Kazuya FUKUDA

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analyzing apparatus, solid-liquid separation device and solid-liqui...
- Patent number 9,594,089
- Issue date Mar 14, 2017
- SYSMEX CORPORATION
- Toshihiro Ootani
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzing apparatus and specimen analyzing method
- Patent number 9,068,956
- Issue date Jun 30, 2015
- Sysmex Corporation
- Kazuya Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and non-transitory storage medium
- Patent number 8,834,791
- Issue date Sep 16, 2014
- Sysmex Corporation
- Hironori Katsumi
- G11 - INFORMATION STORAGE
Information Patent Grant
Specimen analyzing apparatus and specimen analyzing method
- Patent number 8,234,941
- Issue date Aug 7, 2012
- Sysmex Corporation
- Kazuya Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Pipette chip supply device, sample analyzing apparatus, pipette chi...
- Patent number 8,114,347
- Issue date Feb 14, 2012
- SYSMEX CORPORATION
- Toshihiro Ootani
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer
- Patent number 8,007,722
- Issue date Aug 30, 2011
- Sysmex Corporation
- Kazunori Mototsu
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer, reagent-containing assembly, and reagent suctioning method
- Patent number 7,837,940
- Issue date Nov 23, 2010
- Sysmex Corporation
- Kazunori Mototsu
- G01 - MEASURING TESTING
Information Patent Grant
Reagent-containing assembly
- Patent number 7,790,114
- Issue date Sep 7, 2010
- Sysmex Corporation
- Kazuya Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Aspirator having dual inter-operating manipulation units
- Patent number 6,171,280
- Issue date Jan 9, 2001
- Sysmex Corporation
- Masanori Imazu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYZING APPARATUS, SOLID-LIQUID SEPARATION DEVICE AND SOLID-LIQUI...
- Publication number 20150198621
- Publication date Jul 16, 2015
- Sysmex Corporation
- Toshihiro Ootani
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD
- Publication number 20120294763
- Publication date Nov 22, 2012
- SYSMEX CORPORATION
- Kazuya FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER
- Publication number 20110223064
- Publication date Sep 15, 2011
- Hironori Katsumi
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND NON-TRANSITORY STORAGE MEDIUM
- Publication number 20110223063
- Publication date Sep 15, 2011
- Hironori Katsumi
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER
- Publication number 20100248346
- Publication date Sep 30, 2010
- SYSMEX CORPORATION
- Shuhei KANEKO
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD
- Publication number 20100107744
- Publication date May 6, 2010
- SYSMEX CORPORATION
- Kazuya FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
Analyzer, reagent-containing assembly, and reagent suctioning method
- Publication number 20080095668
- Publication date Apr 24, 2008
- Sysmex Corporation
- Kazunori Mototsu
- G01 - MEASURING TESTING
Information Patent Application
Reagent-containing assembly
- Publication number 20080085222
- Publication date Apr 10, 2008
- Sysmex Corporation
- Kazuya Fukuda
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ANALYZER
- Publication number 20080085215
- Publication date Apr 10, 2008
- Sysmex Corporation
- Kazunori Mototsu
- G01 - MEASURING TESTING
Information Patent Application
Parts supply device, sample analyzing device, parts supply method
- Publication number 20070212260
- Publication date Sep 13, 2007
- Sysmex Corporation
- Kazuya Fukuda
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Analyzing apparatus, solid-liquid separation device and solid-liqui...
- Publication number 20070172390
- Publication date Jul 26, 2007
- Sysmex Corporation
- Toshihiro Ootani
- G01 - MEASURING TESTING
Information Patent Application
Pipette chip supply device, sample analyzing apparatus, pipette chi...
- Publication number 20070148042
- Publication date Jun 28, 2007
- SYSMEX CORPORATION
- Toshihiro Ootani
- G01 - MEASURING TESTING

Kazuya FUKUDA

Person

Patents Grantslast 30 patents

Analyzing apparatus, solid-liquid separation device and solid-liqui...

Specimen analyzing apparatus and specimen analyzing method

Sample analyzer and non-transitory storage medium

Specimen analyzing apparatus and specimen analyzing method

Pipette chip supply device, sample analyzing apparatus, pipette chi...

Analyzer

Analyzer, reagent-containing assembly, and reagent suctioning method

Reagent-containing assembly

Aspirator having dual inter-operating manipulation units

Patents Applicationslast 30 patents

ANALYZING APPARATUS, SOLID-LIQUID SEPARATION DEVICE AND SOLID-LIQUI...

SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD

SAMPLE ANALYZER

SAMPLE ANALYZER AND NON-TRANSITORY STORAGE MEDIUM

ANALYZER

SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD

Analyzer, reagent-containing assembly, and reagent suctioning method

Reagent-containing assembly

ANALYZER

Parts supply device, sample analyzing device, parts supply method

Analyzing apparatus, solid-liquid separation device and solid-liqui...

Pipette chip supply device, sample analyzing apparatus, pipette chi...