Kazuo AOKI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,982,631
- Issue date May 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,557,457
- Issue date Jan 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Kosuke Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phosphor, method for manufacturing same, and light-emitting device
- Patent number 10,836,961
- Issue date Nov 17, 2020
- Koha Co., Ltd.
- Makoto Watanabe
- C30 - CRYSTAL GROWTH
Information Patent Grant
Defect detection device and defect observation device
- Patent number 10,642,164
- Issue date May 5, 2020
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect observation apparatus
- Patent number 10,593,062
- Issue date Mar 17, 2020
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device
- Patent number 10,340,429
- Issue date Jul 2, 2019
- Koha Co., Ltd.
- Daisuke Inomata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 10,269,536
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Satoshi Takada
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device
- Patent number 9,634,216
- Issue date Apr 25, 2017
- Koha Co., Ltd.
- Daisuke Inomata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light emitting element and method of making same
- Patent number 9,117,974
- Issue date Aug 25, 2015
- Koha Co., Ltd.
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Grant
Light-emitting device
- Patent number 9,112,123
- Issue date Aug 18, 2015
- National Institute for Materials Science
- Kazuo Aoki
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Coordination operation method and mobile communication terminal
- Patent number 8,826,053
- Issue date Sep 2, 2014
- Vodafone Group PLC.
- Masahiko Kuwabara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Light emitting element and method of making same
- Patent number 8,791,466
- Issue date Jul 29, 2014
- Koha Co., Ltd.
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Grant
Processing decision method and mobile communication terminal
- Patent number 8,787,893
- Issue date Jul 22, 2014
- Vodafone Group PLC.
- Kazuo Aoki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
β-Ga2O3 single crystal growing method including crystal growth method
- Patent number 8,747,553
- Issue date Jun 10, 2014
- Waseda University
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Grant
Semiconductor layer
- Patent number 8,674,399
- Issue date Mar 18, 2014
- Koha Co., Ltd.
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Grant
Light emitting element and method of making same
- Patent number 8,450,747
- Issue date May 28, 2013
- Koha Co., Ltd.
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Grant
Coordinated operation method and communication terminal device
- Patent number 8,400,469
- Issue date Mar 19, 2013
- Vodafone Group PLC
- Masahiko Kuwabara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Coordinated operation method, and communication terminal device
- Patent number 8,375,079
- Issue date Feb 12, 2013
- Vodafone Group PLC
- Masahiko Kuwabara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Coordination operation method and mobile communication terminal
- Patent number 8,311,529
- Issue date Nov 13, 2012
- Vodafone Group PLC
- Masahiko Kuwabara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coordination method and communication terminal
- Patent number 8,301,185
- Issue date Oct 30, 2012
- Vodafone Group PLC.
- Masahiko Kuwabara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
β-Ga2O3 single crystal growing method, thin-film single crystal gro...
- Patent number 8,262,796
- Issue date Sep 11, 2012
- Waseda University
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Grant
Program development support device
- Patent number 8,255,878
- Issue date Aug 28, 2012
- Vodafone Group PLC
- Kazuo Aoki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coordination operation method and communication terminal
- Patent number 8,154,551
- Issue date Apr 10, 2012
- Vodafone Group PLC
- Masahiko Kuwabara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scanning electron microscope
- Patent number 8,153,970
- Issue date Apr 10, 2012
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of correcting coordinates, and defect review apparatus
- Patent number 8,036,845
- Issue date Oct 11, 2011
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor layer with a Ga2O3 system
- Patent number 7,977,673
- Issue date Jul 12, 2011
- Koha Co., Ltd.
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Grant
Defect review and classification system
- Patent number 7,925,367
- Issue date Apr 12, 2011
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G05 - CONTROLLING REGULATING
Information Patent Grant
Processing decision method and mobile communication terminal
- Patent number 7,925,248
- Issue date Apr 12, 2011
- Softbank Mobile Corp.
- Kazuo Aoki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scanning microscope
- Patent number 7,881,558
- Issue date Feb 1, 2011
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,807,966
- Issue date Oct 5, 2010
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...
- Publication number 20220155240
- Publication date May 19, 2022
- Hitachi High-Tech Corporation
- Yuko Otani
- G02 - OPTICS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20220028652
- Publication date Jan 27, 2022
- HITACHI HIGH-TECH CORPORATION
- Kosuke MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-CRYSTAL PHOSPHOR AND LIGHT-EMITTING DEVICE
- Publication number 20200220052
- Publication date Jul 9, 2020
- Koha Co., Ltd.
- Daisuke Inomata
- C30 - CRYSTAL GROWTH
Information Patent Application
SINGLE CRYSTAL PHOSPHOR, PHOSPHOR-CONTAINING MEMBER AND LIGHT-EMITT...
- Publication number 20200203581
- Publication date Jun 25, 2020
- KOHA CO., LTD.
- Daisuke INOMATA
- C30 - CRYSTAL GROWTH
Information Patent Application
Electron Microscope
- Publication number 20180240643
- Publication date Aug 23, 2018
- Hitachi High-Technologies Corporation
- Satoshi TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE
- Publication number 20180088469
- Publication date Mar 29, 2018
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PHOSPHOR, METHOD FOR MANUFACTURING SAME, AND LIGHT-EMITTING DEVICE
- Publication number 20180044588
- Publication date Feb 15, 2018
- Koha Co., Ltd.
- Makoto Watanabe
- C30 - CRYSTAL GROWTH
Information Patent Application
DEFECT OBSERVATION APPARATUS
- Publication number 20170249753
- Publication date Aug 31, 2017
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G02 - OPTICS
Information Patent Application
LIGHT EMITTING DEVICE
- Publication number 20170186923
- Publication date Jun 29, 2017
- Koha Co., Ltd.
- Daisuke INOMATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE CRYSTAL PHOSPHOR, PHOSPHOR-CONTAINING MEMBER AND LIGHT-EMITT...
- Publication number 20170179346
- Publication date Jun 22, 2017
- Koha Co., Ltd.
- Daisuke INOMATA
- C30 - CRYSTAL GROWTH
Information Patent Application
SINGLE-CRYSTAL PHOSPHOR AND LIGHT-EMITTING DEVICE
- Publication number 20160240748
- Publication date Aug 18, 2016
- Koha Co., Ltd.
- Daisuke Inomata
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
LIGHT EMITTING DEVICE
- Publication number 20160190418
- Publication date Jun 30, 2016
- Koha Co., Ltd.
- Daisuke INOMATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE CRYSTAL PHOSPHOR, PHOSPHOR-CONTAINING MEMBER AND LIGHT-EMITT...
- Publication number 20160043289
- Publication date Feb 11, 2016
- NATIONAL INSTITUTE FOR MATERIALS SCIENCE
- Daisuke INOMATA
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Phosphor, Method for Manufacturing same, and light-emitting device
- Publication number 20150083967
- Publication date Mar 26, 2015
- Koha Co., Ltd.
- Makoto Watanabe
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
LIGHT EMITTING ELEMENT AND METHOD OF MAKING SAME
- Publication number 20140306237
- Publication date Oct 16, 2014
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Application
LIGHT-EMITTING DEVICE
- Publication number 20130256730
- Publication date Oct 3, 2013
- NATIONAL INSTITUTE FOR MATERIALS SCIENCE
- Kazuo Aoki
- C30 - CRYSTAL GROWTH
Information Patent Application
LIGHT EMITTING ELEMENT AND METHOD OF MAKING SAME
- Publication number 20130248902
- Publication date Sep 26, 2013
- Koha Co., Ltd.
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Application
SEM TYPE DEFECT OBSERVATION DEVICE AND DEFECT IMAGE ACQUIRING METHOD
- Publication number 20120327212
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Katsuhiro Kitahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
beta-Ga2O3 SINGLE CRYSTAL GROWING METHOD, THIN-FILM SINGLE CRYSTAL...
- Publication number 20120304918
- Publication date Dec 6, 2012
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Application
Semiconductor layer
- Publication number 20110253973
- Publication date Oct 20, 2011
- Koha Co., Ltd.
- Noburo Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Application
Processing decision method and mobile communication terminal
- Publication number 20110190036
- Publication date Aug 4, 2011
- SOFTBANK MOBILE CORP.
- Kazuo Aoki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20100320385
- Publication date Dec 23, 2010
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor element and method of making same
- Publication number 20100270548
- Publication date Oct 28, 2010
- Yuhei Ikemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Correcting Coordinates, and Defect Review Apparatus
- Publication number 20100241386
- Publication date Sep 23, 2010
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G01 - MEASURING TESTING
Information Patent Application
Beta-Ga2O3 single crystal growing method, thin-film single crystal...
- Publication number 20100229789
- Publication date Sep 16, 2010
- Waseda University
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Application
LIGHT EMITTING ELEMENT AND METHOD OF MAKING SAME
- Publication number 20100038652
- Publication date Feb 18, 2010
- Koha Co., Ltd.
- Noboru Ichinose
- C30 - CRYSTAL GROWTH
Information Patent Application
AUTOMATIC DEFECT REVIEW AND CLASSIFICATION SYSTEM
- Publication number 20100021047
- Publication date Jan 28, 2010
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G05 - CONTROLLING REGULATING
Information Patent Application
SCANNING MICROSCOPE
- Publication number 20090202166
- Publication date Aug 13, 2009
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090050805
- Publication date Feb 26, 2009
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beta-Ga2O3 single crystal growing method, thin-film single crystal...
- Publication number 20080265264
- Publication date Oct 30, 2008
- Waseda University
- Noboru Ichinose
- C30 - CRYSTAL GROWTH

Person

Patents Grantslast 30 patents

Defect detection device, defect detection method, and defect observ...

Charged particle beam apparatus

Phosphor, method for manufacturing same, and light-emitting device

Defect detection device and defect observation device

Defect observation apparatus

Light emitting device

Electron microscope

Light emitting device

Light emitting element and method of making same

Light-emitting device

Coordination operation method and mobile communication terminal

Light emitting element and method of making same

Processing decision method and mobile communication terminal

β-Ga2O3 single crystal growing method including crystal growth method

Semiconductor layer

Light emitting element and method of making same

Coordinated operation method and communication terminal device

Coordinated operation method, and communication terminal device

Coordination operation method and mobile communication terminal

Coordination method and communication terminal

β-Ga2O3 single crystal growing method, thin-film single crystal gro...

Program development support device

Coordination operation method and communication terminal

Scanning electron microscope

Method of correcting coordinates, and defect review apparatus

Semiconductor layer with a Ga2O3 system

Defect review and classification system

Processing decision method and mobile communication terminal

Scanning microscope

Scanning electron microscope

Patents Applicationslast 30 patents

DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...

Charged Particle Beam Apparatus

SINGLE-CRYSTAL PHOSPHOR AND LIGHT-EMITTING DEVICE

SINGLE CRYSTAL PHOSPHOR, PHOSPHOR-CONTAINING MEMBER AND LIGHT-EMITT...

Electron Microscope

DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE

PHOSPHOR, METHOD FOR MANUFACTURING SAME, AND LIGHT-EMITTING DEVICE

DEFECT OBSERVATION APPARATUS

LIGHT EMITTING DEVICE

SINGLE CRYSTAL PHOSPHOR, PHOSPHOR-CONTAINING MEMBER AND LIGHT-EMITT...

SINGLE-CRYSTAL PHOSPHOR AND LIGHT-EMITTING DEVICE

LIGHT EMITTING DEVICE

SINGLE CRYSTAL PHOSPHOR, PHOSPHOR-CONTAINING MEMBER AND LIGHT-EMITT...

Phosphor, Method for Manufacturing same, and light-emitting device

LIGHT EMITTING ELEMENT AND METHOD OF MAKING SAME

LIGHT-EMITTING DEVICE

LIGHT EMITTING ELEMENT AND METHOD OF MAKING SAME

SEM TYPE DEFECT OBSERVATION DEVICE AND DEFECT IMAGE ACQUIRING METHOD

beta-Ga2O3 SINGLE CRYSTAL GROWING METHOD, THIN-FILM SINGLE CRYSTAL...

Semiconductor layer

Processing decision method and mobile communication terminal

SCANNING ELECTRON MICROSCOPE

Semiconductor element and method of making same

Method of Correcting Coordinates, and Defect Review Apparatus

Beta-Ga2O3 single crystal growing method, thin-film single crystal...

LIGHT EMITTING ELEMENT AND METHOD OF MAKING SAME

AUTOMATIC DEFECT REVIEW AND CLASSIFICATION SYSTEM

SCANNING MICROSCOPE

SCANNING ELECTRON MICROSCOPE

Beta-Ga2O3 single crystal growing method, thin-film single crystal...