Kazuyoshi Takeda

Person

Chino-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sensing apparatus and sensing system
- Patent number 11,714,479
- Issue date Aug 1, 2023
- Seiko Epson Corporation
- Kazuyoshi Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display system, display device, and display method
- Patent number 11,604,295
- Issue date Mar 14, 2023
- Seiko Epson Corporation
- Kazuyoshi Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor system and sensor drop determination method
- Patent number 11,585,828
- Issue date Feb 21, 2023
- Seiko Epson Corporation
- Kazuyoshi Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Sensing apparatus and sensing system
- Patent number 11,579,682
- Issue date Feb 14, 2023
- Seiko Epson Corporation
- Kazuyoshi Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor data processing system and sensor data synchronization system
- Patent number 11,523,357
- Issue date Dec 6, 2022
- Seiko Epson Corporation
- Kazuyoshi Takeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for installing inertial sensor unit, and inertial sensor unit
- Patent number 11,327,091
- Issue date May 10, 2022
- Seiko Epson Corporation
- Kazuyoshi Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Method for mounting inertial sensor unit and inertial sensor unit
- Patent number 11,275,097
- Issue date Mar 15, 2022
- Seiko Epson Corporation
- Kazuyoshi Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Management method, structure monitoring device, and structure monit...
- Patent number 11,269,730
- Issue date Mar 8, 2022
- Seiko Epson Corporation
- Kazuyoshi Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display device, display method, recording medium, and structure mon...
- Patent number 11,078,636
- Issue date Aug 3, 2021
- Seiko Epson Corporation
- Hiroshi Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Observation system and control method for observation system
- Patent number 10,914,654
- Issue date Feb 9, 2021
- Seiko Epson Corporation
- Kazuyoshi Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous measurement system
- Patent number 9,986,035
- Issue date May 29, 2018
- Seiko Epson Corporation
- Kazuyoshi Takeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Synchronous measurement system
- Patent number 9,948,418
- Issue date Apr 17, 2018
- Seiko Epson Corporation
- Takao Katayama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Observation system and method for controlling observation system
- Patent number 9,865,151
- Issue date Jan 9, 2018
- Seiko Epson Corporation
- Kazuyoshi Takeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Application program developing system, application program developi...
- Patent number 6,766,510
- Issue date Jul 20, 2004
- Seiko Epson Corporation
- Kazuyoshi Takeda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Electronic Device And Method Of Processing Electronic Device
- Publication number 20230267092
- Publication date Aug 24, 2023
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inertial Measurement Device
- Publication number 20230266127
- Publication date Aug 24, 2023
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL MEASUREMENT UNIT
- Publication number 20220221487
- Publication date Jul 14, 2022
- SEIKO EPSON CORPORATION
- Kazuyoshi Takeda
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY MEASUREMENT METHOD, MEASUREMENT SYSTEM, HOST SYST...
- Publication number 20220020231
- Publication date Jan 20, 2022
- SEIKO EPSON CORPORATION
- Kazuyoshi Takeda
- G01 - MEASURING TESTING
Information Patent Application
SENSING APPARATUS AND SENSING SYSTEM
- Publication number 20210397244
- Publication date Dec 23, 2021
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSING APPARATUS AND SENSING SYSTEM
- Publication number 20210397243
- Publication date Dec 23, 2021
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method For Installing Inertial Sensor Unit, And Inertial Sensor Unit
- Publication number 20200379002
- Publication date Dec 3, 2020
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SYSTEM AND SENSOR DROP DETERMINATION METHOD
- Publication number 20200249253
- Publication date Aug 6, 2020
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
MANAGEMENT METHOD, STRUCTURE MONITORING DEVICE, AND STRUCTURE MONIT...
- Publication number 20200233748
- Publication date Jul 23, 2020
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLAY SYSTEM, DISPLAY DEVICE, AND DISPLAY METHOD
- Publication number 20200132868
- Publication date Apr 30, 2020
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR DATA PROCESSING SYSTEM AND SENSOR DATA SYNCHRONIZATION SYSTEM
- Publication number 20200137705
- Publication date Apr 30, 2020
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR MOUNTING INERTIAL SENSOR UNIT AND INERTIAL SENSOR UNIT
- Publication number 20200124633
- Publication date Apr 23, 2020
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE, DISPLAY METHOD, RECORDING MEDIUM, AND STRUCTURE MON...
- Publication number 20190376243
- Publication date Dec 12, 2019
- SEIKO EPSON CORPORATION
- Hiroshi OKAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM, CONTROL DEVICE, METHOD OF CONTROLLING MEASUREME...
- Publication number 20170288606
- Publication date Oct 5, 2017
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
OBSERVATION SYSTEM AND METHOD FOR CONTROLLING OBSERVATION SYSTEM
- Publication number 20170287308
- Publication date Oct 5, 2017
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OBSERVATION SYSTEM AND CONTROL METHOD FOR OBSERVATION SYSTEM
- Publication number 20170284892
- Publication date Oct 5, 2017
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONOUS MEASUREMENT SYSTEM
- Publication number 20160036916
- Publication date Feb 4, 2016
- SEIKO EPSON CORPORATION
- Kazuyoshi TAKEDA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYNCHRONOUS MEASUREMENT SYSTEM
- Publication number 20160036544
- Publication date Feb 4, 2016
- SEIKO EPSON CORPORATION
- Takao KATAYAMA
- G01 - MEASURING TESTING
Information Patent Application
Processor device equipped with flash memory and debugger apparatus
- Publication number 20030065984
- Publication date Apr 3, 2003
- Kazuyoshi Takeda
- G11 - INFORMATION STORAGE
Information Patent Application
Application program developing system, application program developi...
- Publication number 20020032902
- Publication date Mar 14, 2002
- Kazuyoshi Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic evaluation method, automatic evaluation system, and stora...
- Publication number 20020026302
- Publication date Feb 28, 2002
- Kazuyoshi Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic evaluation method, automatic evaluation system, and stora...
- Publication number 20020026301
- Publication date Feb 28, 2002
- Kazuyoshi Takeda
- G06 - COMPUTING CALCULATING COUNTING

Kazuyoshi Takeda

Person

Patents Grantslast 30 patents

Sensing apparatus and sensing system

Display system, display device, and display method

Sensor system and sensor drop determination method

Sensing apparatus and sensing system

Sensor data processing system and sensor data synchronization system

Method for installing inertial sensor unit, and inertial sensor unit

Method for mounting inertial sensor unit and inertial sensor unit

Management method, structure monitoring device, and structure monit...

Display device, display method, recording medium, and structure mon...

Observation system and control method for observation system

Synchronous measurement system

Synchronous measurement system

Observation system and method for controlling observation system

Application program developing system, application program developi...

Patents Applicationslast 30 patents

Electronic Device And Method Of Processing Electronic Device

Inertial Measurement Device

INERTIAL MEASUREMENT UNIT

PHYSICAL QUANTITY MEASUREMENT METHOD, MEASUREMENT SYSTEM, HOST SYST...

SENSING APPARATUS AND SENSING SYSTEM

SENSING APPARATUS AND SENSING SYSTEM

Method For Installing Inertial Sensor Unit, And Inertial Sensor Unit

SENSOR SYSTEM AND SENSOR DROP DETERMINATION METHOD

MANAGEMENT METHOD, STRUCTURE MONITORING DEVICE, AND STRUCTURE MONIT...

DISPLAY SYSTEM, DISPLAY DEVICE, AND DISPLAY METHOD

SENSOR DATA PROCESSING SYSTEM AND SENSOR DATA SYNCHRONIZATION SYSTEM

METHOD FOR MOUNTING INERTIAL SENSOR UNIT AND INERTIAL SENSOR UNIT

DISPLAY DEVICE, DISPLAY METHOD, RECORDING MEDIUM, AND STRUCTURE MON...

MEASUREMENT SYSTEM, CONTROL DEVICE, METHOD OF CONTROLLING MEASUREME...

OBSERVATION SYSTEM AND METHOD FOR CONTROLLING OBSERVATION SYSTEM

OBSERVATION SYSTEM AND CONTROL METHOD FOR OBSERVATION SYSTEM

SYNCHRONOUS MEASUREMENT SYSTEM

SYNCHRONOUS MEASUREMENT SYSTEM

Processor device equipped with flash memory and debugger apparatus

Application program developing system, application program developi...

Automatic evaluation method, automatic evaluation system, and stora...

Automatic evaluation method, automatic evaluation system, and stora...