Kazushi Sugiura

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device with built-in self test circuit operati...
- Patent number 6,993,696
- Issue date Jan 31, 2006
- Renesas Technology Corp.
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Data storage apparatus and data measuring apparatus
- Patent number 6,990,614
- Issue date Jan 24, 2006
- Renesas Technology Corp.
- Hidekazau Nagasawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device provided with memory chips
- Patent number 6,724,668
- Issue date Apr 20, 2004
- Renesas Technology Corp.
- Ryuji Ohmura
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor module
- Patent number 6,708,302
- Issue date Mar 16, 2004
- Renesas Technology Corp.
- Mari Shibayama
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing semiconductor devices using improv...
- Patent number 6,646,461
- Issue date Nov 11, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kazushi Sugiura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device that can have a defective bit found during or...
- Patent number 6,586,823
- Issue date Jul 1, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Ohmura
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor testing apparatus for testing semiconductor device in...
- Patent number 6,584,592
- Issue date Jun 24, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Omura
- G01 - MEASURING TESTING
Information Patent Grant
Repair analysis circuit for redundancy, redundant repairing method,...
- Patent number 6,345,004
- Issue date Feb 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Omura
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor testing apparatus for testing semiconductor device in...
- Patent number 6,311,300
- Issue date Oct 30, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Omura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus of testing semiconductor
- Publication number 20030210068
- Publication date Nov 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yoshinori Fujiwara
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device provided with memory chips
- Publication number 20030107926
- Publication date Jun 12, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Ohmura
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device that can have a defective bit found during or...
- Publication number 20030030135
- Publication date Feb 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Ohmura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for testing semiconductor devices
- Publication number 20020070746
- Publication date Jun 13, 2002
- Mitsubishi Denki Kabushiki Kaisha And Ryoden Semiconductor System Engineering...
- Kazushi Sugiura
- G01 - MEASURING TESTING
Information Patent Application
Repair analysis circuit for redundancy, redundant repairing method,...
- Publication number 20020008998
- Publication date Jan 24, 2002
- Mitsubishi Denki Kasbushiki Kaisha
- Ryuji Omura
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor testing apparatus for testing semiconductor device in...
- Publication number 20010021988
- Publication date Sep 13, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Omura
- G01 - MEASURING TESTING

Kazushi Sugiura

Person

Patents Grantslast 30 patents

Semiconductor memory device with built-in self test circuit operati...

Data storage apparatus and data measuring apparatus

Semiconductor device provided with memory chips

Semiconductor module

Method and apparatus for testing semiconductor devices using improv...

Semiconductor device that can have a defective bit found during or...

Semiconductor testing apparatus for testing semiconductor device in...

Repair analysis circuit for redundancy, redundant repairing method,...

Semiconductor testing apparatus for testing semiconductor device in...

Patents Applicationslast 30 patents

Apparatus of testing semiconductor

Semiconductor device provided with memory chips

Semiconductor device that can have a defective bit found during or...

Method and apparatus for testing semiconductor devices

Repair analysis circuit for redundancy, redundant repairing method,...

Semiconductor testing apparatus for testing semiconductor device in...