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Kazuhiro Nonaka
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Saga, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Static electricity distribution measuring apparatus and static elec...
Patent number
9,841,450
Issue date
Dec 12, 2017
National Institute of Advanced Industrial Science and Technology
Kazuya Kikunaga
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for inspecting defects, inspected wafer or semiconductor dev...
Patent number
9,019,498
Issue date
Apr 28, 2015
National Institute of Advanced Industrial Science and Technology
Kazufumi Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting defects and defect inspecting apparatus
Patent number
8,599,379
Issue date
Dec 3, 2013
National Institute of Advanced Industrial Science and Technology
Kazufumi Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Mechanoluminescence material and process for producing the same
Patent number
7,258,817
Issue date
Aug 21, 2007
National Institute of Advanced Industrial Science and Technology
Morito Akiyama
F21 - LIGHTING
Information
Patent Grant
Mechanoluminescence material, producing method thereof, and usage t...
Patent number
7,060,371
Issue date
Jun 13, 2006
National Institute of Advanced Industrial Science and Technology
Morito Akiyama
F21 - LIGHTING
Information
Patent Grant
Method of and a system for measuring a stress or a stress distribut...
Patent number
6,628,375
Issue date
Sep 30, 2003
Agency of Industrial Science & Technology
Chao-Nan Xu
G01 - MEASURING TESTING
Information
Patent Grant
High-sensitivity flexible ceramic sensor
Patent number
6,608,427
Issue date
Aug 19, 2003
Agency of Industrial Science and Technology
Morito Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-luminosity stress-luminescent material
Patent number
6,280,655
Issue date
Aug 28, 2001
Japan as represented by Secretary of Agency of Industrial Science and Technology
Chaonan Xu
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Grant
Two-layer structure composite material for detecting cracks
Patent number
6,240,786
Issue date
Jun 5, 2001
Agency of Industrial Science & Technology
Morito Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Stress emission material and its manufacturing method
Patent number
6,159,394
Issue date
Dec 12, 2000
Agency of Industrial Science and Technology
Morito Akiyama
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Patents Applications
last 30 patents
Information
Patent Application
STATIC ELECTRICITY DISTRIBUTION MEASURING APPARATUS AND STATIC ELEC...
Publication number
20160154042
Publication date
Jun 2, 2016
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Kazuya Kikunaga
G01 - MEASURING TESTING
Information
Patent Application
STATIC-ELECTRICITY-QUANTITY MEASURING APPARATUS AND STATIC-ELECTRIC...
Publication number
20140091806
Publication date
Apr 3, 2014
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Kazuya Kikunaga
G01 - MEASURING TESTING
Information
Patent Application
STATIC-ELECTRICITY ELECTRIFICATION MEASUREMENT METHOD AND APPARATUS
Publication number
20130307552
Publication date
Nov 21, 2013
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Kazuya Kikunaga
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR INSPECTING DEFECTS, INSPECTED WAFER OR SEMICONDUCTOR DEV...
Publication number
20120262715
Publication date
Oct 18, 2012
National Institute of Advanced Industrial Science and Technology
Kazufumi Sakai
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR INSPECTING DEFECTS AND DEFECT INSPECTING APPARATUS
Publication number
20110069313
Publication date
Mar 24, 2011
National Institute of Advanced Industrial Science Technology
Kazufumi Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Mechanoluminescence material and process for producing the same
Publication number
20050247912
Publication date
Nov 10, 2005
Morito Akiyama
F21 - LIGHTING
Information
Patent Application
Mechanoluminescence material, producing method thereof, and usage t...
Publication number
20030124383
Publication date
Jul 3, 2003
Morito Akiyama
F21 - LIGHTING
Information
Patent Application
High-sensitivity flexible ceramic sensor
Publication number
20030006678
Publication date
Jan 9, 2003
Morito Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High-sensitivity flexible ceramic sensor
Publication number
20020017835
Publication date
Feb 14, 2002
Morito Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of and a system for measuring a stress or a stress distribut...
Publication number
20010017059
Publication date
Aug 30, 2001
Agency of Industrial Science and Technology
Chao-Nan Xu
G01 - MEASURING TESTING