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Kazuhiro Nojima
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Yokkaichi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor storage device with insulating layers for etching stop
Patent number
11,887,926
Issue date
Jan 30, 2024
Kioxia Corporation
Hideto Takekida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Misalignment measuring apparatus and misalignment measuring method
Patent number
11,776,112
Issue date
Oct 3, 2023
Kioxia Corporation
Yuki Watanabe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Vertical memory device with improved manufacturing yield
Patent number
11,631,687
Issue date
Apr 18, 2023
Kioxia Corporation
Yusaku Suzuki
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor storage device and method of manufacturing the same
Patent number
11,605,646
Issue date
Mar 14, 2023
Kioxia Corporation
Kazuhiro Nojima
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
11,594,514
Issue date
Feb 28, 2023
Kioxia Corporation
Kazuhiro Nakanishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of manufacturing same
Patent number
11,587,871
Issue date
Feb 21, 2023
Kioxia Corporation
Kazutaka Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor memory device and method of manufacturing the same
Patent number
11,195,855
Issue date
Dec 7, 2021
Kioxia Corporation
Kenichi Kadota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor storage device and method of manufacturing the same
Patent number
11,049,872
Issue date
Jun 29, 2021
TOSHIBA MEMORY CORPORATION
Kazuhiro Nojima
G11 - INFORMATION STORAGE
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
10,943,048
Issue date
Mar 9, 2021
TOSHIBA MEMORY CORPORATION
Kazuhiro Nojima
G01 - MEASURING TESTING
Information
Patent Grant
Memory device and manufacturing method therefor
Patent number
10,748,915
Issue date
Aug 18, 2020
TOSHIBA MEMORY CORPORATION
Kazuhiro Nojima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
SEM inspection apparatus and pattern matching method
Patent number
10,546,374
Issue date
Jan 28, 2020
TOSHIBA MEMORY CORPORATION
Atsushi Onishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Storage device and capacitor
Patent number
10,199,375
Issue date
Feb 5, 2019
TOSHIBA MEMORY CORPORATION
Kazuhiro Nojima
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
Publication number
20240210334
Publication date
Jun 27, 2024
KIOXIA Corporation
Yuki ABE
G01 - MEASURING TESTING
Information
Patent Application
MEMORY DEVICE AND METHOD OF MANUFACTURING MEMORY DEVICE
Publication number
20230298633
Publication date
Sep 21, 2023
KIOXIA Corporation
Kazuhiro NOJIMA
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR STORAGE DEVICE
Publication number
20230284390
Publication date
Sep 7, 2023
KIOXIA Corporation
Kazuya NAGASAWA
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SEMICONDUCTOR STORAGE DEVICE
Publication number
20220262811
Publication date
Aug 18, 2022
KIOXIA Corporation
Hiromitsu Iino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE
Publication number
20220262744
Publication date
Aug 18, 2022
KIOXIA Corporation
Mitsunori MASAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE
Publication number
20220093176
Publication date
Mar 24, 2022
KIOXIA Corporation
Kazuhiro NOJIMA
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR STORAGE DEVICE
Publication number
20220068804
Publication date
Mar 3, 2022
KIOXIA Corporation
Hideto TAKEKIDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE
Publication number
20220020681
Publication date
Jan 20, 2022
KIOXIA Corporation
Kazuhiro NOJIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MISALIGNMENT MEASURING APPARATUS AND MISALIGNMENT MEASURING METHOD
Publication number
20220012863
Publication date
Jan 13, 2022
KIOXIA Corporation
Yuki Watanabe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20210313350
Publication date
Oct 7, 2021
Toshiba Memory Corporation
Kazuhiro NOJIMA
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
Publication number
20210091001
Publication date
Mar 25, 2021
KIOXIA Corporation
Kazutaka SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE
Publication number
20210074711
Publication date
Mar 11, 2021
Kioxia Corporation
Yusaku SUZUKI
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20210066339
Publication date
Mar 4, 2021
Kioxia Corporation
Kenichi Kadota
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20210057376
Publication date
Feb 25, 2021
Kioxia Corporation
Kazuhiro NAKANISHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20200098782
Publication date
Mar 26, 2020
Toshiba Memory Corporation
Kazuhiro NOJIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20200089838
Publication date
Mar 19, 2020
Toshiba Memory Corporation
Kazuhiro NOJIMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY DEVICE AND MANUFACTURING METHOD THEREFOR
Publication number
20190081053
Publication date
Mar 14, 2019
Toshiba Memory Corporation
Kazuhiro NOJIMA
G11 - INFORMATION STORAGE
Information
Patent Application
SEM INSPECTION APPARATUS AND PATTERN MATCHING METHOD
Publication number
20190080445
Publication date
Mar 14, 2019
Toshiba Memory Corporation
Atsushi ONISHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STORAGE DEVICE AND CAPACITOR
Publication number
20180269203
Publication date
Sep 20, 2018
Toshiba Memory Corporation
Kazuhiro NOJIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAFER INSPECTION METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20170262975
Publication date
Sep 14, 2017
KABUSHIKI KAISHA TOSHIBA
Kazuo FUDEYA
G06 - COMPUTING CALCULATING COUNTING