Kazuko Ishihara

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Fujisawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor failure analysis system
- Patent number 6,404,911
- Issue date Jun 11, 2002
- Hitachi, Ltd.
- Kazuko Ishihara
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis system
- Patent number 6,185,324
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Kazuko Ishihara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor failure analysis system
- Publication number 20010000460
- Publication date Apr 26, 2001
- Kazuko Ishihara
- G01 - MEASURING TESTING