Kazushi Uno

Person

Atsugi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Computer-readable non-transitory medium, abnormality detection devi...
- Patent number 11,914,206
- Issue date Feb 27, 2024
- Fujitsu Limited
- Yoichi Takasu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Determination device, determination method, and non-transitory comp...
- Patent number 11,029,218
- Issue date Jun 8, 2021
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement device, temperature measurement method, and...
- Patent number 10,775,245
- Issue date Sep 15, 2020
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement device, temperature measurement method, and...
- Patent number 10,712,211
- Issue date Jul 14, 2020
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement device, temperature measurement method, and...
- Patent number 10,704,964
- Issue date Jul 7, 2020
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber cord and abnormality detection system
- Patent number 10,422,751
- Issue date Sep 24, 2019
- Fujitsu Limited
- Kazushi Uno
- G02 - OPTICS
Information Patent Grant
Temperature measuring system and temperature measuring method
- Patent number 10,281,340
- Issue date May 7, 2019
- Fujitsu Limited
- Takahiro Arioka
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measuring system and temperature measuring method
- Patent number 10,267,689
- Issue date Apr 23, 2019
- Fujitsu Limited
- Takahiro Arioka
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement device and temperature measurement method
- Patent number 10,247,622
- Issue date Apr 2, 2019
- Fujitsu Limited
- Takahiro Arioka
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality detection system and abnormality detection method
- Patent number 10,088,342
- Issue date Oct 2, 2018
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality detection system and abnormality detection method
- Patent number 9,915,620
- Issue date Mar 13, 2018
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement system and abnormality detection method
- Patent number 9,816,878
- Issue date Nov 14, 2017
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Temperature distribution measurement apparatus and temperature dist...
- Patent number 9,797,782
- Issue date Oct 24, 2017
- Fujitsu Limited
- Takeo Kasajima
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality detection system and abnormality detection method
- Patent number 9,528,860
- Issue date Dec 27, 2016
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Temperature distribution measurement system, temperature distributi...
- Patent number 9,488,532
- Issue date Nov 8, 2016
- Fujitsu Limited
- Takeo Kasajima
- G01 - MEASURING TESTING
Information Patent Grant
Management system
- Patent number 9,453,766
- Issue date Sep 27, 2016
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality detection system and abnormality detection method
- Patent number 9,347,803
- Issue date May 24, 2016
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Power measurement system and power temperature converter
- Patent number 9,310,404
- Issue date Apr 12, 2016
- Fujitsu Limited
- Fumio Takei
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Environmental measurement system and environmental measurement method
- Patent number 8,918,286
- Issue date Dec 23, 2014
- Fujitsu Limited
- Fumio Takei
- G01 - MEASURING TESTING
Information Patent Grant
Environmental measurement system and environmental measurement method
- Patent number 8,740,454
- Issue date Jun 3, 2014
- Fujitus Limited
- Fumio Takei
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement system and temperature measurement method
- Patent number 8,636,408
- Issue date Jan 28, 2014
- Fujitsu Limited
- Takeo Kasajima
- G01 - MEASURING TESTING
Information Patent Grant
Cable installed state analyzing method and cable installed state an...
- Patent number 8,310,661
- Issue date Nov 13, 2012
- Fujitsu Limited
- Kazushi Uno
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Objective lens for recording hologram and hologram recording device
- Patent number 8,295,142
- Issue date Oct 23, 2012
- Fujitsu Limited
- Yuzuru Yamakage
- G11 - INFORMATION STORAGE
Information Patent Grant
Hologram recorder
- Patent number 8,223,413
- Issue date Jul 17, 2012
- Fujitsu Limited
- Kazushi Uno
- G11 - INFORMATION STORAGE
Information Patent Grant
Hologram recorder and hologram recording method
- Patent number 7,859,975
- Issue date Dec 28, 2010
- Fujitsu Limited
- Kazushi Uno
- G11 - INFORMATION STORAGE
Information Patent Grant
Hologram recording and reproducing apparatus
- Patent number 7,804,757
- Issue date Sep 28, 2010
- Fujitsu Limited
- Akiyoshi Uchida
- G11 - INFORMATION STORAGE
Information Patent Grant
Hologram recording device and hologram recording method
- Patent number 7,760,408
- Issue date Jul 20, 2010
- Fujitsu Limited
- Kazushi Uno
- G11 - INFORMATION STORAGE
Information Patent Grant
Hologram recording device
- Patent number 7,755,819
- Issue date Jul 13, 2010
- Fujitsu Limited
- Kazushi Uno
- G11 - INFORMATION STORAGE
Information Patent Grant
Hologram recording apparatus and hologram recording/reproducing method
- Patent number 7,751,105
- Issue date Jul 6, 2010
- Fujitsu Limited
- Kazushi Uno
- G11 - INFORMATION STORAGE
Information Patent Grant
Hologram recording device
- Patent number 7,719,734
- Issue date May 18, 2010
- Fujitsu Limited
- Kazushi Uno
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER-READABLE NON-TRANSITORY MEDIUM, ABNORMALITY DETECTION DEVI...
- Publication number 20230097688
- Publication date Mar 30, 2023
- FUJITSU LIMITED
- YOICHI TAKASU
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, TEMPERATURE DISTRIBUTION MEASUREMENT APPARATUS, A...
- Publication number 20200400511
- Publication date Dec 24, 2020
- Fujitsu Limited
- Kazushi Uno
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
TEMPERATURE MEASUREMENT APPARATUS, TEMPERATURE MEASUREMENT METHOD,...
- Publication number 20200116574
- Publication date Apr 16, 2020
- Fujitsu Limited
- Takahiro Arioka
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT APPARATUS, TEMPERATURE MEASUREMENT METHOD,...
- Publication number 20200072681
- Publication date Mar 5, 2020
- Fujitsu Limited
- Takahiro Arioka
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD, AND...
- Publication number 20180143085
- Publication date May 24, 2018
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD, AND...
- Publication number 20180058947
- Publication date Mar 1, 2018
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD, AND...
- Publication number 20180058948
- Publication date Mar 1, 2018
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION DEVICE, DETERMINATION METHOD, AND NON-TRANSITORY COMP...
- Publication number 20180031428
- Publication date Feb 1, 2018
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20170097267
- Publication date Apr 6, 2017
- Fujitsu Limited
- Takahiro Arioka
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY DETECTION SYSTEM AND ABNORMALITY DETECTION METHOD
- Publication number 20160327415
- Publication date Nov 10, 2016
- Fujitsu Limited
- Kazushi UNO
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY DETECTION SYSTEM AND ABNORMALITY DETECTION METHOD
- Publication number 20160252463
- Publication date Sep 1, 2016
- Fujitsu Limited
- Kazushi UNO
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASURING SYSTEM AND TEMPERATURE MEASURING METHOD
- Publication number 20160238460
- Publication date Aug 18, 2016
- Fujitsu Limited
- Takahiro Arioka
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASURING SYSTEM AND TEMPERATURE MEASURING METHOD
- Publication number 20160238461
- Publication date Aug 18, 2016
- Fujitsu Limited
- Takahiro Arioka
- G01 - MEASURING TESTING
Information Patent Application
MANAGEMENT SYSTEM
- Publication number 20160178440
- Publication date Jun 23, 2016
- Fujitsu Limited
- Kazushi Uno
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FIBER CORD AND ABNORMALITY DETECTION SYSTEM
- Publication number 20160169807
- Publication date Jun 16, 2016
- Fujitsu Limited
- Kazushi UNO
- G02 - OPTICS
Information Patent Application
TEMPERATURE DISTRIBUTION PREDICTION METHOD AND AIR CONDITIONING MAN...
- Publication number 20160061668
- Publication date Mar 3, 2016
- FUJITSU LIMITED
- Takeo Kasajima
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY DETECTION SYSTEM AND ABNORMALITY DETECTION METHOD
- Publication number 20150241251
- Publication date Aug 27, 2015
- FUJITSU LIMITED
- Kazushi UNO
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT SYSTEM AND ABNORMALITY DETECTION METHOD
- Publication number 20150233771
- Publication date Aug 20, 2015
- FUJITSU LIMITED
- Kazushi UNO
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY DETECTION SYSTEM AND ABNORMALITY DETECTION METHOD
- Publication number 20150226679
- Publication date Aug 13, 2015
- FUJITSU LIMITED
- Kazushi UNO
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE DISTRIBUTION MEASUREMENT SYSTEM, TEMPERATURE DISTRIBUTI...
- Publication number 20140153611
- Publication date Jun 5, 2014
- Fujitsu Limited
- Takeo KASAJIMA
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE DISTRIBUTION MEASUREMENT APPARATUS AND TEMPERATURE DIST...
- Publication number 20140146850
- Publication date May 29, 2014
- Fujitsu Limited
- Takeo KASAJIMA
- G01 - MEASURING TESTING
Information Patent Application
AIR-CONDITIONING CONTROL SYSTEM AND AIR VOLUME ADJUSTMENT DEVICE
- Publication number 20130273825
- Publication date Oct 17, 2013
- FUJITSU LIMITED
- Kazushi Uno
- F24 - HEATING RANGES VENTILATING
Information Patent Application
TEMPERATURE MEASUREMENT SYSTEM AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20130215930
- Publication date Aug 22, 2013
- Fujitsu Limited
- Takeo KASAJIMA
- G01 - MEASURING TESTING
Information Patent Application
POWER MEASUREMENT SYSTEM AND POWER TEMPERATURE CONVERTER
- Publication number 20130141078
- Publication date Jun 6, 2013
- Fujitsu Limited
- Fumio TAKEI
- G01 - MEASURING TESTING
Information Patent Application
ENVIRONMENTAL MEASUREMENT SYSTEM AND ENVIRONMENTAL MEASUREMENT METHOD
- Publication number 20120310535
- Publication date Dec 6, 2012
- Fujitsu Limited
- Fumio TAKEI
- G01 - MEASURING TESTING
Information Patent Application
ENVIRONMENTAL MEASUREMENT SYSTEM AND ENVIRONMENTAL MEASUREMENT METHOD
- Publication number 20120307861
- Publication date Dec 6, 2012
- Fujitsu Limited
- Fumio TAKEI
- G01 - MEASURING TESTING
Information Patent Application
CABLE INSTALLED STATE ANALYZING METHOD AND CABLE INSTALLED STATE AN...
- Publication number 20120033206
- Publication date Feb 9, 2012
- FUJITSU LIMITED
- Kazushi UNO
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT SYSTEM AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20120033709
- Publication date Feb 9, 2012
- FUJITSU LIMITED
- Takeo KASAJIMA
- G01 - MEASURING TESTING
Information Patent Application
HOLOGRAM RECORDING DEVICE
- Publication number 20100271922
- Publication date Oct 28, 2010
- Fujitsu Limited
- Yasumasa Iwamura
- G11 - INFORMATION STORAGE
Information Patent Application
OBJECTIVE LENS FOR RECORDING HOLOGRAM AND HOLOGRAM RECORDING DEVICE
- Publication number 20100202271
- Publication date Aug 12, 2010
- Fujitsu Limited
- Yuzuru Yamakage
- G02 - OPTICS

Kazushi Uno

Person

Patents Grantslast 30 patents

Computer-readable non-transitory medium, abnormality detection devi...

Determination device, determination method, and non-transitory comp...

Temperature measurement device, temperature measurement method, and...

Temperature measurement device, temperature measurement method, and...

Temperature measurement device, temperature measurement method, and...

Optical fiber cord and abnormality detection system

Temperature measuring system and temperature measuring method

Temperature measuring system and temperature measuring method

Temperature measurement device and temperature measurement method

Abnormality detection system and abnormality detection method

Abnormality detection system and abnormality detection method

Temperature measurement system and abnormality detection method

Temperature distribution measurement apparatus and temperature dist...

Abnormality detection system and abnormality detection method

Temperature distribution measurement system, temperature distributi...

Management system

Abnormality detection system and abnormality detection method

Power measurement system and power temperature converter

Environmental measurement system and environmental measurement method

Environmental measurement system and environmental measurement method

Temperature measurement system and temperature measurement method

Cable installed state analyzing method and cable installed state an...

Objective lens for recording hologram and hologram recording device

Hologram recorder

Hologram recorder and hologram recording method

Hologram recording and reproducing apparatus

Hologram recording device and hologram recording method

Hologram recording device

Hologram recording apparatus and hologram recording/reproducing method

Hologram recording device

Patents Applicationslast 30 patents

COMPUTER-READABLE NON-TRANSITORY MEDIUM, ABNORMALITY DETECTION DEVI...

DETECTION DEVICE, TEMPERATURE DISTRIBUTION MEASUREMENT APPARATUS, A...

TEMPERATURE MEASUREMENT APPARATUS, TEMPERATURE MEASUREMENT METHOD,...

TEMPERATURE MEASUREMENT APPARATUS, TEMPERATURE MEASUREMENT METHOD,...

TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD, AND...

TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD, AND...

TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD, AND...

DETERMINATION DEVICE, DETERMINATION METHOD, AND NON-TRANSITORY COMP...

TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD

ABNORMALITY DETECTION SYSTEM AND ABNORMALITY DETECTION METHOD

ABNORMALITY DETECTION SYSTEM AND ABNORMALITY DETECTION METHOD

TEMPERATURE MEASURING SYSTEM AND TEMPERATURE MEASURING METHOD

TEMPERATURE MEASURING SYSTEM AND TEMPERATURE MEASURING METHOD

MANAGEMENT SYSTEM

OPTICAL FIBER CORD AND ABNORMALITY DETECTION SYSTEM

TEMPERATURE DISTRIBUTION PREDICTION METHOD AND AIR CONDITIONING MAN...

ABNORMALITY DETECTION SYSTEM AND ABNORMALITY DETECTION METHOD

TEMPERATURE MEASUREMENT SYSTEM AND ABNORMALITY DETECTION METHOD

ABNORMALITY DETECTION SYSTEM AND ABNORMALITY DETECTION METHOD

TEMPERATURE DISTRIBUTION MEASUREMENT SYSTEM, TEMPERATURE DISTRIBUTI...

TEMPERATURE DISTRIBUTION MEASUREMENT APPARATUS AND TEMPERATURE DIST...

AIR-CONDITIONING CONTROL SYSTEM AND AIR VOLUME ADJUSTMENT DEVICE

TEMPERATURE MEASUREMENT SYSTEM AND TEMPERATURE MEASUREMENT METHOD

POWER MEASUREMENT SYSTEM AND POWER TEMPERATURE CONVERTER

ENVIRONMENTAL MEASUREMENT SYSTEM AND ENVIRONMENTAL MEASUREMENT METHOD

ENVIRONMENTAL MEASUREMENT SYSTEM AND ENVIRONMENTAL MEASUREMENT METHOD

CABLE INSTALLED STATE ANALYZING METHOD AND CABLE INSTALLED STATE AN...

TEMPERATURE MEASUREMENT SYSTEM AND TEMPERATURE MEASUREMENT METHOD

HOLOGRAM RECORDING DEVICE

OBJECTIVE LENS FOR RECORDING HOLOGRAM AND HOLOGRAM RECORDING DEVICE