Kazuyuki Hozawa

Person

Hino, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor detector and method of manufacturing the same
- Patent number 11,417,702
- Issue date Aug 16, 2022
- Hitachi, Ltd.
- Kazuyuki Hozawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 9,153,495
- Issue date Oct 6, 2015
- Hitachi, Ltd.
- Mayu Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with silicon through electrode and moisture ba...
- Patent number 8,749,028
- Issue date Jun 10, 2014
- Hitachi, Ltd.
- Mayu Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 8,618,667
- Issue date Dec 31, 2013
- Hitachi, Ltd.
- Kenichi Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 8,410,615
- Issue date Apr 2, 2013
- Hitachi, Ltd.
- Mayu Aoki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DETECTOR AND METHOD OF MANUFACTURING SAME
- Publication number 20230290896
- Publication date Sep 14, 2023
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Kazuyuki HOZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DETECTOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20210375978
- Publication date Dec 2, 2021
- Hitachi, Ltd
- Kazuyuki Hozawa
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR AND X-RAY MEASUREMENT DEVICE USING THE SAME
- Publication number 20190324160
- Publication date Oct 24, 2019
- Hitachi, Ltd
- Kazuyuki HOZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20160300764
- Publication date Oct 13, 2016
- Hitachi, Ltd
- Kenichi TAKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method of Manufacturing the Same
- Publication number 20150187651
- Publication date Jul 2, 2015
- Hitachi, Ltd
- Mayu Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20130285253
- Publication date Oct 31, 2013
- Hitachi, Ltd
- Mayu Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING RECONSTITUTED WAFERS AND METHOD FOR PRODUCING...
- Publication number 20120315710
- Publication date Dec 13, 2012
- Kazuyuki Hozawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120256311
- Publication date Oct 11, 2012
- Hitachi, Ltd.
- Kenichi Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120098106
- Publication date Apr 26, 2012
- Mayu Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20120068355
- Publication date Mar 22, 2012
- Hitachi, Ltd.
- Mayu Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF REMOVING IMPURITIES ON A GRINDING SURFACE OF A SEMICONDUC...
- Publication number 20080076232
- Publication date Mar 27, 2008
- Kazuyuki HOZAWA
- H01 - BASIC ELECTRIC ELEMENTS

Kazuyuki Hozawa

Person

Patents Grantslast 30 patents

Semiconductor detector and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Semiconductor device with silicon through electrode and moisture ba...

Semiconductor device and method of manufacturing the same

Semiconductor device and method for manufacturing the same

Patents Applicationslast 30 patents

SEMICONDUCTOR DETECTOR AND METHOD OF MANUFACTURING SAME

SEMICONDUCTOR DETECTOR AND METHOD OF MANUFACTURING THE SAME

X-RAY DETECTOR AND X-RAY MEASUREMENT DEVICE USING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

Semiconductor Device and Method of Manufacturing the Same

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

METHOD FOR PRODUCING RECONSTITUTED WAFERS AND METHOD FOR PRODUCING...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

METHOD OF REMOVING IMPURITIES ON A GRINDING SURFACE OF A SEMICONDUC...