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Kazuyoshi ISHIKAWA

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  • Oizumi, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    METHODS AND APPARATUS FOR A CAPACITIVE SENSOR
    • Publication number 20210262846
    • Publication date Aug 26, 2021
    • Semiconductor Components Industries, LLC
    • Takayasu OTAGAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHODS AND APPARATUS FOR INCREASED SENSITIVITY OF A CAPACITIVE SENSOR
    • Publication number 20210055590
    • Publication date Feb 25, 2021
    • Semiconductor Components Industries, LLC
    • Takayasu OTAGAKI
    • G02 - OPTICS
  • Information Patent Application

    METHODS AND APPARATUS FOR A CAPACITIVE TOUCH SENSOR
    • Publication number 20200326828
    • Publication date Oct 15, 2020
    • Semiconductor Components Industries, LLC
    • Takayasu OTAGAKI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TOUCH SENSOR WITH MASKED LAYOUT PATTERN
    • Publication number 20190228199
    • Publication date Jul 25, 2019
    • Semiconductor Components Industries, LLC
    • Takayasu OTAGAKI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    CAPACITIVE SENSOR FOR LIQUID SENSING
    • Publication number 20190063981
    • Publication date Feb 28, 2019
    • Semiconductor Components Industries, LLC
    • Takayasu OTAGAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PATTERN LAYOUT OF TOUCH SENSOR
    • Publication number 20180336387
    • Publication date Nov 22, 2018
    • Semiconductor Components Industries, LLC
    • Takayasu OTAGAKI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METHODS AND APPARATUS FOR A TOUCH SENSOR
    • Publication number 20180196543
    • Publication date Jul 12, 2018
    • Semiconductor Components Industries, LLC
    • Takayasu OTAGAKI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    CAPACITANCE LIQUID LEVEL SENSOR
    • Publication number 20180058897
    • Publication date Mar 1, 2018
    • Semiconductor Components Industries, LLC
    • Tetsuya TOKUNAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    LEVEL SENSOR AND METHOD
    • Publication number 20170299417
    • Publication date Oct 19, 2017
    • Semiconductor Components Industries, LLC
    • Takayasu OTAGAKI
    • G01 - MEASURING TESTING