Kazumi Yamagata

Person

Nirasaki City, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus
- Patent number 11,467,099
- Issue date Oct 11, 2022
- Tokyo Electron Limited
- Kazumi Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Probe card holding device and inspection device
- Patent number 11,385,260
- Issue date Jul 12, 2022
- Tokyo Electron Limited
- Kazumi Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Probe device for improving transfer accuracy of needle traces of pr...
- Patent number 11,221,350
- Issue date Jan 11, 2022
- Tokyo Electron Limited
- Tomohiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 7,944,200
- Issue date May 17, 2011
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Each inspection units of a probe apparatus is provided with an imag...
- Patent number 7,701,236
- Issue date Apr 20, 2010
- Tokyo Electron Limited
- Shuji Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Prober and method for cleaning probes provided therein
- Patent number 6,118,290
- Issue date Sep 12, 2000
- Tokyo Electron Limited
- Masahiko Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Probe card attaching mechanism
- Patent number 6,060,892
- Issue date May 9, 2000
- Tokyo Electron Limited
- Kazumi Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Wafer prober
- Patent number D383683
- Issue date Sep 16, 1997
- Tokyo Electron Limited
- Osamu Kamata
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Probe apparatus having probe card exchanging mechanism
- Patent number 5,640,100
- Issue date Jun 17, 1997
- Tokyo Electron Limited
- Kazumi Yamagata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD HOLDING DEVICE AND INSPECTION DEVICE
- Publication number 20210255217
- Publication date Aug 19, 2021
- TOKYO ELECTRON LIMITED
- Kazumi YAMAGATA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20200309717
- Publication date Oct 1, 2020
- TOKYO ELECTRON LIMITED
- Kazumi YAMAGATA
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE AND NEEDLE TRACE TRANSCRIPTION METHOD
- Publication number 20200124641
- Publication date Apr 23, 2020
- Tomohiro OOTA
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20100079161
- Publication date Apr 1, 2010
- TOKYO ELECTON LIMITED
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20080290886
- Publication date Nov 27, 2008
- TOKYO ELECTRON LIMITED
- Shuji Akiyama
- G01 - MEASURING TESTING

Kazumi Yamagata

Person

Patents Grantslast 30 patents

Inspection apparatus

Probe card holding device and inspection device

Probe device for improving transfer accuracy of needle traces of pr...

Probe apparatus

Each inspection units of a probe apparatus is provided with an imag...

Prober and method for cleaning probes provided therein

Probe card attaching mechanism

Wafer prober

Probe apparatus having probe card exchanging mechanism

Patents Applicationslast 30 patents

PROBE CARD HOLDING DEVICE AND INSPECTION DEVICE

INSPECTION APPARATUS

PROBE DEVICE AND NEEDLE TRACE TRANSCRIPTION METHOD

PROBE APPARATUS

PROBE APPARATUS