
May 17, 2005
Renesas Technology Corp.
Hiroshi Morioka
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device producing method, system for carrying out the...
Patent number
6,650,409
Issue date
Nov 18, 2003
Hitachi, Ltd.
Minori Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection data analyzing system
Patent number
6,628,817
Issue date
Sep 30, 2003
Hitachi, Ltd.
Seiji Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Inspection data analyzing system
Patent number
6,529,619
Issue date
Mar 4, 2003
Hitachi, Ltd.
Seiji Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Inspection data analyzing system
Patent number
6,339,653
Issue date
Jan 15, 2002
Hitachi, Ltd.
Seiji Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Inspection data analyzing system
Patent number
6,330,352
Issue date
Dec 11, 2001
Hitachi, Ltd.
Seiji Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and method using separate processors for processi...
Patent number
6,185,322
Issue date
Feb 6, 2001
Hitachi, Ltd.
Seiji Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Inspection data analyzing system
Patent number
5,841,893
Issue date
Nov 24, 1998
Hitachi, Ltd.
Seiji Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for analyzing the state of generation of forei...
Patent number
5,463,459
Issue date
Oct 31, 1995
Hitachi, Ltd.
Hiroshi Morioka
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Impurity detector
Patent number
4,670,137
Issue date
Jun 2, 1987
Hitachi, Ltd.
Yasuo Koseki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for analyzing the state of generation of forei...
Publication number
20050206887
Publication date
Sep 22, 2005
Hiroshi Morioka
G01 - MEASURING TESTING
Information
Patent Application
Inspection data analyzing system
Publication number
20020034326
Publication date
Mar 21, 2002
Seiji Ishikawa
G01 - MEASURING TESTING
Information
Patent Application
Inspection data analyzing system
Publication number
20010038708
Publication date
Nov 8, 2001
Seiji Ishikawa
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for analyzing the state of generation of forei...
Publication number
20010021015
Publication date
Sep 13, 2001
Hiroshi Morioka
B82 - NANO-TECHNOLOGY
Information
Patent Application
Inspection data analyzing system
Publication number
20010001015
Publication date
May 10, 2001
Seiji Ishikawa
G01 - MEASURING TESTING